au.\*:("JURELA Z")
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THE APPLICATION OF THE SIMS TECHNIQUE TO QUANTITATIVE CHEMICAL ANALYSISJURELA Z.1981; INT. J. MASS SPECTROM. ION PHYS.; ISSN 0020-7381; NLD; DA. 1981; VOL. 37; NO 1; PP. 67-75; BIBL. 12 REF.Article
AVERAGE ENERGY OF SPUTTERED IONS FROM FIFTEEN POLYCRYSTALLINE TARGETS.JURELA Z.1975; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1975; VOL. 18; NO 2; PP. 101-110; BIBL. 31 REF.Article
COMPARISON OF SECONDARY ION YIELDS FROM CONDUCTING, SEMICONDUCTING AND NONCONDUCTING TARGETS BOMBARDED WITH 40 KEV ARGON IONSJURELA Z.1972; RAD. EFFECTS; G.B.; DA. 1972; VOL. 13; NO 3; PP. 167-170; BIBL. 5 REF.Serial Issue
Secondary ion emission. II: Testing of the thermodynamic non-equilibrium model of surface ionization = Emission d'ions secondaires II: Test du modèle thermodynamique hors équilibre de l'ionisation de surfaceJURELA, Z.Radiation effects. 1989, Vol 108, Num 2-4, pp 273-283, issn 0033-7579Article
ABSOLUTE CALORIMETER FOR MEASURING LOW ENERGY OUTPUTS FROM CO2 LASERS.JURELA Z; JOKIC T.1978; REV. SCI. INSTRUM.; U.S.A.; DA. 1978; VOL. 49; NO 3; PP. 392-394; BIBL. 6 REF.Article
MAGNETRON ION SOURCE FOR ANTIMONY IONSJOKIC T; JOSIMOV G; TOSIC MM et al.1980; NUCL. INSTRUM. METHODS.; ISSN 0029-554X; NLD; DA. 1980; VOL. 178; NO 2-3; PP. 309-310; BIBL. 6 REF.Article