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NEEDED: A MIRACLE SLICE FOR VLSI FABRICATIONHEILMEIER GH.1979; I.E.E.E. SPECTRUM; USA; DA. 1979; VOL. 16; NO 3; PP. 45Article

COMPRENDRE LES MICROPROCESSEURS.QUEYSSAC D.1976; MESURES REGUL. AUTOMAT.; FR.; DA. 1976; VOL. 41; NO 9; PP. 29-35Article

NEW AIRBORNE WEATHER RADAR SYSTEMSLUCCHI GA.1982; J. AIRCR.; ISSN 0021-8669; USA; DA. 1982; VOL. 19; NO 3; PP. 239-245; BIBL. 2 REF.Article

IN-CIRCUIT TESTING OF LSI COMPONENTSHUGHES J; BARNETT B.1981; ELECTRON. PACKAG. PROD.; ISSN 0013-4945; USA; DA. 1981; VOL. 21; NO 2; PP. 79-88; 7 P.Article

MANAGEMENT INFORMATION SYSTEMS STRUCTURE TYPES AND INTEGRATIONBARROS O.1981; INFORMATION SYSTEMS; ISSN 0306-4379; GBR; DA. 1981; VOL. 6; NO 4; PP. 243-254; BIBL. 28 REF.Article

GROWTH IN APPLICATION OF CHIP CARRIERSBAUER JA; KOLC RF.1980; ELECTRON. PACKAG. PRODUCT.; USA; DA. 1980; VOL. 20; NO 5; PP. 51-59; H.T. 4Article

IIL GATE ARRAYS MAKE CUSTOM ICS ECONOMICALLY FEASIBLEO'NEIL WD.1979; COMPUTER DESIGN; USA; DA. 1979; VOL. 18; NO 9; PP. 168-174; (4 P.)Article

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LSI-SCHALTKREISE UND IHRE ANWENDUNG IN DISPLAYS = LES CIRCUITS A HAUTE INTEGRATION DANS LES DISPOSITIFS D'AFFICHAGEHORWATH H.1979; NACHR.-TECH., ELEKTRON.; DDR; DA. 1979; VOL. 29; NO 6; PP. 258-261Article

ENGINEERING RELIABILITY MANAGEMENTDHILLON BS.1983; MICROELECTRONICS AND RELIABILITY; ISSN 0026-2714; GBR; DA. 1983; VOL. 23; NO 2; PP. 215-234; BIBL. 103 REF.Article

ULTRA-PRECISION SURFACE GRINDER SUSPENDED BY EXTERNALLY PRESSURIZED AIR BEARINGSKATO S.1982; BULL. JPN. SOC. PRECIS. ENG.; ISSN 0582-4206; JPN; DA. 1982; VOL. 16; NO 1; PP. 51-56; BIBL. 1 REF.Article

A THREE STAGE APPROACH TO LSI BOARD TESTING. IBRADLEY RS.1981; ELECTRON. ENG.; ISSN 0013-4902; GBR; DA. 1981; VOL. 53; NO 651; PP. 83-91; 6 P.Article

THREE LSI CIRCUITS SIMPLIFY DIGITAL-SWITCHING SYSTEMSWURZBURG H; KELLEY S.1980; ELECTRON. DES.; ISSN 0013-4872; USA; DA. 1980; VOL. 28; NO 22; PP. 163-171Article

CLOCK-RATE TESTING OF LSI BOARDS: A "SHOTGUN" APPROACH TO LOCATING POORLY UNDERSTOOD FAILURESSULMAN DL.1979; CIRCUITS MANUF.; USA; DA. 1979; VOL. 19; NO 5; PP. 58-68; (6 P.)Article

AUTOMATIC NETWORK SYNTHESIZER IDENTIFIES STANDARD LSI CELLSIOGAN JR.1979; COMPUTER DESIGN; USA; DA. 1979; VOL. 18; NO 9; PP. 113-121; BIBL. 8 REF.Article

ZUM STAND DER FORSCHUNG BEI MIKROZELLULAREN STRUKTUREN. = L'ETAT ACTUEL DE LA RECHERCHE SUR LES STRUCTURES MICROCELLULAIRESMONJAU D.1977; NACHR.-TECH., ELEKTRON; DTSCH.; DA. 1977; VOL. 27; NO 12; PP. 490-492; ABS. RUSSE ANGL.; BIBL. 8 REF.Article

COST EFFECTIVE TESTING TECHNIQUES FOR LSI COMPONENTS.PURKIS PN.1976; IN: INT. ELECTRON. PACKAG. PROD. CONF. PROC. TECH. PROGRAMME; BRIGHTON, ENGL.; 1976; SURBITON; KIVER COMMUNICATIONS; DA. 1976; PP. 187-194; BIBL. 3 REF.Conference Paper

FORECASTING REJECT RATE OF TESTED LSI CHIPSSETH SC; AGRAWAL VD.1981; ELECTRON DEVICE LETT.; ISSN 0193-8576; USA; DA. 1981; VOL. 2; NO 11; PP. 286-287; BIBL. 4 REF.Article

ABSTRACTS: PRODUCTIVITY IN THE 80'S: ASEE 81 ADVANCED SEMICONDUCTOR EQUIPMENT EXPOSITION 1981 TECHNICAL CONFERENCE, SAN JOSE CA, JANUARY 27-29, 19811981; PRODUCTIVITY IN THE 80'S. ASEE 81. ADVANCED SEMICONDUCTOR EQUIPMENT EXPOSITION. TECHNICAL CONFERENCE/1981-01-27/SAN JOSE CA; USA; SUNNYVALE: CARTLIDGE & ASSOCIATES; DA. 1981; 28 P.; 28 CMConference Proceedings

LARGE-SCALE INTEGRATION LATCHES ONTO THE PHONE SYSTEMHINDIN HJ.1980; ELECTRONICS; USA; DA. 1980; VOL. 53; NO 13; PP. 113-127Article

TECHNIQUES D'INTEGRATION A GRANDE ECHELLE POUR LES TELECOMMUNICATIONSCORNU J.1980; REV. TELECOMMUN.; ISSN 0373-8582; FRA; DA. 1980; VOL. 55; NO 4; PP. 376-381; BIBL. 8 REF.Article

ANWENDUNG VON MIKROPROZESSOREN IN PRUEFEINRICHTUNGEN FUER LSI-SCHALTKREISE = L'EMPLOI DES MICROPROCESSEURS DANS LES SYSTEMES DE CONTROLE DES CIRCUITS LSIKALLAUER L; KERN J; WILDT K et al.1979; NACHR.-TECH., ELEKTRON.; DDR; DA. 1979; VOL. 29; NO 6; PP. 251-253Article

A CONTINUITY CHECK ALGORITHM FOR LSI MASKS.BASS AS; TRICK TN.1977; IN: ANNU. ASILOMAR CONF. CIRCUITS, SYST., COMPUT. 10; PACIFIC GROVE, CALIF.; 1976; NORTH HOLLYWOOD, CALIF.; WESTERN PERIODICALS; DA. 1977; PP. 289-292Conference Paper

Perspectives d'utilisation des modèles électriques des éléments à faibles dimensions pour le calcul schémotechnique des grands circuits intégrés bipolairesPETROSYANTS, K. O.Mikroèlektronika (Moskva). 1983, Vol 12, Num 5, pp 440-451, issn 0544-1269Article