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SIMPLE INTERFEROMETER FOR MONITORING RAYLEIGH WAVES.JABLONOWSKI DP.1978; APPL. OPT.; USA; DA. 1978; VOL. 17; NO 13; PP. 2064-2071; BIBL. 7 REF.Article

INTERFERENCE POSITION MONITORING SYSTEM EMPLOYING RONCHI GRATINGS.JABLONOWSKI DP.1976; REV. SCI. INSTRUM.; U.S.A.; DA. 1976; VOL. 47; NO 1; PP. 96-100; BIBL. 1 REF.Article

GALVANOMETER DEFLECTION: A PRECISION HIGH-SPEED SYSTEM.JABLONOWSKI DP; RAAMOT J.1976; APPL. OPT.; U.S.A.; DA. 1976; VOL. 15; NO 6; PP. 1437-1443; BIBL. 5 REF.Article

COMPLEMENTARY CONTROL OF SCANNER GIVES 0.01% ACCURACY IN LASER BEAM DEFLECTION.RAAMOT J; JABLONOWSKI DP.1977; LASER FOCUS; U.S.A.; DA. 1977; VOL. 13; NO 5; PP. 96-100; BIBL. 6 REF.Article

A COHERENT OPTICAL FEEDBACK SYSTEM FOR OPTICAL INFORMATION PROCESSING.JABLONOWSKI DP; LEE SH.1975; APPL. PHYS.; GERM.; DA. 1975; VOL. 8; NO 1; PP. 51-58; BIBL. 4 REF.Article

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