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A study on the kinetic response of the electron work function to wearWEN LI; LI, D. Y.Wear. 2003, Vol 255, Num 1, pp 333-340, issn 0043-1648, 8 p.Conference Paper

Delamination of organic coating on carbon steel studied by scanning Kelvin probe force microscopyTONGYAN PAN.Surface and interface analysis. 2013, Vol 45, Num 6, pp 978-984, issn 0142-2421, 7 p.Article

Electrochemical soft lithography of an 1,7-octadiene monolayer covalently linked to hydrogen-terminated silicon using scanning probe microscopyLEE, S. H; ISHIZAKI, T; SAITO, N et al.Surface science. 2007, Vol 601, Num 18, pp 4206-4211, issn 0039-6028, 6 p.Conference Paper

Effect of surface geometrical configurations induced by microcracks on the electron work functionLI, W; LI, D. Y.Acta materialia. 2005, Vol 53, Num 14, pp 3871-3878, issn 1359-6454, 8 p.Article

Kelvin probe force microscopy for characterizing doped semiconductors for future sensor applications in nano- and biotechnologySCHMIDT, Heidemarie; HABICHT, Stefan; FESTE, Sebastian et al.Applied surface science. 2013, Vol 281, pp 24-29, issn 0169-4332, 6 p.Conference Paper

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Influence of surface morphology on corrosion and electronic behaviorLI, W; LI, D. Y.Acta materialia. 2006, Vol 54, Num 2, pp 445-452, issn 1359-6454, 8 p.Article

A simultaneous Kelvin Probe and Raman spectroscopy approach for in situ surface and interface analysisPOSNER, R; JUB, A. M; FRANKEL, G. S et al.Electrochimica acta. 2012, Vol 76, pp 34-42, issn 0013-4686, 9 p.Article

An SKP and EIS investigation of amine adsorption on zinc oxide surfacesNAZAROV, A; THIERRY, D; VOLOVITCH, P et al.Surface and interface analysis. 2011, Vol 43, Num 10, pp 1286-1298, issn 0142-2421, 13 p.Article

Ion transport processes at polymer/oxide/metal interfaces under varying corrosive conditionsPOSNER, R; GIZA, G; MARAZITA, M et al.Corrosion science. 2010, Vol 52, Num 5, pp 1838-1846, issn 0010-938X, 9 p.Article

Noise and the Kelvin methodBAIKIE, I. D; MACKENZIE, S; ESTRUP, P. J. Z et al.Review of scientific instruments. 1991, Vol 62, Num 5, pp 1326-1332, issn 0034-6748Article

Degradation of organic coatings in a corrosive environment: a study by scanning Kelvin probe and scanning acoustic microscopeREDDY, B; SYKES, J. M.Progress in organic coatings. 2005, Vol 52, Num 4, pp 280-287, issn 0300-9440, 8 p.Conference Paper

Potential profile and photovoltaic effect in nanoscale lateral pn junction observed by Kelvin probe force microscopyNOWAK, Roland; MORARU, Daniel; MIZUNO, Takeshi et al.Thin solid films. 2014, Vol 557, pp 249-253, issn 0040-6090, 5 p.Conference Paper

Simultaneous in situ Kelvin probe and Raman spectroscopy analysis of electrode potentials and molecular structures at polymer covered salt layers on steelPOSNER, R; JUBB, A. M; FRANKEL, G. S et al.Electrochimica acta. 2012, Vol 83, pp 327-334, issn 0013-4686, 8 p.Article

Scanning Kelvin Probe as a highly sensitive tool for detecting hydrogen permeation with high local resolutionSENÖZ, C; EVERS, S; STRATMANN, M et al.Electrochemistry communications. 2011, Vol 13, Num 12, pp 1542-1545, issn 1388-2481, 4 p.Article

SKPFM and SEM study of the deposition mechanism of Zr/Ti based pre-treatment on AA6016 aluminum alloyANDREATTA, F; TURCO, A; DE GRAEVE, I et al.Surface & coatings technology. 2007, Vol 201, Num 18, pp 7668-7685, issn 0257-8972, 18 p.Article

Visualization of human plasma fibrinogen adsorbed on highly oriented pyrolytic graphite by scanning probe microscopyOHTA, Riichiro; SAITO, Nagahiro; ISHIZAKI, Takahiro et al.Surface science. 2006, Vol 600, Num 8, pp 1674-1678, issn 0039-6028, 5 p.Conference Paper

Electronic surface properties of SrTiO₃ derived from a surface photovoltage studyBEYREUTHER, E; BECHERER, J; THIESSEN, A et al.Surface science. 2013, Vol 612, pp 1-9, issn 0039-6028, 9 p.Article

Surface electronic properties of polycrystalline bulk and thin film In₂O₃(ZnO)_k compoundsMITCHELL HOPPER, E; QIMIN ZHU; GASSMANN, Jürgen et al.Applied surface science. 2013, Vol 264, pp 811-815, issn 0169-4332, 5 p.Article

The hydrogen electrode in the dry: A Kelvin probe approach to measuring hydrogen in metalsEVERS, S; ROHWERDER, M.Electrochemistry communications. 2012, Vol 24, pp 85-88, issn 1388-2481, 4 p.Article

Chloride-induced filiform corrosion of organic-coated magnesiumWILLIAMS, Geraint; GRACE, Richard.Electrochimica acta. 2011, Vol 56, Num 4, pp 1894-1903, issn 0013-4686, 10 p.Conference Paper

A work function study of ultra-thin alumina formation on NiAl(110) surfaceWEIJIE SONG; YOSHITAKE, Michiko.Applied surface science. 2005, Vol 251, Num 1-4, pp 14-18, issn 0169-4332, 5 p.Conference Paper

Electronic properties of the organic semiconductor hetero-interface CuPc/C₆₀MOLODTSOVA, O. V; SCHWIEGER, T; KNUPFER, M et al.Applied surface science. 2005, Vol 252, Num 1, pp 143-147, issn 0169-4332, 5 p.Conference Paper

A review of advanced scanning probe microscope analysis of functional films and semiconductor devicesBENSTETTER, Günther; BIBERGER, Roland; DONGPING LIU et al.Thin solid films. 2009, Vol 517, Num 17, pp 5100-5105, issn 0040-6090, 6 p.Conference Paper