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A new approach to determine the mean thickness and refractive index of polyelectrolyte multilayer using optical reflectometryBURON, C. C; MEMBREY, F; FILIATRE, C et al.Colloids and surfaces. A, Physicochemical and engineering aspects. 2006, Vol 289, Num 1-3, pp 163-171, issn 0927-7757, 9 p.Article

Limitations of Current Formulations when Decreasing the Coating Layer Thickness of Papers for Inkjet PrintingLAMMINMÄKI, Taina; KETTLE, John; RAUTKOSKI, Hille et al.Industrial & engineering chemistry research. 2011, Vol 50, Num 12, pp 7251-7263, issn 0888-5885, 13 p.Article

Particle Layer Thickness Effect on Particle Entrainment in a Mechanically Agitated BathTAKAHASHI, Yusuke; IGUCHI, Manabu.ISIJ international. 2008, Vol 48, Num 6, pp 875-877, issn 0915-1559, 3 p.Article

Quality Estimation of Thick-film Resistor Terminations Based on Electrical Parameters ExtractionKIEŁBASINSKI, Konrad; JAKUBOWSKA, Małgorzata; KALENIK, Jerzy et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 6937, pp 69371T.1-69371T.6, issn 0277-786X, isbn 978-0-8194-7124-6 0-8194-7124-0, 2Conference Paper

Mass transfer in the membrane phase contactor with an enzyme gel layer immobilized on a membraneTRUSEK-HOLOWNIA, A; NOWORYTA, A.Desalination (Amsterdam). 2004, Vol 162, Num 1-3, pp 335-342, issn 0011-9164, 8 p.Conference Paper

Linear and nonlinear optical properties of Ge-As-S filmsTOLMACHOV, I. D; STRONSKI, A. V.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7138, pp 71381X.1-71381X.6, issn 0277-786X, isbn 978-0-8194-7379-0 0-8194-7379-0, 1VolConference Paper

Determination of the critical product layer thickness in the reaction of CaO with CO2ALVAREZ, Diego; ABANADES, J. Carlos.Industrial & engineering chemistry research. 2005, Vol 44, Num 15, pp 5608-5615, issn 0888-5885, 8 p.Article

On the meaning of the diffusion layer thickness for slow electrode reactionsMOLINA, A; GONZALEZ, J; LABORDA, E et al.PCCP. Physical chemistry chemical physics (Print). 2013, Vol 15, Num 7, pp 2381-2388, issn 1463-9076, 8 p.Article

Influence of baffle on improving the thickness uniformity of thin film deposited by magnetron sputtering systemHE YU; YADONG JIANG; TAO WANG et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7658, issn 0277-786X, isbn 978-0-8194-8088-0, 76581N.1-76581N.5, 2Conference Paper

Laser microsintering of tungsten in vacuumEBERT, Robby; ULLMANN, Frank; HARTWIG, Lars et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7589, issn 0277-786X, isbn 978-0-8194-7985-3, 75891G.1-75891G.12Conference Paper

Bildanalytische Schichtdickenbestimmung an Al-Diffusionsbeschichtungen = The determination of Al-diffusion layer thickness by image processingBERGHOF-HASSELBÄCHER, E; ROHR, V; NICOLAS, E et al.Praktische Metallographie. 2006, Vol 43, Num 3, pp 127-142, issn 0032-678X, 16 p.Article

Effect of the Ferromagnetic Layer Thickness on the Blocking Temperature in IrMn/CoFe Exchange CouplesVALLEJO-FERNANDEZ, G; KAESWURM, B; FERNANDEZ-OUTON, L. E et al.IEEE transactions on magnetics. 2008, Vol 44, Num 11, pp 2835-2838, issn 0018-9464, 4 p., 1Conference Paper

Effect of material parameters on the open-circuit voltage in a GaInAsSb thermophotovoltaic cellXINCUN PENG; XIN GUO; BAOLIN ZHANG et al.Infrared physics & technology. 2010, Vol 53, Num 1, pp 37-42, issn 1350-4495, 6 p.Article

Applications of terahertz pulsed technology in the pharmaceutical industryTADAY, Philip F.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7601, issn 0277-786X, isbn 0-8194-7997-7 978-0-8194-7997-6, 1Vol, 760102.1-760102.6Conference Paper

Design of transmission linear partial polarizers using a negative film-substrate systemZAGHLOUL, A. R. M; BERZETT, W. A; KEELING, D. A et al.SPIE proceedings series. 2005, pp 58700N.1-58700N.12, isbn 0-8194-5875-9, 1VolConference Paper

A new method for identifying osmotically limited and gel layer controlled pressure independent flux in ultrafiltrationZAIDI, S. K; KARODE, S. K; KIRPALANI, D et al.Canadian journal of chemical engineering. 2004, Vol 82, Num 2, pp 343-348, issn 0008-4034, 6 p.Article

Second harmonic generation from alternate-layer LB films : quadratic enhancement with film thicknessASHWELL, G. J; JACKSON, P. D; LOCHUN, D et al.Proceedings - Royal Society. Mathematical and physical sciences. 1994, Vol 445, Num 1924, pp 385-398, issn 0962-8444Article

Analysis of film thickness for magnetron sputtering system with more than one workbenchWANG TAO; YU HE; WU ZHIMING et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7506, issn 0277-786X, isbn 978-0-8194-7892-4 0-8194-7892-X, 75062B.1-75062B.9, 2Conference Paper

Characteristics of nanostructure and electrical properties of Ti thin films as a function of substrate temperature and film thicknessSAVALONI, H; KHOJIER, K; ALAEE, M. S et al.Journal of materials science. 2007, Vol 42, Num 8, pp 2603-2611, issn 0022-2461, 9 p.Article

Development of nanowell based sensors for the detection of improvised explosive devicesZIENTEK, B; WANG, H. H; INDACOCHEA, J. E et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7647, issn 0277-786X, isbn 978-0-8194-8062-0 0-8194-8062-2, 76472Z.1-76472Z.8, 2Conference Paper

Design and manufacture of broadband high-reflective filmJING ZHANG; XIUHUA FU.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 6722, pp 672235.1-672235.4, issn 0277-786X, isbn 978-0-8194-6879-6 0-8194-6879-7, 2Conference Paper

Silicon detector dead layer thickness estimates using proton bremsstrahlung from low atomic number targetsCOHEN, David D; STELCER, Eduard; SIEGELE, Rainer et al.X-ray spectrometry. 2008, Vol 37, Num 2, pp 125-128, issn 0049-8246, 4 p.Conference Paper

Hydrodynamic response of adsorbed polymers. DiscussionWU, D. T; CATES, M. E; VAN DE VEN, T et al.Colloids and surfaces. A, Physicochemical and engineering aspects. 1994, Vol 86, pp 275-281, issn 0927-7757Conference Paper

The effect of film thickness variations in periodic cracking: Analysis and experimentsTAYLOR, A. A; EDLMAYR, V; CORDILL, Mj et al.Surface & coatings technology. 2011, Vol 206, Num 7, pp 1830-1836, issn 0257-8972, 7 p.Conference Paper

Designs of Masks in Thickness UniformityJAING, Cheng-Chung.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7655, issn 0277-786X, isbn 978-0-8194-8085-9, 76551Q.1-76551Q.8, 2Conference Paper

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