THE ENERGY DEPENDENCE OF SECONDARY EMISSION BASED ON THE RANGE-ENERGY RETARDATION POWER FORMULAONO S; KANAYA K.1979; J. PHYS. D; GBR; DA. 1979; VOL. 12; NO 4; PP. 619-632; BIBL. 55 REF.Article

RIGOROUS TREATMENT OF BIPOTENTIAL LENS WHOSE AXIAL POTENTIAL DISTRIBUTION IS GIVEN BY PHI (MU )=V EXP (K₀ ARCCOSMU ).KANAYA K; BABA N.1977; OPTIK; DTSCH.; DA. 1977; VOL. 47; NO 3; PP. 239-269; ABS. ALLEM.; BIBL. 26 REF.Article

CONSISTENT THEORY OF ELECTRON SCATTERING WITH ATOMS IN ELECTRON MICROSCOPES.KANAYA K; ONO S.1976; J. PHYS. D; G.B.; DA. 1976; VOL. 9; NO 2; PP. 161-174; BIBL. 43 REF.Article

CORRECTION OF THE DISTORTED SPOT SHAPE OF A DEFLECTED ELECTRON PROBE BY MEANS OF AN EIGHT-POLE DEFLECTION SYSTEMBABA N; KANAYA K.1981; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1981; VOL. 14; NO 8; PP. 943-951; BIBL. 6 REF.Article

GENERAL THEORY OF THE MAGNETIC EINZEL LENS BASED ON THE AXIAL FIELD DISTRIBUTION MODEL H(Z)=H_OC!Z/A!^M-1/(1+!Z/A!^2M)BABA N; KANAYA K.1979; J. PHYS. E; GBR; DA. 1979; VOL. 12; NO 6; PP. 525-537; BIBL. 17 REF.Article

SECONDARY ELECTRON EMISSION FROM SOLID SURFACES BY BOMBARDEMENT WITH CHARGED PARTICLES.KANAYA K; ONO S.1974; JAP. J. APPL. PHYS.; JAP.; DA. 1974; VOL. 13; NO 6; PP. 944-949; BIBL. 17 REF.Article

SECONDARY ELECTRON EMISSION DUE TO PRIMARY AND BACKSCATTERED ELECTRONSKANAYA K; KAWAKATSU H.1972; J. PHYS. D; G.B.; DA. 1972; VOL. 5; NO 9; PP. 1727-1742; BIBL. 46 REF.Serial Issue

METAL ION SOURCE FOR ION IMPLANTATION SYSTEMSHIMIZU K; KAWAKATSU H; KANAYA K et al.1972; JAP. J. APPL. PHYS.; JAP.; DA. 1972; VOL. 11; NO 8; PP. 1192-1198; BIBL. 13 REF.Serial Issue

COMPUTER SIMULATION OF IMAGE CONTRAST OF CLUSTERED ATOMS ON AMORPHOUS SUPPORT FILM FOR HIGH RESOLUTION ELECTRON MICROSCOPY = SIMULATION SUR ORDINATEUR DU CONTRASTE D'IMAGES POUR DES AMAS D'ATOMES SUR DES SUPPORTS DE COUCHES MINCES AMORPHES POUR LA MICROSCOPIE ELECTRONIQUE A HAUTE RESOLUTIONOIKAWA T; HOJOU K; KANAYA K et al.1979; ULTRAMICROSCOPY; NLD; DA. 1979; VOL. 4; NO 2; PP. 181-191; BIBL. 19 REF.Article

LATTICE IMAGE OBSERVATION OF EXTENDED DISLOCATIONS IN CDS BY HIGH RESOLUTION ELECTRON MICROSCOPYSUZUKI K; TAKEUCHI S; KANAYA K et al.1982; JAPANESE JOURNAL OF APPLIED PHYSICS; ISSN 0021-4922; JPN; DA. 1982; VOL. 21; NO 10; PART. 2; PP. 621-623; BIBL. 13 REF.Article

CONTAMINATION LAYERS FORMED BY ARGON ION BOMBARDMENT.SHIMIZU K; KAWAKATSU H; KANAYA K et al.1975; J. PHYS. D; G.B.; DA. 1975; VOL. 8; NO 13; PP. 1453-1459; BIBL. 21 REF.Article

EXTRACTION OF HIGH CURRENT ION BEAMS WITH LAMINATED FLOWKANAYA K; KOGA K; TOKI K et al.1972; J. PHYS. E; G.B.; DA. 1972; VOL. 5; NO 7; PP. 641-648; BIBL. 18 REF.Serial Issue

OBSERVATION OF INTERNAL STRUCTURE OF CASEIN SUBMICELLES BY MEANS OF ION BEAM SPUTTERINGKIMURA T; TANEYA S; KANAYA K et al.1979; MILCHWISSENSCHAFT; DEU; DA. 1979; VOL. 34; NO 9; PP. 521-524; ABS. GER; BIBL. 18 REF.Article

RIGOROUS TREATMENT OF MAGNETIC LENS WHOSE AXIAL FIELD DISTRIBUTION IS GIVEN BY H(Z/A)=H₀(1-MU ²)^(2M-1)/2.KANAYA K; BABA N; ONO S et al.1976; OPTIK; DTSCH.; DA. 1976; VOL. 46; NO 2; PP. 125-148; ABS. ALLEM.; BIBL. 29 REF.Article

Meanfield study of Z₂ Higgs model with radial excitations and mode correlation problemKANAYA, K; SUGIYAMA, Y.Progress of theoretical physics. 1984, Vol 72, Num 6, pp 1158-1175, issn 0033-068XArticle

DIGITAL PROCESSING OF LATTICE IMAGES FROM A DIFFRACTION SPOT SELECTED IN DIFFRACTOGRAMS OF ELECTRON MICROGRAPHSKANAYA K; BABA N; SHINO M et al.1982; MICRON; ISSN 0047-7206; GBR; DA. 1982; VOL. 13; NO 2; PP. 205-219; BIBL. 19 REF.Article

AMELIORATION DE LA TENACITE DE LA ZONE DE FUSION DES SOUDURES A L'AIDE DE FINES PARTICULES DE TIN ET DEVELOPPEMENT D'ACIER APTE AU SOUDAGE AVEC UN FORT APPORT DE CHALEURKANAZAWA S; NAKASHIMA A; OKAMOTO K et al.1975; TETSU-TO-HAGANE, J. IRON STEEL INST. JAP.; JAP.; DA. 1975; VOL. 61; NO 11; PP. 2589-2603; ABS. ANGL.; BIBL. 9 REF.Article

Application of the micro-stopped-flow time difference analysis technique to a dehydrogenase-catalyzed reaction for rapid and sensitive determination of pyruvateKANAYA, K; HIROMI, K.Agricultural and biological chemistry. 1988, Vol 52, Num 10, pp 2563-2568, issn 0002-1369Article

Determination of low concentrations of protein by the biuret method using the «stopped-flow time difference analysis» technique = Dosage de faibles concentrations de protéines par la méthode du biuret en utilisant la technique «d'analyse de la différence d'absorbance lors de l'injection avec interruption d'élution, pendant un temps donné»KANAYA, K. I; HIROMI, K.Agricultural and biological chemistry. 1987, Vol 51, Num 7, pp 1885-1892, issn 0002-1369Article

Application of a stopped-flow time-difference technique to spectrophotometric determination of ultratrace levels of phosphate = Application d'une technique spectrophotométrique «stopped flow» variable dans le temps, pour le dosage des phosphates à l'état d'ultratraceKANAYA, K. I; HIROMI, K.Analytica chimica acta. 1987, Vol 203, Num 1, pp 35-42, issn 0003-2670Article

Correlation and screening in finite-temperature SU(2) gauge theoryKANAYA, K; SATZ, H.Physical review. D. Particles and fields. 1986, Vol 34, Num 10, pp 3193-3197, issn 0556-2821Article

FILAMENTOUS STRUCTURE IN YEAST MITOCHONDRIA BY FREEZE-ETCHING OF REPLICA COMBINED WITH RAPID FREEZINGNAGANO M; KODAMA K; BABA N et al.1982; JOURNAL OF ELECTRON MICROSCOPY; ISSN 0022-0744; JPN; DA. 1982; VOL. 31; NO 3; PP. 268-272; BIBL. 13 REF.Article

IMPROVING A CONVENTIONAL TRANSMISSION ELECTRON MICROSCOPE FOR HIGH RESOLUTIONOIKAWA T; KIMURA C; HOJOU K et al.1979; ULTRAMICROSCOPY; NLD; DA. 1979; VOL. 4; NO 10; PP. 473-477; BIBL. 4 REF.Article

HIGH RESOLUTION SHADOWING FOR ELECTRON MICROSCOPY BY SPUTTER DEPOSITION.ADACHI K; HOJOU K; KATOH M et al.1976; ULTRAMICROSCOPY; NETHERL.; DA. 1976; VOL. 2; NO 1; PP. 17-29; BIBL. 21 REF.Article

Determination of low concentrations of protein by the biuret method using the stopped-flow time difference analysis techniqueKANAYA, K; HIROMI, K.Agricultural and biological chemistry. 1987, Vol 51, Num 7, pp 1885-1892, issn 0002-1369Article