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Partial wave analysis of interfering Kr 3d95p resonant Raman Auger transitions based on measurements of alignment and orientation parameters within the natural line widthSCHARTNER, K.-H; SCHILL, R. H; SUKHORUKOV, V. L et al.Journal of physics. B. Atomic, molecular and optical physics (Print). 2005, Vol 38, Num 22, pp 4155-4170, issn 0953-4075, 16 p.Article

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Crosslinking copolymerization of epoxy methacrylates as studied by Fourier transform Raman spectroscopySANDNER, B; KAMMER, S; WARTEWIG, S et al.Polymer (Guildford). 1996, Vol 37, Num 21, pp 4705-4712, issn 0032-3861Article

Novel method for a flexible double sided microelectrode fabrication processDOERGE, Thomas; KAMMER, S; HANAUER, M et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7365, issn 0277-786X, isbn 978-0-8194-7639-5 0-8194-7639-0, 1Vol, 73650K.1-73650K.11Conference Paper

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Photo double ionization of helium 100 eV and 450 eV above threshold: III. Gerade and ungerade amplitudes and their relative phasesKNAPP, A; KRÄSSIG, B; JAGUTZKI, O et al.Journal of physics. B. Atomic, molecular and optical physics (Print). 2005, Vol 38, Num 6, pp 645-657, issn 0953-4075, 13 p.Article

Experimental high resolution study of the photoproduction of Ne⁺ 3p satellites in the threshold energy rangeZIMMERMANN, B; SCHARTNER, K.-H; WILHELMI, O et al.Journal of physics. B. Atomic, molecular and optical physics (Print). 2004, Vol 37, Num 2, pp 511-523, issn 0953-4075, 13 p.Article

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Detecting electrical forces in noncontact atomic force microscopyMÜLLER, F; MÜLLER, A.-D; HIETSCHOLD, M et al.Measurement science & technology (Print). 1998, Vol 9, Num 5, pp 734-738, issn 0957-0233Article

Absolute cross sections and branching ratios for the radiative decay of doubly excited helium determined by photon-induced fluorescence spectroscopyMICKAT, S; SCHARTNER, K.-H; KAMMER, S. V et al.Journal of physics. B. Atomic, molecular and optical physics (Print). 2005, Vol 38, Num 15, pp 2613-2628, issn 0953-4075, 16 p.Article

Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diodeHOSAKA, S; SHINTANI, T; MIYAMOTO, M et al.Japanese journal of applied physics. 1996, Vol 35, Num 1B, pp 443-447, issn 0021-4922, 1Conference Paper