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THE INHOMOGENEITY VARIANCE OF COMPACT MATERIALS; THE DETERMINATION OF INHOMOGENEITY OF AN AL-SI ALLOY.BOHACEK P; JUREK K.1978; COLLECT. CZECHOSL. CHEM. COMMUNIC.; CZECHOSL.; DA. 1978; VOL. 43; NO 2; PP. 545-556; BIBL. 9 REF.Article

Quelques causes du malaise moral de la jeunesseJUREK, K.Pedagogika Praha. 1977, Vol 27, Num 1, pp 67-74Article

THE USE AND ACCURACY OF THE ZAF CORRECTION PROCEDURE FOR THE MICROANALYSIS OF GLASSESJUREK K; HULINSKY V.1980; MIKROCHIM. ACTA; ISSN 0026-3672; USA; DA. 1980; VOL. 1; NO 3-4; PP. 183-198; ABS. GER; BIBL. 22 REF.Article

THE LIMITS OF RESOLUTION AND DETECTABILITY IN X-RAY MICROPROBE ANALYSIS OF GLASS USING THE ENERGY DISPERSIVE SYSTEMJUREK K; HULINSKY V.1982; SILIKATY; ISSN 0037-5241; CSK; DA. 1982; VOL. 26; NO 1; PP. 69-76; ABS. CZE/RUS; BIBL. 4 REF.Article

THE INVESTIGATION OF SILICATE SYSTEMS AND MINERALS BY THE ELECTRON MICROPROBE ANALYSERHULINSKY V; JUREK K; STANEK J et al.1972; KRISTALL U. TECH.; DTSCH. ; 1972, VOL. 7, NUM. 0006, P. 711 A 717Serial Issue

Correction procedure for the electron microprobe analysis of porous materialsKNIZEK, K; JUREK, K.Mikrochimica acta (1966. Print). 1994, Vol 117, Num 1-2, pp 87-93, issn 0026-3672Article

Depth distribution of x-rays in electron microprobe analysisNGUYEN VAN HUNG; JUREK, K.Czechoslovak journal of physics. 1991, Vol 41, Num 12, pp 1281-1287, issn 0011-4626Article

The possibility of use of the interference microscope in the electron microprobe to enable the exact focusing of the analyzed specimenJUREK, K; FIALA, J.Experimentelle Technik der Physik. 1984, Vol 32, Num 2, pp 127-129, issn 0014-4924Article

Changes in surface morphology of silicate glass induced by fast electron irradiationGEDEON, O; JUREK, K; DRBOHLAV, I et al.Journal of non-crystalline solids. 2007, Vol 353, Num 18-21, pp 1946-1950, issn 0022-3093, 5 p.Conference Paper

Photoinduced bleaching of Ge35S65 amorphous filmTICHY, L; TICHA, H; HANDLIR, K et al.Journal of non-crystalline solids. 1988, Vol 101, Num 2-3, pp 223-226, issn 0022-3093Article

Domain wall motion in magnetically soft metallic glasses = Mouvement des parois de domaines dans les verres métalliques magnétiquement douxZAVETA, K; JUREK, K; DUHAJ, P et al.Czechoslovak journal of physics. 1987, Vol 37, Num 1, pp 42-46, issn 0011-4626Article

Cyclic-oxidation resistance of protective silicide layers on titaniumVOJTECH, D; KUBATIK, T; JUREK, K et al.Oxidation of metals. 2005, Vol 63, Num 5-6, pp 305-323, issn 0030-770X, 19 p.Article

Zig-zag domain walls in creep-annealed metallic glass = Parois de domaines en zig-zag dans des verres métalliques recuits sous contrainteZAVETA, K; KRAUS, L; JUREK, K et al.Journal of magnetism and magnetic materials. 1988, Vol 73, Num 3, pp 334-338, issn 0304-8853Article

X-ray microanalysis of light and stratified samples, possibilities and limitationsGEDEON, O; HULINSKY, V; JUREK, K et al.Ceramics (Praha). 1999, Vol 43, Num 2, pp 41-47, issn 0862-5468Article

A domain study of magnetization process in a stress-annealed metallic glass ribbon for fluxgate sensorsZAVETA, K; NIELSEN, O. V; JUREK, K et al.Journal of magnetism and magnetic materials. 1992, Vol 117, Num 1-2, pp 61-68, issn 0304-8853Article

Nanocrystalline fluxgate cores with transverse anisotropyRIPKA, P; ZAVETA, K; JUREK, K et al.IEEE Sensors conference. 2004, isbn 0-7803-8692-2, 3Vol, vol 3, 1570-1572Conference Paper

Spontaneous migration of alkalis in glass irradiated by the electron beamGEDEON, O; JUREK, K; HULINSKY, V et al.Ceramics (Praha). 1999, Vol 43, Num 3, pp 86-90, issn 0862-5468Article

Phase-transfer catalysis. IV: Localization of reaction sites in supported catalystsHRADIL, J; SVEC, F; KONAK, C et al.Reactive polymers, ions exchangers, sorbents. 1988, Vol 9, Num 1, pp 81-89, issn 0167-6989Conference Paper

Surface protection of titanium by Ti5Si3 silicide layer prepared by combination of vapour phase siliconizing and heat treatmentVOJTECH, D; NOVAK, P; MACHAC, P et al.Journal of alloys and compounds. 2008, Vol 464, Num 1-2, pp 179-184, issn 0925-8388, 6 p.Article

The effect of electron beam current in sem on the observed domain structure of metallic glassesZAVETA, K; JUREK, K; KAMBERSKY, V et al.Journal of magnetism and magnetic materials. 1990, Vol 86, Num 2-3, pp 254-260, issn 0304-8853, 7 p.Article

Field effect in dc-sputtered a-Si:H in structure using SiNx prepared in situSMID, V; DUNG, N. M; STOURAC, L et al.Journal of non-crystalline solids. 1985, Vol 70, Num 1, pp 1-8, issn 0022-3093Article

Behavior of silver substitution in single-grain TSMG YBCO bulk superconductorDIKO, P; ANTAL, V; KANUCHOVA, M et al.Physica. C. Superconductivity. 2010, Vol 470, Num 2, pp 155-158, issn 0921-4534, 4 p.Article

Effect of the pressing on the properties of the superconducting YBa2Cu3O7-y phasePOLLERT, E; HEJTMANEK, J; JUREK, K et al.Crystal research and technology (1979). 1988, Vol 23, Num 1, pp K6-K10, issn 0232-1300Article

Optical, luminescence and scintillation characteristics of Bi-doped LuAG and YAG single crystalline filmsZORENKO, Y; MARES, J. A; KUCERKOVA, R et al.Journal of physics. D, Applied physics (Print). 2009, Vol 42, Num 7, issn 0022-3727, 075501.1-075501.7Article

Structural characteristics and morphology of SmxCe1-xO2-x/2 thin filmsHARTMANOVA, M; JERGEL, M; MANSILLA, C et al.Applied surface science. 2009, Vol 255, Num 22, pp 9085-9091, issn 0169-4332, 7 p.Article

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