Caoineadh os Cionn Coirp : The lament for the dead in IrelandLYSAGHT, P.Folklore (London). 1997, Vol 108, pp 65-82, issn 0015-587XArticle

Perspectives on narrative communication and gender : Lady Augusta Gregory's Visions and Beliefs in the West of Ireland (1920)LYSAGHT, P.Fabula. 1998, Vol 39, Num 3-4, pp 256-276, issn 0014-6242Article

Self controlling dynamic reconfiguration : A case studyMCGREGOR, G; LYSAGHT, P.Lecture notes in computer science. 1999, pp 144-154, issn 0302-9743, isbn 3-540-66457-2Conference Paper

Alternative approach to ASIC design methodology based on reconfigurable logic devicesDUNLOP, J; GIRMA, D; LYSAGHT, P et al.IEE proceedings. Part G. Circuits devices and systems. 1992, Vol 139, Num 2, pp 217-221, issn 0956-3768Article

Modular dynamic reconfiguration in Virtex FPGAsSEDCOLE, P; BLODGET, B; BECKER, T et al.IEE proceedings. Computers and digital techniques. 2006, Vol 153, Num 3, pp 157-164, issn 1350-2387, 8 p.Conference Paper

Properties of the interfacial layer in the high-k gate stack and transistor performanceBERSUKER, G; PETERSON, J; BAMETT, J et al.Proceedings - Electrochemical Society. 2005, pp 141-145, issn 0161-6374, isbn 1-56677-463-2, 5 p.Conference Paper

New CAD framework extends simulation of dynamically reconfigurable logicROBINSON, D; MGREGOR, G; LYSAGHT, P et al.Lecture notes in computer science. 1998, pp 1-8, issn 0302-9743, isbn 3-540-64948-4Conference Paper

Towards an expert system for a priori estimation of reconfiguration latency in dynamically reconfigurable logicLYSAGHT, P.Lecture notes in computer science. 1997, pp 183-192, issn 0302-9743, isbn 3-540-63465-7Conference Paper

Spectroscopic studies of O-vacancy defects in transition metal oxidesLUCOVSKY, G; LÜNING, J; FLEMING, L. B et al.Journal of materials science. Materials in electronics. 2007, Vol 18, issn 0957-4522, S263-S266, SUP1Conference Paper

Charges in HFO₂ ALD gate dielectricsBERSUKER, G; ZEITZOFF, P. M; HUFF, H. R et al.Proceedings - Electrochemical Society. 2003, pp 417-422, issn 0161-6374, isbn 1-56677-396-2, 6 p.Conference Paper

Verification of dynamically reconfigurable logicROBINSON, D; LYSAGHT, P.Lecture notes in computer science. 2000, pp 141-150, issn 0302-9743, isbn 3-540-67899-9Conference Paper

Extending Dynamic Circuit Switching to meet the challenges of new FPGA architecturesGREGOR, G. M. C; LYSAGHT, P.Lecture notes in computer science. 1997, pp 31-40, issn 0302-9743, isbn 3-540-63465-7Conference Paper

Advanced high-k/metal gate stack progress and challenges - a materials and process integration perspectivePARK, C. S; LYSAGHT, P; HUSSAIN, M. M et al.International journal of materials research. 2010, Vol 101, Num 2, pp 155-163, issn 1862-5282, 9 p.Article

Studies of bonding defects, and defect state suppression in HfO₂ by soft X-ray absorption and photoelectron spectroscopiesLUCOVSKY, G; SEO, H; FLEMING, L. B et al.Surface science. 2007, Vol 601, Num 18, pp 4236-4241, issn 0039-6028, 6 p.Conference Paper

The Pseudomonas aeruginosa quorum-sensing molecule N-3-(oxododecanoyl)-1-homoserine lactone inhibits T-cell differentiation and cytokine production by a mechanism involving an early step in T-cell activationRITCHIE, A. J; JANSSON, A; STALLBERG, J et al.Infection and immunity. 2005, Vol 73, Num 3, pp 1648-1655, issn 0019-9567, 8 p.Article

Modelling and synthesis of configuration controllers for dynamically reconfigurable logic systems using the DCS CAD frameworkROBINSON, D; LYSAGHT, P.Lecture notes in computer science. 1999, pp 41-50, issn 0302-9743, isbn 3-540-66457-2Conference Paper

Fast adaptive image processing in FPGAs using stack filtersWOOLFRIES, N; LYSAGHT, P; MARSHALL, S et al.Lecture notes in computer science. 1998, pp 406-410, issn 0302-9743, isbn 3-540-64948-4Conference Paper

Observation of interfacial electrostatic field-induced changes in the silicon dielectric function using spectroscopic ellipsometryPRICE, J; LYSAGHT, P. S; SONG, S. C et al.Physica status solidi. A, Applications and materials science (Print). 2008, Vol 205, Num 4, pp 918-921, issn 1862-6300, 4 p.Conference Paper

Clean solutions to the incoming wafer quality impact on lithography process yield limits in a dynamic copper / Low-k research and development environmentLYSAGHT, P. S; YBARRA, I; SAX, H et al.SPIE proceedings series. 2000, pp 284-293, isbn 0-8194-3616-XConference Paper

Experimental observations of the thermal stability of high-k gate dielectric materials on siliconLYSAGHT, P. S; CHEN, P. J; BERGMANN, R et al.Journal of non-crystalline solids. 2002, Vol 303, Num 1, pp 54-63, issn 0022-3093Conference Paper