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CONTRIBUTION DE LA NAFTA, N. P. GBELY A LA COMPENSATION DE LA CONSOMMATION DE POINTE DU GAZ NATURELDORDA O; KUBENA J.1972; ZEMNY PLYN NAFTA; CESCHOSL. ; 1972, VOL. 14, NUM. 0004, P. 347 A 359Serial Issue

CONDUITE D'UN FOUR A ARCS A L'AIDE D'UN MODELE DYNAMIQUEKUBENA J; HLINENY J.1973; HUTN. LISTY; CESKOSL.; DA. 1973; VOL. 28; NO 3; PP. 170-176; ABS. RUSSE ALLEM. ANGL. FR.; BIBL. 13 REF.Serial Issue

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X-RAY ROCKING CURVES ON INHOMOGENEOUS SURFACE LAYERS ON SI SINGLE CRYSTALS. I. DIFFUSION LAYERSHOLY V; KUBENA J.1979; CZECHOSL. J. PHYS.; CSK; DA. 1979; VOL. 29; NO 10; PP. 1161-1172; BIBL. 12 REF.Article

RACIONALIZACE A OPTIMALIZACE ENERGETICKEHO REZIMU OBLOUKOVE PECE S VYUZITIM RIDICIHO POCITACE = RATIONALIZATION AND OPTIMIZATION OF ENERGY INPUT AT ELECTRIC ARC FURNACES BY USE OF COMPUTER CONTROLHLINENY J; KUBENA J; BRABNIK J et al.1979; HUTNIK (PRAGUE); CSK; DA. 1979-10; VOL. 29; NO 10; PP. 395-398; BIBL. 4 REF.Article

X-ray double and triple crystal diffractometry of silicon crystals with small defectsHOLY, V; KUBENA, J.Physica status solidi. B. Basic research. 1992, Vol 170, Num 1, pp 9-25, issn 0370-1972Article

On the integrated intensity of X-ray diffraction in crystals with randomly distributed defectsHOLY, V; KUBENA, J.Physica status solidi. B. Basic research. 1989, Vol 151, Num 1, pp 23-28, issn 0370-1972Article

AUTOMATISIERTES STEUERUNGSSYSTEM FUER DIE ELEKTROSTAHLERZEUGUNG = AUTOMATIC CONTROL SYSTEM FOR ELECTRIC STEEL PLANTS = SYSTEME DE COMMANDE AUTOMATIQUE DES ACIERIES ELECTRIQUESBRABNIK J; BUZEK Z; KUBENA J et al.1980; UIE 9. UNION INTERNATIONALE D'ELECTROTHERMIE. CONGRES INTERNATIONAL. 9/1980/CANNES; FRA; PARIS: COMITE FRANCAIS D'ELECTROTHERMIE; DA. 1980; II CC3; 11 P.; ABS. FRE/ENG; BIBL. 16 REF.Conference Paper

Space correlation of microdefects with recombination of excess carriers in CZ-SiKUBENA, J; HLAVKA, J.Physica status solidi. A. Applied research. 1985, Vol 89, Num 1, pp K23-K25, issn 0031-8965Article

X-ray reflection curves of Si crystals with microdefects in the Laue caseHOLY, V; KUBENA, J.Physica status solidi. B. Basic research. 1987, Vol 141, Num 1, pp 35-45, issn 0370-1972Article

Investigation of the growth striations in silicon by X-ray topographyKUBENA, J; HOLY, V.Czechoslovak journal of physics. 1983, Vol 33, Num 12, pp 1315-1322, issn 0011-4626Article

ZKUSENOSTI S MERANIM A VYHODNOCOVANIM AKTIVITY KYSLIKU V OCELARSKE PRAXI = EXPERIENCES IN MEASURING AND ANALYZING OF OXYGEN ACTIVITY DURING STEELMAKING PRACTICEBUZEK Z; HAYER M; KVICALA P et al.1980; HUTNIK (PRAGUE); CSK; DA. 1980-08; VOL. 30; NO 8; PP. 287-295; BIBL. 23 REF.Article

Development of oxide precipitates in silicon : calculation of the distribution function of the classical theory of nucleation by a nodal-points approximationKUBENA, J; KUBENA, A; CAHA, O et al.Journal of physics. Condensed matter (Print). 2007, Vol 19, Num 49, issn 0953-8984, 496202.1-496202.11Article

A study of the nature of dislocation loops in growth striations in silicon by X-ray double crystal topographyGABRIELYAN, K. T; KUBENA, J; HOLY, V et al.Physica status solidi. A. Applied research. 1986, Vol 95, Num 2, pp 579-588, issn 0031-8965Article

Analysis of vacancy and interstitial nucleation kinetics in Si wafers during rapid thermal annealingKUBENA, J; KUBENA, A; CAHA, O et al.Journal of physics. Condensed matter (Print). 2009, Vol 21, Num 10, issn 0953-8984, 103402.1-103402.11Article

X-ray study of defect depth distribution in silicon wafers after heat treatmentHOLY, V; KUBENA, J; BOCHNICEK, Z et al.Journal of applied physics. 1991, Vol 70, Num 7, pp 3537-3541, issn 0021-8979Article

X-ray analysis of structural defects in a semiconductor superlatticeHOLY, V; KUBENA, J; PLOOG, K et al.Physica status solidi. B. Basic research. 1990, Vol 162, Num 2, pp 347-361, issn 0370-1972Article

Plane wave topography on crystals with step-like impurity distributionsALTER, U; HÄRTWIG, J; KUBĚNA, J et al.Czechoslovak journal of physics. 1985, Vol 35, Num 2, pp 158-167, issn 0011-4626Article

X-ray diffractometry of small defects in layered systemsHOLY, V; KUBENA, J; ABRAMOF, E et al.Journal of physics. D, Applied physics (Print). 1993, Vol 26, Num 4A, pp A146-A150, issn 0022-3727Article

X-ray reflection from rough layered systemsHOLY, V; KUBENA, J; OHLIDAL, I et al.Physical review. B, Condensed matter. 1993, Vol 47, Num 23, pp 15896-15903, issn 0163-1829Article

Investigation of quartz crystals with non-homogeneous distributions of impurity atoms by X-ray methodsHARTWIG, J; HOLY, V; KITTNER, R et al.Physica status solidi. A. Applied research. 1988, Vol 105, Num 1, pp 61-75, issn 0031-8965Article

X-ray double and triple crystal diffractometry of mosaic structure in heteroepitaxial layersHOLY, V; KUBENA, J; ABRAMOF, E et al.Journal of applied physics. 1993, Vol 74, Num 3, pp 1736-1743, issn 0021-8979Article