au.\*:("KALICINSKI, Stanislaw")
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Polysilicon MEMS accelerometers exposed to shocks : numerical-experimental investigationGHISI, Aldo; KALICINSKI, Stanislaw; MARIANI, Stefano et al.Journal of micromechanics and microengineering (Print). 2009, Vol 19, Num 3, issn 0960-1317, 035023.1-035023.12Article
Determination of electrical and mechanical parameters in capacitive MEMS accelerometers using electrical measurementsKALICINSKI, Stanislaw; BIENIEK, Tomasz; JANUS, Pawel et al.Microelectronics and reliability. 2011, Vol 51, Num 7, pp 1192-1197, issn 0026-2714, 6 p.Conference Paper
Design, Modeling, and Characterization of a Microelectromechanical Diffuser Device for Laser Speckle ReductionTRAN, Thi-Kim-Trinh; SUBRAMANIAM, Sibi; LE, Cuong-Phu et al.Journal of microelectromechanical systems. 2014, Vol 23, Num 1, pp 117-127, issn 1057-7157, 11 p.Article
New methods and instrumentation for functional, yield and reliability testing of MEMS on device, chip and wafer levelDE WOLF, Ingrid; DE COSTER, Jeroen; CHERMAN, Vladimir et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7362, issn 0277-786X, isbn 978-0-8194-7636-4, 73620N.1-73620N.9Conference Paper
Numerical prototyping methods in microsystem accelerometers designDOWHAN, Lukasz; WYMYSLOWSKI, Artur; KALICINSKI, Stanisław et al.Microelectronics and reliability. 2011, Vol 51, Num 7, pp 1276-1282, issn 0026-2714, 7 p.Conference Paper