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A DIFFUSION MARKER IN AU/SN THIN FILMS = MARQUEUR DE DIFFUSION DANS DES COUCHES MINCES AU/SNGREGERSEN D; BUENE L; FINSTAD T et al.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 78; NO 1; PP. 95-102; BIBL. 15 REF.Article

Kinetics and mechanism of oxide formation on Cr thin films = Cinétique et mécanisme de formation d'un oxyde sur des couches minces de CrSALOMONSEN, G; NORMAN, N; LØNSJØ, O et al.Journal of physics. Condensed matter (Print). 1989, Vol 1, Num 42, pp 7843-7850, issn 0953-8984Article

Interdiffusion and phase formation in Au/Sn thin film couples with special emphasis on substrate temperature during condensation = Interdiffusion et formation de phases dans les couples de couches minces Au/Sn en insistant spécialement sur la température du support pendant la condensationHUGSTED, B; BUENE, L; FINSTAD, T et al.Thin solid films. 1982, Vol 98, Num 2, pp 81-94, issn 0040-6090Article

Electrical and metallurgical investigations of the metallization system: Si/PtSi/V/AlSALOMONSEN, G; OLSEN, A; LØNSJØ, O et al.Journal of applied physics. 1986, Vol 60, Num 5, pp 1753-1757, issn 0021-8979Article

Structural and electrical properties of B- and Ge-implanted SiTURAN, R; HUGSTED, B; LØNSJØ, O. M et al.Journal of applied physics. 1989, Vol 66, Num 3, pp 1155-1158, issn 0021-8979Article

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