au.\*:("KOZUBSKI, Rafal")
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Characterization of metallic oxide thin-layer materials by auger electron spectroscopy (AES) combined with Ar+ ion etchingPISAREK, Marcin.Annales de chimie (Paris. 1914). 2007, Vol 32, Num 4, pp 383-394, issn 0151-9107, 12 p.Article
Elaboration et caracterisations optique et structurale des nanocristaux semi-conducteurs de znse dans des films de polystyrene obtenus par la methode spin-coating = Elaboration, structural and optical characterizations of ZnSe semiconductor nanocrystals in polystyrene films obtained by the spin-coating methodAKSAS, Ali; CHELOUCHE, Azeddine; BOUDINE, Boubekeur et al.Annales de chimie (Paris. 1914). 2007, Vol 32, Num 4, pp 359-364, issn 0151-9107, 6 p.Article
Positron depth profiling in solid surface layersGRYNSZPAN, Robert I; ANWAND, Wolfgang; BRAUER, Gerhard et al.Annales de chimie (Paris. 1914). 2007, Vol 32, Num 4, pp 365-382, issn 0151-9107, 18 p.Article