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INTERPRETATION OF SURFACE ELECTRICAL MEASUREMENTS ON CONDUCTIVE BASE PAPERS: A DISTRIBUTED RESISTANCE MODELHOWLETT W; LANDHEER D.1980; TAPPI, TECH. ASSOC. PULP PAP. IND.; ISSN 0039-8241; USA; DA. 1980; VOL. 63; NO 10; PP. 95-97Article

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FUNDAMENTAL ASPECTS AND TECHNOLOGICAL IMPLICATIONS OF THE SOLUBILITY CONCEPT FOR THE PREDICTION OF RUNNING PROPERTIESLANDHEER D; DACKUS AJG; KLOSTERMANN JA et al.1980; WEAR; CHE; DA. 1980-08-01; VOL. 62; NO 2; PP. 255-286; BIBL. 20 REF.Conference Paper

ELASTIC CONSTANTS OF KRYPTON SINGLE CRYSTALS DETERMINED BY BRILLOUIN SCATTERING.LANDHEER D; JACKSON HE; MCLAREN RA et al.1976; PHYS. REV., B; U.S.A.; DA. 1976; VOL. 13; NO 2; PP. 888-895; BIBL. 32 REF.Article

Role of carrier equilibrium in self-consistent calculations for double barrier resonant diodesLANDHEER, D; AERS, G. C.Superlattices and microstructures. 1990, Vol 7, Num 1, pp 17-21, issn 0749-6036Article

Switching times of double-barrier diodesLIU, H. C; LANDHEER, D.Superlattices and microstructures. 1988, Vol 4, Num 6, pp 701-704, issn 0749-6036Article

ELASTIC CONSTANTS OF NEON SINGLE CRYSTALS DETERMINED BY BRILLOUIN SCATTERING.MCLAREN RA; KIEFTE H; LANDHEER D et al.1975; PHYS. REV., B; U.S.A.; DA. 1975; VOL. 11; NO 4; PP. 1705-1717; BIBL. 52 REF.Article

Extremely low resistivity erbium ohmic contacts to n-type siliconJANEGA, P. L; MCCAFFREY, J; LANDHEER, D et al.Applied physics letters. 1989, Vol 55, Num 14, pp 1415-1417, issn 0003-6951, 3 p.Article

Secondary ion mass spectrometry and Auger study of lithium niobate processing for integrated opticsLANDHEER, D; MITCHELL, D. F; SPROULE, G. I et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1986, Vol 4, Num 4, pp 1897-1900, issn 0734-2101Article

Effective mass in the barriers of GaAs/AlAs resonant tunneling double barrier diodesLANDHEER, D; AERS, G. C; WASILEWSKI, Z. R et al.Superlattices and microstructures. 1992, Vol 11, Num 1, pp 55-59, issn 0749-6036Article

Modeling of titanium diffusion into LiNbO₃ using a depth-dependent diffusion coefficientFONTAINE, M; DELAGE, A; LANDHEER, D et al.Journal of applied physics. 1986, Vol 60, Num 7, pp 2343-2350, issn 0021-8979Article

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