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High resolution electron microscopic observation of crystallization and decomposition of amorphous selenium filmsSHIOJIRI, M; HIROTA, Y; ISSIKI, T et al.Journal of electron microscopy. 1989, Vol 38, Num 5, pp 332-339, issn 0022-0744, 8 p.Article

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On the non-stoichiometric ytterbium sulphide phase Yb₃S₄OTERO DIAZ, C; HYDE, B. G.Acta crystallographica. Section B, Structural crystallography and crystal chemistry. 1983, Vol 39, Num 5, pp 569-575, issn 0567-7408Article

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Geometric structures of grain boundaries expected from the O-lattice theory compared with high-resolution transmission electron microscope imagesTSUREKAWA, S; MORITA, K; NAKASHIMA, H et al.Materials transactions - JIM. 1997, Vol 38, Num 5, pp 393-400, issn 0916-1821Article

The reconstruction of the Si(113) surface studied by scanning tunneling microscopeARABCZYK, W; HINRICH, S; MÜSSIG, H.-J et al.Vacuum. 1995, Vol 46, Num 5-6, pp 473-476, issn 0042-207XConference Paper

Direct imaging of paracrystalline phospholipid structure in the electron microscopeFRYER, J. R; DORSET, D. L.Journal of microscopy (Print). 1987, Vol 145, Num 1, pp 61-68, issn 0022-2720Article

Lattice and atomic structure imaging of semiconductors by high resolution transmission electron microscopyOURMAZD, A; AHLBORN, K; IBEH, K et al.Applied physics letters. 1985, Vol 47, Num 7, pp 685-688, issn 0003-6951Article

Review of the principal contrast effects observed at interphase boundaries using transmission electron microscopyPOND, R. C.Journal of microscopy (Print). 1984, Vol 135, Num 3, pp 213-240, issn 0022-2720Article