Pascal and Francis Bibliographic Databases

Help

Search results

Your search

au.\*:("JOWETT CE")

Results 1 to 3 of 3

  • Page / 1
Export

Selection :

  • and

SURFACE ANALYTICAL TECHNIQUES APPLIED TO ELECTRONIC COMPONENTSJOWETT CE.1980; MICROELECTRON. J.; GBR; DA. 1980; VOL. 11; NO 2; PP. 35-40; BIBL. 10 REF.Article

PRACTICAL APPLICATIONS OF ACCELERATED TESTING OF ELECTRONIC DEVICESJOWETT CE.1978; MICROELECTRONICS; GBR; DA. 1978; VOL. 9; NO 2; PP. 19-23Article

IN-BUILT FAILURE ENVIRONMENTS.JOWETT CE.1976; MICROELECTRON. AND RELIABIL.; G.B.; DA. 1976; VOL. 15; NO 1; PP. 57-60Article

  • Page / 1