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Impact collision ion scattering spectroscopy (ICISS) and neutral impact collision ion scattering spectroscopy (NICISS) at surfaces of organic liquidsANDERSSON, G; MORGNER, H.Surface science. 1998, Vol 405, Num 1, pp 138-151, issn 0039-6028Article

Oscillatory relaxation of Al(110) reinvestigated by using medium-energy ion scatteringBUSCH, B. W; GUSTAFSSON, T.Surface science. 1998, Vol 415, Num 3, pp L1074-L1078, issn 0039-6028Article

A study on initial oxidation of Si(100)-2 × 1 surfaces by coaxial impact collision ion scattering spectroscopyWASEKURA, M; HIGASHI, M; IKEDA, H et al.Applied surface science. 2000, Vol 159-60, pp 35-40, issn 0169-4332Conference Paper

Deconvolution of SIMS depth profiles of As multiple delta layers in siliconLEE, J. W; KIM, K. J; KIM, H. K et al.Surface and interface analysis. 2005, Vol 37, Num 2, pp 176-180, issn 0142-2421, 5 p.Conference Paper

Surface structure determination from ion scattering imagesKIM, C; HÖFNER, C; RABALAIS, J. W et al.Surface science. 1997, Vol 388, Num 1-3, pp L1085-L1091, issn 0039-6028Article

Mobility of Ag adatoms on Ag(100)LANGELAAR, M. H; BREEMAN, M; BOERMA, D. O et al.Surface science. 1996, Vol 352-54, pp 597-601, issn 0039-6028Conference Paper

A study of a LEIS azimuthal scan behavior: Classical dynamics simulationMATLOCHA, T; PRUSA, S; KOLIBAL, M et al.Surface science. 2010, Vol 604, Num 21-22, pp 1906-1911, issn 0039-6028, 6 p.Article

Study of preferential sputtering and segregation effects on the surface composition of Al -Pd -Mn quasi-crystalsSAMAVAT, Feridoun; GLADYS, Michael J; JENKS, Cynthia J et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 433-435, issn 0142-2421, 3 p.Conference Paper

Monte Carlo simulation of angular-scan spectra for coaxial impact collision ion scattering spectroscopy (CAICISS)FUSE, T; ISHIYAMA, O; SHINOHARA, M et al.Surface science. 1997, Vol 372, Num 1-3, pp 350-354, issn 0039-6028Article

A new apparatus for impact collision ion scattering spectroscopyKAWAMOTO, K; INARI, K; MORI, T et al.Japanese journal of applied physics. 1995, Vol 34, Num 9A, pp 4917-4919, issn 0021-4922, 1Article

Medium energy ion scattering investigation of homoepitaxy on H terminated Si(111)COPEL, M; TROMP, R. M.Surface science. 1995, Vol 337, Num 1-2, pp L773-L776, issn 0039-6028Article

The influence of multiple scattering on the ion spectrum from a Thomson spectrometer in a plasma focus deviceKELLY, H; MARQUEZ, A.Measurement science & technology (Print). 1995, Vol 6, Num 4, pp 400-404, issn 0957-0233Article

Computer simulations of ion scattering and recoiling blocking patterns for surface structure analysisTEPLOV, S. V; ZASTAVNJUK, V. V; BYKOV, V et al.Surface science. 1994, Vol 310, Num 1-3, pp 436-450, issn 0039-6028Article

The design and development of a time of flight fast atom/ion scattering spectrometerGILES, R; SULLIVAN, J. L; PEARCE, C. G et al.Surface and interface analysis. 1994, Vol 22, Num 1-12, pp 576-580, issn 0142-2421Conference Paper

Surface-melting induced faceting of aluminiumMOLENBROEK, A. M; FRENKEN, J. W. M.Surface science. 1996, Vol 366, Num 3, pp 587-596, issn 0039-6028Article

Damage profiling of Ar+ sputtered Si(100) surface by medium energy ion scattering spectroscopyLEE, J. C; JEONG, C. S; KANG, H. J et al.Applied surface science. 1996, Vol 100-01, pp 97-101, issn 0169-4332Conference Paper

Electron capture processes in autoionising-state production in ion-surface scatteringGUILLEMONT, L; LACOMBE, S; ESAULOV, V. A et al.Surface science. 1995, Vol 334, Num 1-3, pp 224-234, issn 0039-6028Article

Ion scattering spectroscopyMURRELL, M. P.Vacuum. 1994, Vol 45, Num 6-7, pp 773-781, issn 0042-207XArticle

Low-energy ion scattering at surfacesNIEHUS, H; HEILAND, W; TAGLAUER, E et al.Surface science reports. 1993, Vol 17, Num 4-5, pp 213-303, issn 0167-5729Article

Vibrational effects on Ag(110) studied by neutral impact-collision ion scatteringBRACCO, G; PIZZORNO, A; TATAREK, R et al.Surface science. 1997, Vol 377-79, pp 94-97, issn 0039-6028Conference Paper

Evaluation of plasma-induced damage by medium-energy ion scattering : Dry processYOKOYAMA, S; RADZIMSKI, Z. J; ISHIBASHI, K et al.Japanese journal of applied physics. 1994, Vol 33, Num 4B, pp 2179-2183, issn 0021-4922, 1Conference Paper

Elastic recoil detection for medium-energy ion scatteringCOPEL, M; TROMP, R. M.Review of scientific instruments. 1993, Vol 64, Num 11, pp 3147-3152, issn 0034-6748Article

Matrix effects in the neutralization of He ions at a metal surface containing oxygenKÜRNSTEINER, Philipp; STEINBERGER, Roland; PRIMETZHOFER, Daniel et al.Surface science. 2013, Vol 609, pp 167-171, issn 0039-6028, 5 p.Article

Structure of V thin films on Al(100) using XPD, LEED, and LEISPRIYANTHA, W; DROOPAD, R; KOPCZYK, M et al.Surface science. 2012, Vol 606, Num 15-16, pp 1160-1166, issn 0039-6028, 7 p.Article

Influence of water on the surface structure of 1-hexyl-3-methylimidazolium chlorideREICHELT, Manuela; HAMMER, Tobias; MORGNER, Harald et al.Surface science. 2011, Vol 605, Num 15-16, pp 1402-1411, issn 0039-6028, 10 p.Article

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