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au.\*:("KLEINPENNING TGM")

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ELECTRICAL CONDUCTION AND 1/F NOISE IN LI-DOPED MNO.KLEINPENNING TGM.1976; J. PHYS. CHEM. SOLIDS; G.B.; DA. 1976; VOL. 37; NO 10; PP. 925-928; BIBL. 14 REF.Article

1/F NOISE IN P-N DIODESKLEINPENNING TGM.1980; PHYSICA B+C; ISSN 0378-4363; NLD; DA. 1980; VOL. 98; NO 4; PP. 289-299; BIBL. 17 REF.Article

LOW-FREQUENCY NOISE IN SCHOTTKY BARRIER DIODESKLEINPENNING TGM.1979; SOLID-STATE ELECTRON.; GBR; DA. 1979; VOL. 22; NO 2; PP. 121-128; BIBL. 20 REF.Article

THEORY OF NOISE INVESTIGATIONS ON CONDUCTORS WITH THE FOUR-PROBE METHOD.KLEINPENNING TGM.1977; J. APPL. PHYS.; U.S.A.; DA. 1977; VOL. 48; NO 7; PP. 2946-2949; BIBL. 8 REF.Article

1F NOISE IN THERMO E.M.F. OF INTRINSIC AND EXTRINSIC SEMICONDUCTORS.KLEINPENNING TGM.1974; PHYSICA; PAYS-BAS; DA. 1974; VOL. 77; NO 1; PP. 78-98; BIBL. 16 REF.Article

SCATTERING MECHANISMS AND L/F NOISE IN SEMICONDUCTORSKLEINPENNING TGM.1981; PHYSICA B+C; ISSN 0378-4363; NLD; DA. 1981; VOL. 103; NO 2-3; PP. 345-347; BIBL. 8 REF.Article

TEMPERATURE FLUCTUATIONS AND 1/F NOISE IN SEMICONDUCTORS AND METALS.KLEINPENNING TGM.1976; PHYSICA B+C; PAYS-BAS; DA. 1976; VOL. 84; NO 3; PP. 353-361; BIBL. 11 REF.Article

ON 1/F NOISE OF HOT ELECTRONS IN SILICONKLEINPENNING TGM.1982; PHYSICA B+C; ISSN 0378-4363; NLD; DA. 1982; VOL. 113; NO 2; PP. 189-194; BIBL. 14 REF.Article

ON LOW-FREQUENCY NOISE IN TUNNEL DIODESKLEINPENNING TGM.1978; SOLID-STATE ELECTRON.; GBR; DA. 1978; VOL. 21; NO 7; PP. 927-931; BIBL. 15 REF.Article

1/F NOISE IN SOLID STATE SINGLE INJECTION DIODES.KLEINPENNING TGM.1978; PHYSICA B+C; PAYS-BAS; DA. 1978; VOL. 94; NO 2; PP. 141-151; BIBL. 12 REF.Article

THE ANION MOBILITY IN BETA -PBF2 FROM NOISE MEASUREMENTSKLEINPENNING TGM; PETERS CAJ.1979; PHYS. STATUS SOLIDI, A; DDR; DA. 1979; VOL. 51; NO 1; PP. K105-K108; BIBL. 3 REF.Article

CONDUCTION MECHANISM AND 1/F NOISE IN ZNO VARISTORSKUSY A; KLEINPENNING TGM.1983; JOURNAL OF APPLIED PHYSICS; ISSN 0021-8979; USA; DA. 1983; VOL. 54; NO 6; PP. 2900-2906; BIBL. 20 REF.Article

1/F NOISE OF DEFORMED CRYSTALS.STROEKEN JTM; KLEINPENNING TGM.1976; J. APPL. PHYS.; U.S.A.; DA. 1976; VOL. 47; NO 10; PP. 4691-4692; BIBL. 9 REF.Article

MODEL FOR 1/F NOISE IN METAL-OXIDE-SEMICONDUCTOR TRANSISTORSKLEINPENNING TGM; VANDAMME LKJ.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 3; PART. 1; PP. 1594-1596; BIBL. 8 REF.Article

HALL-EFFECT NOISE IN SEMICONDUCTORS.VAES HMJ; KLEINPENNING TGM.1977; J. APPL. PHYS.; U.S.A.; DA. 1977; VOL. 48; NO 12; PP. 5131-5134; BIBL. 9 REF.Article

HALL EFFECT NOISE: FLUCTUATIONS IN NUMBER OR MOBILITY.KLEINPENNING TGM; BELL DA.1976; PHYSICA B+C; PAYS-BAS; DA. 1976; VOL. 81; NO 2; PP. 301-304; BIBL. 5 REF.Article

EXPERIMENTAL STUDIES ON 1/F NOISEHOOGE FN; KLEINPENNING TGM; VANDAMME LKJ et al.1981; REP. PROG. PHYS.; ISSN 0034-4885; GBR; DA. 1981; VOL. 44; NO 5; PP. 479-532; BIBL. 2 P.Article

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