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CARACTERISTIQUES D'UNE LENTILLE ELECTROSTATIQUE A TROIS ELEMENTS, IMMERGEEVARAKIN GK.1974; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1974; NO 1; PP. 211-212; BIBL. 3 REF.Article

DESIGN CHARTS OF ELECTROSTATIC THREE-APERTURE LENSES.SHIMIZU K; KAWAKATSU H.1974; J. PHYS., E; G.B.; DA. 1974; VOL. 7; NO 6; PP. 472-476; BIBL. 14 REF.Article

MODELE RECTANGULAIRE POUR LE CALCUL DES PROPRIETES DE FOCALISATION DES LENTILLES ELECTROSTATIQUES BIPLANAIRESAFANAS'EV VP; IVANOVA LP; SADYKIN AD et al.1982; Z. TEH. FIZ.; ISSN 0044-4642; SUN; DA. 1982; VOL. 18; NO 6; PP. 1240-1241; BIBL. 5 REF.Article

ELEMENTS CARDINAUX D'UNE LENTILLE A SYMETRIE AXIALE ET A TROIS ELECTRODESBOBYKIN BV; ZHDANOV VS; ZERNOV AA et al.1976; ZH. TEKH. FIZ.; S.S.S.R.; DA. 1976; VOL. 46; NO 6; PP. 1348-1353; BIBL. 9 REF.Article

CALCUL DES CARACTERISTIQUES DU DOUBLET DE LENTILLES ELECTROSTATIQUES CROISEESGRITSYUK NP.1979; Z. TEH. FIZ.; ISSN 0044-4642; SUN; DA. 1979; VOL. 49; NO 11; PP. 2465-2466; BIBL. 6 REF.Article

AN ANALYTICAL FORMULA OF AXIAL POTENTIAL OF SYMMETRIC EINZEL LENSES WITH THE THICK CENTRAL ELECTRODEYAMAZAKI H.1979; OPTIK; DEU; DA. 1979; VOL. 54; NO 4; PP. 343-346; BIBL. 2 REF.Article

ADVANCES IN MATRIX-LENS TECHNOLOGY.PARKS HG; HUGHES WC.1975; J. VACUUM SCI. TECHNOL.; U.S.A.; DA. 1975; VOL. 12; NO 6; PP. 1161-1164; BIBL. 12 REF.; (SYMP. ELECTRON ION PHOTON BEAM TECHNOL. 13. PROC.; COLORADO SPRINGS; 1975)Conference Paper

REMARQUES SUR LES ABERRATIONS DES LENTILLES ELECTROSTATIQUES UNIPOTENTIELLES ACCELERATRICES.SLODZIAN G; FIGUERAS A.1978; J. PHYS., LETTRES; FR.; DA. 1978; VOL. 39; NO 7; PP. 90-93; ABS. ANGL.; BIBL. 6 REF.Article

ETUDE EXPERIMENTALE D'UNE LENTILLE BIPLANAIRE SYMETRIQUE A UNE SECTION. I. PROPRIETES DE FOCALISATIONAFANAS'EV VP; SADYKIN AD.1982; Z. TEH. FIZ.; ISSN 0044-4642; SUN; DA. 1982; VOL. 18; NO 6; PP. 1213-1215; BIBL. 2 REF.Article

ETUDE EXPERIMENTALE D'UNE LENTILLE BIPLANAIRE SYMETRIQUE A UNE SECTION. II. PROPRIETES D'ABERRATIONAFANAS'EV VP; SADYKIN AD.1982; Z. TEH. FIZ.; ISSN 0044-4642; SUN; DA. 1982; VOL. 18; NO 6; PP. 1226-1228; BIBL. 2 REF.Article

THE DEPENDENCE OF THE ABERRATION CONSTANTS OF AN EINZEL LENS ON THE MAGNIFICATION.YAMAZAKI H.1977; OPTIK; DTSCH.; DA. 1977; VOL. 48; NO 4; PP. 357-370; ABS. ALLEM.; BIBL. 7 REF.Article

ANALYSIS OF ACCELERATING LENS SYSTEM IN FIELD-EMISSION SCANNING ELECTRON MICROSCOPE.KURODA K; SUZUKI T.1974; J. APPL. PHYS.; U.S.A.; DA. 1974; VOL. 45; NO 3; PP. 1436-1441; BIBL. 12 REF.Article

THREE-ANODE ACCELERATING LENS SYSTEM FOR THE FIELD EMISSION SCANNING ELECTRON MICROSCOPE.KURODA K; EBISUI H; SUZUKI T et al.1974; J. APPL. PHYS.; U.S.A.; DA. 1974; VOL. 45; NO 5; PP. 2336-2342; BIBL. 12 REF.Article

A NEW EMISSION LENSLIEBL H.1979; OPTIK; DEU; DA. 1979; VOL. 53; NO 1; PP. 69-72; ABS. GER; BIBL. 7 REF.Article

SYMMETRICAL THREE-TUBE UNIPOTENTIAL LENS. I. DETERMINATION OF POTENTIAL DISTRIBUTION.ANICIN B; TERZIC I; VUKANIC J et al.1976; J. PHYS. E; G.B.; DA. 1976; VOL. 9; NO 10; PP. 837-838; BIBL. 3 REF.Article

SYMMETRICAL THREE-TUBE UNIPOTENTIAL LENS. II: FIRST-ORDER FOCAL PROPERTIES.CIRIC D; TERZIC I; VUKANIC J et al.1976; J. PHYS. E; G.B.; DA. 1976; VOL. 9; NO 10; PP. 839-841; BIBL. 9 REF.Article

THREE-ANODE ACCELERATING LENS SYSTEM FOR FIELD EMISSION SCANNING ELECTRON MICROSCOPY. II.KURODA K; SUZUKI T.1974; APPL. PHYS. LETTERS; U.S.A.; DA. 1974; VOL. 25; NO 1; PP. 23-24; BIBL. 3 REF.Article

ETUDE FONDAMENTALE DES APPLICATIONS DES FAISCEAUX D'IONSSHIMIZU K.1974; RES. ELECTROTECH. LAB.; JAP.; DA. 1974; NO 748; PP. 1-78; ABS. ANGL.; BIBL. DISSEM.Article

CALCUL DES PARAMETRES D'OPTIQUE ELECTRONIQUE D'UNE LENTILLE UNIQUE CROISEE A TROIS ELECTRODESAFANAS'EV VP; YAVOR S YA.1977; ZH. TEKH. FIZ.; S.S.S.R.; DA. 1977; VOL. 47; NO 5; PP. 908-916; BIBL. 2 REF.Article

GENERAL THEORY OF THREE-ELECTRODE LENSES BASED ON THE AXIAL POTENTIAL MODEL PHI (Z/A)=PHI (0) X EXP (K0TAN-1(Z/A)M).KANAYA K; BABA N.1978; J. PHYS. E; G.B.; DA. 1978; VOL. 11; NO 3; PP. 265-275; BIBL. 29 REF.Article

LENTILLES ELECTROSTATIQUES TUBULAIRES ASTIGMATIQUES UNIPOTENTIELLESGLIKMAN LG; ISKAKOVA ZD.1982; Z. TEH. FIZ.; ISSN 0044-4642; SUN; DA. 1982; VOL. 52; NO 9; PP. 1874-1877; BIBL. 7 REF.Article

AN ASYMMETRIC ELECTROSTATIC LENS FOR FIELD-EMISSION MICROPROBE APPLICATIONSORLOFF J; SWANSON LW.1979; J. APPL. PHYS.; USA; DA. 1979; VOL. 50; NO 4; PP. 2494-2501; BIBL. 22 REF.Article

DOUBLET A SIX ELECTRODES COMPOSE DE LENTILLES CROISEES EN REGIME STIGMATIQUEPETROV IA; BARANOVA LA; YAVOR S YA et al.1978; ZH. TEKH. FIZ.; S.S.S.R.; DA. 1978; VOL. 48; NO 2; PP. 408-410; BIBL. 6 REF.Article

A FOURIER-BESSEL SOLUTION OF AN EINZEL-TYPE ELECTROSTATIC FIELD WITH ROTATIONAL SYMMETRYVAN DER MERWE JP.1978; J. APPL. PHYS.; USA; DA. 1978; VOL. 49; NO 8; PP. 4335-4340; BIBL. 14 REF.Article

NUMERICAL CALCULATIONS OF FOCAL AND ABERRATION PROPERTIES OF UNIPOTENTIAL ELECTRON LENSES.SAITO T; SOVERS OJ.1977; J. APPL. PHYS.; U.S.A.; DA. 1977; VOL. 48; NO 6; PP. 2306-2311; BIBL. 9 REF.Article

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