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Results 1 to 25 of 9297

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Effects of spatial, temporal and spatiotemporal cueing are alike when attention is directed voluntarilyOLK, Bettina.Experimental brain research. 2014, Vol 232, Num 11, pp 3623-3633, issn 0014-4819, 11 p.Article

Analysis of instability line width and white wall created by the photolithography processKUO, Yang-Kuao; CHAO, Chuen-Guang; LIN, Chi-Yuan et al.Microelectronics journal. 2004, Vol 35, Num 11, pp 915-922, issn 0959-8324, 8 p.Article

Maxbeam2 : a new method of identifying salient BeamletsEDWARDS, Jonathan; NICHOLSON, Jim; O'KEEFE, Simon et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 591426.1-591426.9, issn 0277-786X, isbn 0-8194-5919-4, 1VolConference Paper

High resolution, high sensitivity inorganic resistsSTOWERS, Jason; KESZLER, Douglas A.Microelectronic engineering. 2009, Vol 86, Num 4-6, pp 730-733, issn 0167-9317, 4 p.Conference Paper

Coherent beam combination of narrow-linewidth 1.5 μm fiber amplifiers in a long-pulse regimeLOMBARD, L; AZARIAN, A; CADORET, K et al.Optics letters. 2011, Vol 36, Num 4, pp 523-525, issn 0146-9592, 3 p.Article

Compositional dependence of Raman-active mode frequencies and line widths in TlInS2xSe2(1-x) mixed crystalsGULER, I; GASANLY, N. M.Applied surface science. 2014, Vol 318, pp 113-115, issn 0169-4332, 3 p.Conference Paper

A new method to determine the energy range for the FOCAL techniqueDONGQING ZHANG; XIANGZHAO WANG; WEIJIE SHI et al.SPIE proceedings series. 2005, pp 180-187, isbn 0-8194-5600-4, 8 p.Conference Paper

Integration errors in chromatographic analysis, Part II: Large peak size ratiosBICKING, Merlin K. L.LC GC North America. 2006, Vol 24, Num 6, issn 1527-5949, 546,604-616 [14 p.]Article

Applications of optical feedback self-mixing interferometryYANGUANG YU; HUIYING YE; JIANGTAO XI et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, issn 0277-786X, isbn 0-8194-6058-3, 2Vol, Part 2, 60274M.1-60274M.6Conference Paper

Studies of multipactor threshold in square coaxial linesWU CHUNBANG; SUN QINFEN; LUO YAOHUI et al.ISAPE 2000 : international symposium on antennas, propagation and EM theory. 2000, pp 422-425, isbn 0-7803-6377-9Conference Paper

Characterization of inhomogeneous samples by spectroscopic Mueller polarimetryFOLDYNA, M; DE MARTINO, A; OSSIKOVSKI, R et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7140, issn 0277-786X, isbn 978-0-8194-7381-3 0-8194-7381-2, 71400J.1-71400J.9, 2Conference Paper

The Causes of Horizontal-Vertical (H-V) Bias in Optical Lithography : Dipole Source ErrorsBIAFORE, John J; MACK, Chris A; ROBERTSON, Stewart A et al.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 65203V.1-65203V.18, issn 0277-786X, isbn 978-0-8194-6639-6Conference Paper

Impact of line width roughness on device performanceLORUSSO, G. F; LEUNISSEN, L. H. A; GUSTIN, C et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, issn 0277-786X, isbn 0-8194-6195-4, 2Vol, vol 1, 61520W.1-61520W.7Conference Paper

Proposal for determining exposure latitude requirementsLEVINSON, Harry J; YUANSHENG MA; KOENIG, Marcel et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 69241J.1-69241J.10, issn 0277-786X, isbn 978-0-8194-7109-3Conference Paper

EPR study of V2O5-P2O5-Li2O glass systemARDELEAN, I; COZAR, O; VEDEANU, N et al.Journal of materials science. Materials in electronics. 2007, Vol 18, Num 9, pp 963-966, issn 0957-4522, 4 p.Article

Ultra-high-Q (>100-million) micro-cavities for stimulated and parametric lasers sourcesVAHALA, K; KIPPENBERA, T; ARMANI, D et al.Lasers and Electro-optics Society. 2004, isbn 0-7803-8557-8, 2Vol, Vol1, 198-199Conference Paper

Spectral fitting: The extraction of crucial information from a spectrum and a spectral imageMAILER, Colin; ROBINSON, Bruce H; WILLIAMS, Benjamin B et al.Magnetic resonance in medicine. 2003, Vol 49, Num 6, pp 1175-1180, issn 0740-3194, 6 p.Article

Semiconductor laser linewidthHENNING, I. D; ADAMS, M. J.British Telecom technology journal. 1985, Vol 3, Num 3, pp 19-24, issn 0265-0193Article

Study on the Spectral Narrowing Technology of Optically Pumped XeF(C-A) LaserYU LI; ZHU FENG; SHEN, Yan-Long et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7751, issn 0277-786X, isbn 978-0-8194-8242-6, 77510R.1-77510R.6Conference Paper

Terahertz reflection spectroscopy for explosives detectionFITCH, Michael J; DODSON, Caroline; YUNQING CHEN et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 281-288, issn 0277-786X, isbn 0-8194-5775-2, 1Vol, 8 p.Conference Paper

Natural linewidth of semiconductor lasersARNAUD, J.IEE proceedings. Part J. Optoelectronics. 1987, Vol 134, Num 1, pp 2-6, issn 0267-3932Article

Spectral linewidth of external cavity semiconductor lasers with strong, frequency-selective feedbackWYATT, R.Electronics Letters. 1985, Vol 21, Num 15, pp 658-659, issn 0013-5194Article

Dispersion of the linewidth enhancement factor in semiconductor injection lasersOGASAWARA, N; ITO, R; TONE, K et al.Japanese journal of applied physics. 1984, Vol 23, Num 7, pp L518-L520, issn 0021-4922Article

Linewidth stabilization of semiconductor lasers in an external cavityNIELSEN, C. J; OSMUNDSEN, J. H.Journal of optical communications. 1984, Vol 5, Num 2, pp 42-45, issn 0173-4911Article

Reduction of dynamic linewidth in single-frequency semiconductor lasersOLSHANSKY, R; FYE, D.Electronics Letters. 1984, Vol 20, Num 22, pp 928-929, issn 0013-5194Article

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