Apodization for maximum central irradiance and specified large Rayleigh limit of resolution. IIKIBE, J. N; WILKINS, J. E. JR.Journal of the Optical Society of America A, Optics and image science. 1984, Vol 1, Num 4, pp 337-343Article

Linking Crystallographic Model and Data QualityKARPLUS, P. Andrew; DIEDERICHS, Kay.Science (Washington, D.C.). 2012, Vol 336, Num 6084, pp 1030-1033, issn 0036-8075, 4 p.Article

Caractérisation des topoclimats par télédétection dans l'infrarouge thermique = Topoclimats characterization by means of thermal infrared remote sensingLAGOUARDE, J. P.Les Colloques de l'I.N.R.A. 1985, Num 32, pp 155-160, issn 0293-1915Article

Reflection X-ray microscopyFRANKS, A; STEDMAN, M.Journal of microscopy (Print). 1985, Vol 138, Num 3, pp 237-244, issn 0022-2720Article

Scanning X-ray radiography with an improved detection schemeMOUZE, D; CAZAUX, J; THOMAS, X et al.Ultramicroscopy. 1985, Vol 17, Num 3, pp 269-272, issn 0304-3991Article

Optical stethoscopy: image recording with resolution λ/20POHL, D. W; DENK, W; LANZ, M et al.Applied physics letters. 1984, Vol 44, Num 7, pp 651-653, issn 0003-6951Article

The second stability region of the quadrupole mass filter. II: Experimental resultsDAWSON, P. H; YU BINGQI.International journal of mass spectrometry and ion processes. 1984, Vol 56, Num 1, pp 41-50Article

Iterative and function-continuation Fourier deconvolution methods for enhancing mass spectrometer resolutionLOUP, J. W; LOUP, G. E; RAYBORN, G. H. JR et al.International journal of mass spectrometry and ion processes. 1983, Vol 55, Num 1, pp 93-109Article

An improvement in standard photolithography resolution based on Kirchhoff diffraction studiesMAALOUF, Azar; GADONNA, Michel; BOSC, Dominique et al.Journal of physics. D, Applied physics (Print). 2009, Vol 42, Num 1, issn 0022-3727, 015106.1-015106.11Article

Estimation de paramètres à l'aide d'une antenne. Limites de précision = Estimation of parameters using an array of sensors. Precision limitsDEBART, H.T.S. Traitement du signal. 1985, Vol 2, Num 2, pp 121-128Article

Ultimate resolution and information in electron microscopy. II: The information limit of transmission electron microscopesDE JONG, A. F; VAN DYCK, D.Ultramicroscopy. 1993, Vol 49, Num 1-4, pp 66-80, issn 0304-3991Article

Doubling spectral resolutionWYNNE, C. G.Monthly Notices of the Royal Astronomical Society. 1991, Vol 250, Num 4, pp 796-801, issn 0035-8711, 6 p.Article

Immersed gratings and associated phenomena. IWYNNE, C. G.Optics communications. 1989, Vol 73, Num 6, pp 419-421, issn 0030-4018Article

Electron biprism interference fringes of 0.08 nm spacing for high resolution electron holographyLICHTE, H.Optik (Stuttgart). 1985, Vol 70, Num 4, pp 176-177, issn 0030-4026Article

Le satellite français S.P.O.T. ouvre de nouveaux horizons et offre de nouvelles applications pour l'agriculture = The French satellite SPOT opens new horizons and proposes new applications for agriculture1984, Num 243, pp 72-73Article

On the resolution of Dicke-type radiometersTHOMSEN, F.IEEE transactions on microwave theory and techniques. 1984, Vol 32, Num 2, pp 145-150, issn 0018-9480Article

A small, battery-operated fluoroscopic system: lixiscope with x-ray generator = Ein kleines, batteriebetriebenes Fluoroskopsystem: Lixiscope mit RoentgengeneratorYIN, L.I; TROMBKA, J.I; RUITBERG, A.P et al.Materials evaluation. 1983, Vol 41, Num 7, pp 844-848, issn 0025-5327Article

Resolving power of zone platesKEARNEY, P. D; KLEIN, A. G.Journal of modern optics (Print). 1989, Vol 36, Num 3, pp 361-367, issn 0950-0340Article

Examen et discussion des besoins en télédétection dans le domaine agronomique = Remote sensing requirements examination and discussion in agronomyHALLAIRE, M; ITIER, B.Les Colloques de l'I.N.R.A. 1985, Num 32, pp 237-246, issn 0293-1915Article

Resolution of data display tubesBARTEN, B. G. J.Proceedings of the society for information display. 1984, Vol 25, Num 1, pp 35-42, issn 0734-1768Article

Scanning optical fluorescence microscopyCOX, I. J.Journal of microscopy (Print). 1984, Vol 133, Num 2, pp 149-154, issn 0022-2720Article

Factors related to low contrast resolution in CT scannersGOODENOUGH, D. J; WEAVER, K. E.Computerized radiology. 1984, Vol 8, Num 5, pp 297-308, issn 0730-4862Article

Design of compact integral field spectrometers for mid-to high-resolving powers using immersed gratingsWELLS, Martyn; EVANS, Christopher J; HASTINGS, Peter R et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7014, pp 701422.1-701422.8, issn 0277-786X, isbn 0-8194-7224-7 978-0-8194-7224-3, 4Vol, 4Conference Paper

Résolution tridimensionnelle et précision de l'interférométrie des objets microscopiques de phaseKLIMKIN, V. F; LOMAKIN, G. S.Prikladnaâ mehanika i tehničeskaâ fizika. 1985, Num 2, pp 40-45, issn 0869-5032Article

Nonreciprocal laser-microchemical processing: spatial resolution limits and demonstration of 0.2-μm linewidthsEHRLICH, D. J; TSAO, J. Y.Applied physics letters. 1984, Vol 44, Num 2, pp 267-269, issn 0003-6951Article