au.\*:("LIFSHIN E")
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X-ray reflectometry analyses of chromium thin filmsMATYI, R. J; HATZISTERGOS, M. S; LIFSHIN, E et al.Thin solid films. 2006, Vol 515, Num 4, pp 1286-1293, issn 0040-6090, 8 p.Article
PARTICLE TRACK, X-RAY, THERMAL, AND MASS SPECTROMETRIC STUDIES OF LUNAR MATERIAL.FLEISCHER RL; HAINES EL; HANNEMAN RE et al.1970; SCIENCE; USA; 1970(1), VOL. 167, NUM. 3918, P. 568 A 571Miscellaneous
Microstructural and compositional analysis of YBa2Cu3O7-δ films grown by MOCVD before and after GCIB smoothingHATZISTERGOS, M. S; EFSTATHIADIS, H; REEVES, J. L et al.Physica. C. Superconductivity. 2004, Vol 405, Num 3-4, pp 179-186, issn 0921-4534, 8 p.Article