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A neural network approach to correcting nonlinearity in optical interferometersZHI LI; HERRMANN, Konrad; POHLENZ, Frank et al.Measurement science & technology (Print). 2003, Vol 14, Num 3, pp 376-381, issn 0957-0233, 6 p.Article

An electro-optic modulation technique for direct and accurate measurement of birefringenceBENKELFAT, Badr-Eddine; HORACHE, El-Houssine; QIN ZOU et al.Optics communications. 2003, Vol 221, Num 4-6, pp 271-278, issn 0030-4018, 8 p.Article

An optical standing-wave interferometer for displacement measurementsBÜCHNER, H.-J; STIEBIG, H; MANDRYKA, V et al.Measurement science & technology (Print). 2003, Vol 14, Num 3, pp 311-316, issn 0957-0233, 6 p.Article

Influence of in-plane displacement on slope fringe formation in electronic speckle shearing interferometryWANG, K. F; TIEU, A. K.Optics communications. 2003, Vol 224, Num 1-3, pp 45-49, issn 0030-4018, 5 p.Article

Phase measurement in temporal speckle pattern interferometry using the Fourier transform method with and without a temporal carrierKAUFMANN, Guillermo H.Optics communications. 2003, Vol 217, Num 1-6, pp 141-149, issn 0030-4018, 9 p.Article

Phase-measuring profilometry of moving object without phase-shifting deviceYONEYAMA, S; MORIMOTO, Y; FUJIGAKI, M et al.Optics and lasers in engineering. 2003, Vol 40, Num 3, pp 153-161, issn 0143-8166, 9 p.Article

Polarization-insensitive tunable-contrast fiber-optic polarization interferometers with a polarization controllerSUMRIDDETCHKAJORN, Sarun.Optics communications. 2003, Vol 217, Num 1-6, pp 197-203, issn 0030-4018, 7 p.Article

Two color interferometry with nonlinear refractive propertiesVIKRAM, Chandra S; WITHEROW, William K.Optik (Stuttgart). 2003, Vol 114, Num 3, pp 118-122, issn 0030-4026, 5 p.Article

Crystalline Si-based tunable Fabry-Perot filter for in-plane optical integrationYUN, Sung-Sik; LEE, Jong-Hyun.Sensors and materials. 2003, Vol 15, Num 5, pp 269-281, issn 0914-4935, 13 p.Article

Sinusoidal least-squares fitting for temporal fringe pattern analysisVILLA, T; GOMEZ-PEDRERO, I. A; QUIROGA, J. A et al.Journal of modern optics (Print). 2002, Vol 49, Num 13, pp 2257-2266, issn 0950-0340, 10 p.Article

Modern optical measurement station for micro-materials and micro-elements studiesKUJAWINSKA, M.Sensors and actuators. A, Physical. 2002, Vol 99, Num 1-2, pp 144-153, issn 0924-4247, 10 p.Conference Paper

Sensitivity of thermal-wave interferometry to thermal properties of coatings: application to thermal barrier coatingsBENDADA, A.Measurement science & technology (Print). 2002, Vol 13, Num 12, pp 1946-1951, issn 0957-0233, 6 p.Article

A simple method for measuring the random variation of an interferometerPICART, Pascal; MERCIER, Raymond; LAMARE, Michel et al.Measurement science & technology (Print). 2001, Vol 12, Num 8, pp 1311-1317, issn 0957-0233Article

A subnanometre heterodyne interferometric system with improved phase sensitivity using a three-longitudinal-mode He-Ne laserYOKOYAMA, Toshiyuki; ARAKI, Tsutomu; YOKOYAMA, Shuko et al.Measurement science & technology (Print). 2001, Vol 12, Num 2, pp 157-162, issn 0957-0233Article

Display of tilt information of vibrating object in time average mode using lateral shearing interferometry and interferometric gratingPRAKASH, Shashi; SINGH, I. P; SHAKHER, Chandra et al.Optics and laser technology. 2001, Vol 33, Num 2, pp 117-120, issn 0030-3992Article

Effect of wavelength-modulating parameters on intensity fluctuations of the light source in a photothermal-modulating laser-diode interferometerXIANGZHAO WANG; HONGBIN LU; XUEFENG WANG et al.Journal of optics. A, Pure and applied optics (Print). 2001, Vol 3, Num 3, pp 222-224, issn 1464-4258Article

Wavefront divergence : a source of error in quantified speckle shearing dataWAN ABDULLAH, W. S; PETZING, J. N; TYRER, J. R et al.Journal of modern optics (Print). 2001, Vol 48, Num 5, pp 757-772, issn 0950-0340Article

Central fringe identification by phase quadrature interferometric technique and tunable laser-diodeLEE, Ju-Yi; SU, Der-Chin.Optics communications. 2001, Vol 198, Num 4-6, pp 333-337, issn 0030-4018Article

Testing micro devices with fringe projection and white-light interferometryWINDECKER, Robert; FLEISCHER, Matthias; KÖRNER, Klaus et al.Optics and lasers in engineering. 2001, Vol 36, Num 2, pp 141-154, issn 0143-8166Article

White-light interferometry with polarization phase-shifter at the input of the interferometerHELEN, S. S; KOTHIYAL, M. P; SIROHI, R. S et al.Journal of modern optics (Print). 2000, Vol 47, Num 6, pp 1137-1145, issn 0950-0340Article

Surface characterization by a DSPI polarization techniqueHENAO, Rodrigo; TORROBA, Roberto.Optik (Stuttgart). 2000, Vol 111, Num 10, pp 468-470, issn 0030-4026Article

The system of double-optical-path ESPI for the vibration measurementJIA SHUHAI; YUE KAIDUAN; TAN YUSHAN et al.Optics and lasers in engineering. 2000, Vol 34, Num 1, pp 67-74, issn 0143-8166Article

Fabrications and characterizations of micromachined Fabry-Perot interferometersLIN, Ran-Jin.SPIE proceedings series. 2000, pp 456-466, isbn 0-8194-3717-4Conference Paper

Chip-scale universal detection based on backscatter interferometrySWINNEY, Kelly; MARKOV, Dmitry; BORNHOP, Darryl J et al.Analytical chemistry (Washington, DC). 2000, Vol 72, Num 13, pp 2690-2695, issn 0003-2700Article