ON THE X-RAY-REFLECTIVITY OF ELASTICALLY BENT PERFECT CRYSTALLSKALMAN ZH; WEISSMANN S.1983; JOURNAL OF APPLIED CRYSTALLOGRAPHY; ISSN 0021-8898; DNK; DA. 1983; VOL. 16; NO 3; PP. 295-303; BIBL. 13 REF.Article

ANALYSIS OF A ZNO SURFACE STRUCTURE BY A COMBINATION OF LEED AND X-RAY DIFFRACTION.MARGONINSKI Y; KALMAN ZH.1974; PHYS. LETTERS, A; NETHERL.; DA. 1974; VOL. 47; NO 3; PP. 201-202Article

DETERMINATION OF STRAIN DISTRIBUTION IN ELASTICALLY BENT MATERIALS BY X-RAY INTENSITY MEASUREMENTKALMAN ZH; WEISSMANN S.1979; J. APPL. CRYSTALLOGR.; DNK; DA. 1979; VOL. 12; NO 2; PP. 209-220; BIBL. 15 REF.Article

SOME NATURALLY OCCURRING ILLITE-SMECTITE INTERSTRATIFICATIONSHELLER KALLAI L; KALMAN ZH.1972; CLAYS CLAY MINER.; G.B. ; 1972, VOL. 20, NUM. 0003, P. 165 A 168Serial Issue

GROWTH AND CRYSTAL STRUCTURES OF SOLID XENON AND KRYPTONSONNENBLICK Y; KALMAN ZH; STEINBERGER IT et al.1982; J. CRYST. GROWTH; ISSN 0022-0248; NLD; DA. 1982; VOL. 58; NO 1; PP. 143-151; BIBL. 35 REF.Article

THE DETERMINATION OF CRYSTALLITE DIMENSIONS USING SYNCHROTRON-RADIATION X-RAY DIFFRACTION PHOTOGRAPHSKALMAN ZH; STEINBERGER IT; HASNAIN SS et al.1979; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1979; VOL. 12; NO 6; PP. 525-530; BIBL. 7 REF.Article

MICROSCOPIC STRUCTURE STUDIES OF ZNS CRYSTALS USING SYNCHROTRON RADIATION.STEINBERGER IT; BORDAS J; KALMAN ZH et al.1977; PHILOS. MAG.; G.B.; DA. 1977; VOL. 35; NO 5; PP. 1257-1267; BIBL. 16 REF.Article

DIRECT OBSERVATION OF POLYTYPE TRANSFORMATIONS IN A VAPOUR-PHASE GROWN ZNS CRYSTAL.KIFLAWI I; KALMAN ZH; SONNENBLICK Y et al.1976; J. CRYST. GROWTH; NETHERL.; DA. 1976; VOL. 34; NO 1; PP. 145-148; BIBL. 11 REF.Article

ZINC SULPHIDE NEEDLES CONTAINING NEW POLYTYPES.KIFLAWI I; MARDIX S; KALMAN ZH et al.1969; ACTA CRISTALLOGR.; DNK; 1969(11), NUM. 011 , P. 2413 A 2415Miscellaneous

THE STACKING FAULTS AND PARTIAL DISLOCATION INVOLVED IN STRUCTURE TRANSFORMATIONS OF ZNS CRYSTALSSTEINBERGER IT; KIFLAWI I; KALMAN ZH et al.1973; PHILOS. MAG.; G.B.; DA. 1973; VOL. 27; NO 1; PP. 159-175; BIBL. 22 REF.Serial Issue

LAUE PHOTOGRAPHY OF FINE CRYSTALLINE PARTICLES = PHOTOGRAPHIE DE LAUE DE PARTICULES CRISTALLINES FINESSTEINBERGER IT; USAF U; GRAEFF W et al.1982; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1982; VOL. 15; NO 2; PP. 216-226; BIBL. 5 REF.Article

HEXAGONAL CLOSE PACKED KRYPTON AND XENON.SONNENBLICK Y; ALEXANDER E; KALMAN ZH et al.1977; CHEM. PHYS. LETTERS; NETHERL.; DA. 1977; VOL. 52; NO 2; PP. 276-278; BIBL. 14 REF.Article

STRUCTURE TYPES AND PHASE TRANSFORMATIONS IN KMNCL₃ AND TLMNCL₃HOROWITZ A; AMIT M; MAKOVSKY J et al.1982; J. SOLID STATE CHEM.; ISSN 0022-4596; GBR; DA. 1982; VOL. 43; NO 2; PP. 107-125; BIBL. 48 REF.Article

DETERMINATION OF THE STRAIN CONCENTRATION FACTORS AROUND HOLES AND INCLUSIONS IN CRYSTALS BY X-RAY TOPOGRAPHYCHAUDHURI J; KALMAN ZH; WENG GJ et al.1982; JOURNAL OF APPLIED CRYSTALLOGRAPHY; ISSN 0021-8898; DNK; DA. 1982; VOL. 15; NO 4; PP. 423-429; BIBL. 19 REF.Article

STRAINS AND PHOTOVOLTAIC RESPONSE IN TA-SPUTTERED SI METAL-INSULATOR-SEMICONDUCTOR SOLAR CELLS = DEFORMATIONS ET REPONSE PHOTOVOLTAIQUE DANS LES CELLULES SOLAIRES METAL-ISOLANT-SEMICONDUCTEUR EN SI RECOUVERT DE TA PULVERISELALEVIC B; MURTY K; ITO T et al.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 7; PP. 4808-4817; BIBL. 16 REF.Article