THEORY OF HIGH-FIELD ELECTRIC CONDUCTION AND BREAKDOWN IN DIELECTRIC LIQUIDS.KAO KC.1976; I.E.E.E. TRANS. ELECTR. INSULAT.; U.S.A.; DA. 1976; VOL. 11; NO 4; PP. 121-128; BIBL. 48 REF.Article

LASER INTERFEROMETRY FOR THE DETERMINATION OF THICKNESS DISTRIBUTIONS OF LOW ABSORBING FILMS AND THEIR SPATIAL AND THICKNESS RESOLUTIONSMISHIMA T; KAO KC.1982; APPL. OPT.; ISSN 0003-6935; USA; DA. 1982; VOL. 21; NO 6; PP. 1101-1105; BIBL. 6 REF.Article

DETERMINATION OF SPATIAL DISTRIBUTIONS OF THICKNESS AND OPTICAL CONSTANTS OF THIN FILMS BY A NEW OPTICAL TECHNIQUEMISHIMA T; KAO KC.1981; APPL. OPT.; ISSN 0003-6935; USA; DA. 1981; VOL. 20; NO 21; PP. 3719-3722; BIBL. 4 REF.Article

CONDUCTING FILAMENTS AND SWITCHING PHENOMENA IN CHALCOGENIDE SEMICONDUCTORSNAKASHIMA K; KAO KC.1979; J. NON-CRYST. SOLIDS; NLD; DA. 1979; VOL. 33; NO 2; PP. 189-204; BIBL. 28 REF.Article

EXCESS LOSSES OF SINGLY AND DOUBLY CLAD OPTICAL FIBER WAVEGUIDES WITH BENDSTAKEDA Y; KAO KC.1978; OPT. COMMUNIC.; NLD; DA. 1978; VOL. 27; NO 2; PP. 226-229; BIBL. 12 REF.Article

ON THE THERMAL ACTIVATION ENERGY FOR HIGH-FIELD ELECTRIC CONDUCTION IN DIELECTRIC LIQUIDS.KAO KC; RASHWAN MM.1978; I.E.E.E. TRANS. ELECTR. INSULAT.; U.S.A.; DA. 1978; VOL. 13; NO 2; PP. 86-93; BIBL. 1 P.Article

THE EFFECTS OF ELECTRODE MATERIALS ON THE SWITCHING BEHAVIOUR OF THE AMORPHOUS SEMICONDUCTOR SI₁₂-GE₁₀-AS₃₀-TE₄₈.PETRILLO GA; KAO KC.1974; J. NON-CRYST. SOLIDS; NETHERL.; DA. 1974; VOL. 16; NO 2; PP. 247-257; BIBL. 13 REF.Article

A UNIFIED APPROACH TO THE THEORY OF DOUBLE INJECTION IN SOLIDS WITH TRAPS UNIFORMLY AND NON-UNIFORMLY DISTRIBUTED IN THE ENERGY BAND GAPHWANG W; KAO KC.1973; SOLID-STATE ELECTRON.; G.B.; DA. 1973; VOL. 16; NO 3; PP. 407-415; BIBL. 13 REF.Serial Issue

THE CAPACITANCES OF ANISO-TYPE HETEROJUNCTIONS WITH CONTINUOUSLY VARYING ENERGY BAND GAP AND ELECTRON AFFINITY IN THE TRANSITION REGIONHALIL B; KAO KC.1972; INTERNATION. F. ELECTRON.; G.B.; DA. 1972; VOL. 33; NO 1; PP. 33-47; BIBL. 11 REF.Serial Issue

DETERMINATION OF ELECTRIC FIELD DISTRIBUTIONS ALONG FLUID-SOLID DIELECTRIC INTERFACES USING A SCHLIEREN TECHNIQUESUEDA H; KAO KC.1982; IEEE TRANSACTIONS ON ELECTRICAL INSULATION; ISSN 0018-9367; USA; DA. 1982; VOL. 17; NO 5; PP. 405-413; BIBL. 12 REF.Article

PREBREAKDOWN PHENOMENA IN HIGH-VISCOSITY DIELECTRIC LIQUIDSSUEDA H; KAO KC.1982; IEEE TRANS. ELECTR. INSUL.; ISSN 0018-9367; USA; DA. 1982; VOL. 17; NO 3; PP. 221-228; BIBL. 21 REF.Article

DIRECT OBSERVATION OF SWITCHING FILAMENTS IN CHALCOGENIDE GLASSES.SAJI M; KAO KC.1976; J. NON-CRYST. SOLIDS; NETHERL.; DA. 1976; VOL. 22; NO 1; PP. 223-227; BIBL. 8 REF.Article

SPACE CHARGE CREATED BY AN OHMIC INJECTING CONTACT, AND ITS EFFECTS IN AN ELECTROLYTE-INSULATOR SYSTEM WITH TRAPS DISTRIBUTED NON-UNIFORMLY IN ENERGY AND IN SPACE.ELSHARKAWI AR; KAO KC.1976; SOLID-STATE ELECTRON.; G.B.; DA. 1976; VOL. 19; NO 11; PP. 939-947; BIBL. 18 REF.Article

STUDIES OF THE THEORY OF SINGLE AND DOUBLE INJECTIONS IN SOLIDS WITH A GAUSSIAN TRAP DISTRIBUTION.HWANG W; KAO KC.1976; SOLID-STATE ELECTRON.; G.B.; DA. 1976; VOL. 19; NO 12; PP. 1045-1047; BIBL. 7 REF.Article

DETECTION OF THICKNESS UNIFORMITY OF FILM LAYERS IN SEMICONDUCTOR DEVICES BY SPATIALLY RESOLVED ELLIPSOINTERFEROMETRYMISHIMA T; KAO KC.1982; OPT. ENG.; ISSN 0091-3286; USA; DA. 1982; VOL. 21; NO 6; PP. 1074-1078; BIBL. 5 REF.Article

DISPERSIVE OPTICAL CONSTANTS OF AMORPHOUS SE_1-HXTE_X FILMSADACHI H; KAO KC.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 12; PP. 6326-6331; BIBL. 19 REF.Article

SCHLIEREN IMAGES OBSERVED IN ELECTRICALLY STRESSED DIELECTRIC LIQUIDSSUEDA H; KAO KC.1980; APPL. OPT.; USA; DA. 1980; VOL. 19; NO 15; PP. 2538-2545; BIBL. 15 REF.Article

SCHLIEREN METHOD FOR THE DETERMINATION OF ELECTRIC FIELD DISTRIBUTIONS IN DIELECTRICSSUEDA H; KAO KC.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 23; PP. 3990-3995; BIBL. 17 REF.Article

ELECTROLUMINESCENCE IN ANTHRACENE CRYSTALS UNDER TIME-VARYING ELECTRIC FIELDS.KUNKEL HP; KAO KC.1976; J. PHYS. CHEM. SOLIDS; G.B.; DA. 1976; VOL. 37; NO 9; PP. 863-866; BIBL. 6 REF.Article

STUDY OF THE OPTICAL PROPERTIES OF ANTHRACENE THIN FILMS BY ELLIPSOMETRY.ELSHARKAWI AR; KAO KC.1975; J. OPT. SOC. AMER.; U.S.A.; DA. 1975; VOL. 65; NO 11; PP. 1269-1273; BIBL. 27 REF.Article

PRESSURE DEPENDENCE OF ELECTROLUMINESCENCE IN DIELECTRIC LIQUIDS.KAO KC; RASHWAN MM.1974; PROC. I.E.E.E.; U.S.A.; DA. 1974; VOL. 62; NO 6; PP. 856-858; BIBL. 7 REF.Article

SUBLINEAR AND SUPERLINEAR CURRENT-VOLTAGE CHARACTERISTICS OF AMORPHOUS SE_1-XTE_X FILMSNODA M; CHOW L; KAO KC et al.1979; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1979; VOL. 12; NO 8; PP. 1345-1355; BIBL. 37 REF.Article

EXPERIMENTAL EVIDENCE OF ENERGY-CONTROLLED SWITCHING IN AMORPHOUS SEMICONDUCTORS.SAJI M; LEUNG CH; KAO KC et al.1977; J. NON-CRYST. SOLIDS; NETHERL.; DA. 1977; VOL. 23; NO 2; PP. 147-158; BIBL. 12 REF.Article

PROPAGATION DANS LES GUIDES D'ONDE A FIBRE OPTIQUE.RAMSAY MM; HOCKHAM GA; KAO KC et al.1975; REV. TELECOMMUNIC.; FR.; DA. 1975; VOL. 50; NO 3; PP. 176-184; BIBL. 27 REF.Article

LICHTWELLEN IN LICHTLEITFASERN. I. GRUNDFORMEN DER LICHTLEITFASERN UND THEORETISCHE UNTERSUCHUNGEN. = LES ONDES LUMINEUSES DANS LES FIBRES OPTIQUES. I. LES FORMES FONDAMENTALES DE FIBRES ET LES RECHERCHES THEORIQUESRAMSAY MM; HOCKHAM GA; KAO KC et al.1976; NACHR. ELEKTRON.; DTSCH.; DA. 1976; VOL. 30; NO 6; PP. 137-139; ABS. ANGL.; BIBL. 7 REF.Article