STRUCTURAL AND RESISTIVITY CHANGES IN HEAT-TREATED CHROMIUM-GOLD FILMS.MUNITZ A; KOMEM Y.1976; THIN SOLID FILMS; NETHERL.; DA. 1976; VOL. 37; NO 2; PP. 171-179; BIBL. 12 REF.Article

AN ELECTRON MICROSCOPY STUDY OF ARSENIC SEGREGATION IN SILICON.KOMEM Y.1977; ACTA METALLURG.; E.U.; DA. 1977; VOL. 25; NO 7; PP. 809-814; ABS. FR. ALLEM.; BIBL. 9 REF.Article

ON THE MOBILITY OF IONS ALONG GRAIN BOUNDARIESKOMEM Y.1972; SCRIPTA METALLURG.; E.U.; DA. 1972; VOL. 6; NO 10; PP. 941-942; BIBL. 11 REF.Serial Issue

THE EFFECT OF GERMANIUM ION IMPLANTATION DOSE ON THE AMORPHIZATION AND RECRYSTALLIZATION OF POLYCRYSTALLINE SILICON FILMSKOMEM Y; HALL IW.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 11; PP. 6655-6658; BIBL. 14 REF.Article

THE INCREASE IN THE ELECTRICAL RESISTANCE OF HEAT-TREATED AU/CR FILMS = L'AUGMENTATION DANS LA RESISTANCE ELECTRIQUE DE COUCHES MINCES AU/CR TRAITEES THERMIQUEMENTMUNITZ A; KOMEM Y.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 71; NO 2; PP. 177-188; BIBL. 11 REF.Article

PRECIPITATION AT COHERENCY LOSS IN CU-0.35 WT PCT CRKOMEM Y; REZEK J.1975; METALLURG. TRANS. A; U.S.A.; DA. 1975; VOL. 6; NO 3; PP. 549-551; BIBL. 8 REF.Article

ON THE STRUCTURE OF ION-IMPLANTED BICRYSTALLINE GOLD FILMS = SUR LA STRUCTURE DE COUCHES D'OR BICRISTALLINES IMPLANTEES PAR DES IONSGREENBERG A; KOMEM Y; BAUER CL et al.1982; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1982; VOL. 90; NO 1; PP. 77-83; BIBL. 8 REF.Conference Paper

THE EFFECT OF THE ELECTRON BOMBARDMENT OF NACL SUBSTRATES ON THE EPITAXIAL GROWTH OF GOLD AND SILVER FILMSCOSANDEY F; KOMEM Y; BAUER CL et al.1979; THIN SOLID FILMS; NLD; DA. 1979; VOL. 59; NO 2; PP. 165-174; BIBL. 28 REF.Article

SHOCK INDUCED HARDNESS IN ALPHA -IRON.GANIN E; KOMEM Y; ROSEN A et al.1978; MATER. SCI. ENGNG; NETHERL.; DA. 1978; VOL. 33; NO 1; PP. 1-4; BIBL. 14 REF.Article

RECRYSTALLIZATION NEAR LOW-ANGLE (001) TILT BOUNDARIES FOLLOWING COBALT IMPLANTATION IN BICRYSTALLINE THIN FILMS OF GOLDKOMEM Y; GREENBERG A; BAUER CL et al.1981; PHYS. STATUS SOLIDI, SECT. A, APPL. RES.; DDR; DA. 1981-03-16; VOL. 64; NO 1; PP. 317-324; BIBL. 17 REF.Article

CHARACTERIZATION OF (001) TILT BOUNDARIES PRODUCED BY EPITAXIAL GROWTH ON BICRYSTALLINE SUBSTRATES OF NACLCOSANDEY F; KOMEM Y; BAUER CL et al.1978; PHYS. STATUS SOLIDI, A; DDR; DA. 1978; VOL. 48; NO 2; PP. 555-563; ABS. GER; BIBL. 12 REF.Article

STUDY OF CONDUCTIVE GOLD FILM LIFETIME UNDER HIGH CURRENT DENSITIESETZION M; BLECH IA; KOMEM Y et al.1975; J. APPL. PHYS.; U.S.A.; DA. 1975; VOL. 46; NO 4; PP. 1455-1458; BIBL. 12 REF.Article

THE EFFECT OF SUBSTRUCTURE ON CREEP PROPERTIES OF MO-5W ALLOY = EFFET DE LA SOUS-STRUCTURE SUR LE FLUAGE D'UN ALLIAGE MO-5WBENDERSKY L; KOMEM Y; ROSEN A et al.1981; HIGH TEMPERATURES- HIGH PRESSURES; ISSN 0018-1544; GBR; DA. 1981; VOL. 13; NO 5; PP. 511-520; BIBL. 9 REF.Article

RECRYSTALLIZATION NEAR LOW-ANGLE (001) TILT BOUNDARIES FOLLOWING COBALT IMPLANTATION IN BICRYSTALLINE THIN FILMS OF GOLDKOMEM Y; GREENBERG A; BAUER CL et al.1981; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1981; VOL. 64; NO 1; PP. 317-324; ABS. GER; BIBL. 17 REF.Article

DIRECT OBSERVATION OF GRAIN BOUNDARY DISLOCATION CLIMB IN ION-IRRADIATED GOLD BICRYSTALSKOMEM Y; PETROFF P; BALLUFFI RW et al.1972; PHILOS. MAG.; G.B.; DA. 1972; VOL. 26; NO 1; PP. 239-252; BIBL. 18 REF.Serial Issue

LATTICE IMAGING OF LOW-ANGLE (001) TILT BOUNDARIES IN BICRYSTALLINE FILMS OF GOLDCOSANDEY F; KOMEM Y; BAUER CL et al.1978; SCRIPTA METALLURG.; USA; DA. 1978; VOL. 12; NO 6; PP. 577-582; BIBL. 14 REF.Article

The microstructure and electrical properties of contacts formed in the Ni/Al/Si system due to rapid thermal processingKATZ, A; KOMEM, Y.Journal of applied physics. 1988, Vol 63, Num 11, pp 5526-5533, issn 0021-8979Article

Effect of heat treatments on the electrical resistivity of polycrystalline silicon films implanted with antimonyKOMEM, Y; HARRISON, H. B.Applied physics letters. 1987, Vol 50, Num 21, pp 1524-1526, issn 0003-6951Article

Dislocations and twins formed in zone melted recrystallized Si on SiO₂KOMEM, Y; WEINBERG, Z. A.Journal of applied physics. 1984, Vol 56, Num 8, pp 2213-2217, issn 0021-8979Article

On the I-V characteristics of contacts made of Al/Ti:W films on amorphized (100)Si = Caractéristique I-V de contacts constitués de couches de Al/Ti:W sur Si(100) amorphiséBERGER, S; KOMEM, Y.Journal of applied physics. 1989, Vol 66, Num 12, pp 5890-5893, issn 0021-8979Article

Diffusional processes in thin films of Au/CeO₂ on Ni-Cr superalloyGENUT, M; KOMEM, Y.Thin solid films. 1986, Vol 144, Num 2, pp 211-222, issn 0040-6090Article

Diffusional processes in thin films of Au/CeO₂ on Ni-Cr superalloy = Processus de diffusion dans les couches minces Au/ceO₂ sur un superalliage Ni-CrGENUT, M; KOMEM, Y.Thin solid films. 1986, Vol 144, Num 2, pp 211-222, issn 0040-6090Article

Initial crystallization stage of amorphous germanium filmsEDELMAN, F; KOMEM, Y; BENDAYAN, M et al.Journal of applied physics. 1992, Vol 72, Num 11, pp 5153-5157, issn 0021-8979Article

On the microstructure, composition and electrical properties of Al/TiW/poly-Si systemBERGER, S; KOMEM, Y; WEISS, B. Z et al.Applied surface science. 1991, Vol 48-49, pp 281-287, issn 0169-4332, 7 p.Conference Paper

Phase separation in reactions of Ni-Ta thin films with GaAs = Séparation de phases lors des réactions des couches minces Ni-Ta avec GaAsLAHAV, A; EIZENBERG, M; KOMEM, Y et al.Journal of applied physics. 1987, Vol 62, Num 5, pp 1768-1777, issn 0021-8979Article