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Optical measurement systems for industrial inspection VI (15-18 June 2009, Munich, Germany)Lehmann, Peter H.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 2 vol, 2, isbn 978-0-8194-7672-2 0-8194-7672-2Conference Proceedings

Optical measurement systems for industrial inspection VII (23-26 May 2011, Munich, Germany)Lehmann, Peter H; Osten, Wolfgang; Gastinger, Kay et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 2 vol, 2, isbn 978-0-8194-8678-3Conference Proceedings

Parallel Optical Coherence Tomography (pOCT) for industrial 3D inspectionLAMBELET, Patrick.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 80820X.1-80820X.12, 2Conference Paper

Development of 3D Control of a Tiny Dew Droplet by Scattered Laser LightMATSUMOTO, Shigeaki.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73892W.1-73892W.10, 2Conference Paper

Makyoh-topography studies of the morphology of periodic and quasi-periodic surfacesRIESZ, Ferenc.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73892M.1-73892M.8, 2Conference Paper

New metrology approach for the production of aspheric lensesBEUTLER, Andreas.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 738918.1-738918.6, 2Conference Paper

Coherence effects in Makyoh topographyRIESZ, Ferenc.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 80822I.1-80822I.8, 2Conference Paper

Calibration method for accurate optical measurement of thickness profile for paper industryGRAEFFE, Jussi.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 738920.1-738920.9, 2Conference Paper

3D-profilometry on aspheric and freeform lensesBEUTLER, A.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 80821J.1-80821J.6, 2Conference Paper

Measurement of Five-Degrees-of-Freedom Error Motions for a Micro High-Speed Spindle Using an Optical TechniqueMURAKAMI, Hiroshi.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 80822X.1-80822X.8, 2Conference Paper

Measurement of Surface Resistivity/Conductivity of Carbon Steel in 5-20ppm of KGR-134 Inhibited Seawater by Holographic Interferometry TechniquesHABIB, K.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 80822A.1-80822A.14, 2Conference Paper

3D Measuring in the Field of EndoscopySCHICK, Anton; FORSTER, Frank; STOCKMANN, Michael et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 808216.1-808216.12, 2Conference Paper

Interferometric multiwavelength system for long gauge blocks measurementsWENGIEROW, Michal; SALBUT, Leszek; RAMOTOWSKI, Zbigniew et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 80822R.1-80822R.8, 2Conference Paper

Optimal phase retrieval from multiple observations with Gaussian noise: augmented Lagrangian algorithm for phase objectsMIGUKIN, Artem; KATKOVNIK, Vladimir; ASTOLA, Jaakko et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 80820L.1-80820L.11, 2Conference Paper

Reflectometry for TSV Etching Depth InspectionHSU, Wei-Te; KU, Yi-Sha.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 808226.1-808226.7, 2Conference Paper

Simultaneous out-of-plane and in-plane displacements measurement by using digital holography around a hole or indentationVIOTTI, MatiasR; KOHLER, Christian; ALBERTAZZI, Armando et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 80820E.1-80820E.9, 2Conference Paper

Some aspects of error influences in interferometric measurements of optical surface formsSCHULZ, M; WIEGMANN, A.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 80821C.1-80821C.8, 2Conference Paper

Spectral polarimetry-based measurement of the thickness of a thin filmHLUBINA, P; LUNACEK, J; CIPRIAN, D et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 80822T.1-80822T.8, 2Conference Paper

Zero-order elimination in digital holography by using of two holograms: one is made by tilting the CCDABOLHASSANI, Mohammad; ROSTAMI, Yadollah.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 80822H.1-80822H.6, 2Conference Paper

Multiple object image segmentation algorithm based on wavelet theoryWANG, W; WANG, Z.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73892R.1-73892R.9, 2Conference Paper

Photo-Thermal Measurement of Absorptance Losses, Temperature induced Wavefront Deformation and Compaction in DUV-OpticsSCHÄFER, Bernd; FLÖTER, Bernhard; MANN, Klaus et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73891D.1-73891D.10, 2Conference Paper

Polarized optical scattering measurements of metallic nanoparticles upon a silicon waferLIU, Cheng-Yang; FU, Wei-En.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73892C.1-73892C.8, 2Conference Paper

Pseudo-periodic patterns for subpixel accuracy visual control: principle, pattern designs and performancesGALEANO ZEA, July A; SANDOZ, Patrick.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73891N.1-73891N.8, 2Conference Paper

Real-time defect detection in transparent multi-layer polymer films using structured illumination and 1D filteringMICHAELI, Walter; BERDEL, Klaus; OSTERBRINK, Oliver et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7389, issn 0277-786X, isbn 978-0-8194-7672-2 0-8194-7672-2, 73891T.1-73891T.9, 2Conference Paper

Calibration routine for in-process roundness measurements of steel rings during heat treatmentGAFSI, H; GOCH, G.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 808231.1-808231.6, 2Conference Paper

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