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SHALLOW SILICIDE-TO-SILICON CONTACTS: THE CASE OF AMORPHOUS-PD80SI20-TO-SILICONKRITZINGER S; TU KN.1980; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 37; NO 2; PP. 205-208; BIBL. 9 REF.Article

LOCAL BEAM HEATING IN METALLIC ELECTRON MICROSCOPE SPECIMENS.KRITZINGER S; RONANDER E.1974; J. MICR.; G.B.; DA. 1974; VOL. 102; NO 2; PP. 117-124; BIBL. 9 REF.Article

THE UNFAULTING OF FRANK VACANCY DISLOCATION LOOPS BY THE SIMULTANEOUS ACTION OF TWO SHEARING SHOCKLEY DISLOCATIONS.SWART VP; KRITZINGER S.1974; CRYST. LATTICE DEFECTS; G.B.; DA. 1974; VOL. 5; NO 2; PP. 95-98; BIBL. 10 REF.Article

A DIRECT OBSERVATION OF THE DUAL-ACTION UNFAULTING OF FRANK VACANCY DISLOCATION LOOPSSWART VP; KRITZINGER S.1974; CRYST. LATTICE DEFECTS; G.B.; DA. 1974; VOL. 5; NO 3-4; PP. 203-206; BIBL. 3 REF.Article

MULTIPLE-SHOCKLEY UNFAULTING OF SINGLE-LAYER FAULTED DEFECTS.RONANDER E; KRITZINGER S.1976; J. MICR.; G.B.; DA. 1976; VOL. 106; NO 3; PP. 273-283; BIBL. 6 REF.Article

A METHOD FOR RAPID IN SITU MEASUREMENT OF FOIL THICKNESS IN A TEM = UNE METHODE POUR LA MESURE RAPIDE IN SITU DE L'EPAISSEUR DES FEUILLES DANS UN MICROSCOPE ELECTRONIQUE EN TRANSMISSIONDU PREEZ WB; KRITZINGER S.1982; J. MICROSC. (OXF.); ISSN 0022-2720; GBR; DA. 1982; VOL. 127; NO 2; PP. 149-153; BIBL. 14 REF.Article

DISLOCATION CELL BOUNDARY WIDTHS AND DISLOCATION CELL SIZES IN DEFORMED COPPERKNOESEN D; KRITZINGER S.1982; ACTA METALL.; USA; DA. 1982-06; VOL. 30; NO 6; PP. 1219-1222; BIBL. 8 REF.Article

THIN PALLADIUM SILICIDE CONTACTS TO SILICONKRITZINGER S; TU KN.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 1; PP. 305-310; BIBL. 12 REF.Article

A QUANTITATIVE STUDY OF ANOMALOUS ANNEALING PHENOMENA IN QUENCHED ALUMINUMRONANDER E; KRITZINGER S.1978; J. APPL. PHYS.; USA; DA. 1978; VOL. 49; NO 7; PP. 3980-3986; BIBL. 19 REF.Article

Un exemple d'immigration d'alternatifs allemands dans les Pyrénées ariégeoisesKRITZINGER, S.Revue géographique des Pyrénées et du Sud-Ouest. 1989, Vol 60, Num 2, pp 199-222, issn 0035-3221Article

DISLOCATION LOOPS ON CUBE PLANES IN AL-0,13 WT.% MGSWART VP; KRITZINGER S.1973; ACTA METALLURG.; E.U.; DA. 1973; VOL. 21; NO 5; PP. 605-610; ABS. FR. ALLEM.; BIBL. 9 REF.Serial Issue

TWO-SHOCKLEY UNFAULTING OF TWO- AND THREE-LAYER FAULTED DEFECTS.RONANDER E; KRITZINGER S.1977; J. MICR.; G.B.; DA. 1977; VOL. 108; NO 2; PP. 201-210; BIBL. 10 REF.Article

THE STRUCTURE OF MULTIPLE-FAULTED LOOP CONFIGURATIONS IN QUENCHED ALUMINIUM AND ALUMINIUM ALLOYS.RONANDER E; KRITZINGER S.1977; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1977; VOL. 39; NO 1; PP. 239-248; ABS. ALLEM.; BIBL. 12 REF.Article

PRISMATIC DISLOCATION LOOP ROTATION AND SELF CLIMB PHENOMENA IN AL-0.13WT. %MGSWART VP; KRITZINGER S.1973; PHILOS. MAG.; G.B.; DA. 1973; VOL. 27; NO 3; PP. 689-695; BIBL. 11 REF.Serial Issue

APPARATUS FOR ANNEALING ELECTRON MICROSCOPE SPECIMENS UNDER CONTROLLED ATMOSPHERES.KRITZINGER S; MONACI T; RONANDER E et al.1975; J. MICR.; G.B.; DA. 1975; VOL. 103; NO 2; PP. 179-185; BIBL. 5 REF.Article

DETERMINATION OF THE DIFFUSING SPECIES AND MECHANISM OF DIFFUSION DURING CRSI2 FORMATION, USING 31SI AS A MARKERBOTHA AP; PRETORIUS R; KRITZINGER S et al.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 40; NO 5; PP. 412-414; BIBL. 18 REF.Article

Facility for rapid preparation of silicon and silicide TEM specimenKRITZINGER, S; CHURMS, C. L.Journal of microscopy (Print). 1984, Vol 135, Num 3, pp 287-294, issn 0022-2720Article

Microtopographical analysis of surface structures in a scanning electron microscope = Analyse microtopographique des structures de surface dans un microscope électronique à balayageKNOESEN, D; KRITZINGER, S.Journal of microscopy (Print). 1983, Vol 132, Num 1, pp 87-96, issn 0022-2720Article

Private Finanzierungsmodelle für Eisenbahninfrastrukturen : Möglichkeiten und Grenzen : NBS Erfurt-Halle/Leipzig als Beispiel = Models for the private financing of the railway infrastructureGATHER, M; KRITZINGER, S.Internationales Verkehrswesen. 1998, Vol 50, Num 9, pp 388-392, issn 0020-9511Article

Instrument-invariant method of film thickness determination by means of substrate-to-film X-ray peak intensity rationing = Méthode indépendante de l'appareillage pour la détermination de l'épaisseur de la couche en utilisant le rapport d'intensité du pic de rayons X de la couche à celle du supportCHURMS, C. L; KRITZINGER, S.Thin solid films. 1987, Vol 148, Num 1, pp 67-74, issn 0040-6090Article

Self-diffusion of silicon in thin films of cobalt, nickel, palladium and platinum silicidesBOTHA, A. P; KRITZINGER, S; PRETORIUS, R et al.Thin solid films. 1986, Vol 141, Num 1, pp 41-51, issn 0040-6090Article

Formation and microstructure of various thin film chromium silicide phasesBEDEKER, C. J; KRITZINGER, S; LOMBAARD, J. C et al.Thin solid films. 1986, Vol 141, Num 1, pp 117-127, issn 0040-6090Article

Solid state interaction between thin chromium films and silicon-a comparison between amorphous and single-crystal silicon = Interaction à l'état solide entre des couches minces de chrome et le silicium. Comparaison entre le silicium amorphe et monocristallinBOTHA, A. P; KRITZINGER, S; PRETORIUS, R et al.Thin solid films. 1983, Vol 105, Num 3, pp 237-249, issn 0040-6090Article

OSSEOINTEGRATED FINGER PROSTHESESDOPPEN, P; SOLOMONS, M; KRITZINGER, S et al.Journal of hand surgery. European volume. 2009, Vol 34, Num 1, pp 29-34, issn 1753-1934, 6 p.Article

The effect of production parameters on the synthesis of the prebiotic trisaccharide, neokestose, by Xanthophyllomyces dendrorhous (Phaffia rhodozyma)KRITZINGER, S. M; KILIAN, S. G; POTGIETER, M. A et al.Enzyme and microbial technology. 2003, Vol 32, Num 6, pp 728-737, issn 0141-0229, 10 p.Article

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