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Stationary min-stable stochastic processesDE HAAN, L; PICKANDS, J. III.Probability theory and related fields. 1986, Vol 72, Num 4, pp 477-492, issn 0178-8051Article

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DIVISIBILITE INFINIE D'UNE FAMILLE DE DISTRIBUTIONSMALOSHEVSKIJ SG.1972; TEOR. FUNKC. FUNKCIONAL. ANAL. PRILOZH., U.S.S.R.; S.S.S.R.; DA. 1972; NO 16; PP. 212-214; BIBL. 3 REF.Serial Issue

A NOTE ON THE ESTIMATION OF PR(Y<X) FOR TRUNCATION PARAMETER DISTRIBUTIONSBEG MA.1981; COMMUN. STAT., THEORY METHODS; ISSN 0361-0926; USA; DA. 1981; VOL. 10; NO 7; PP. 687-691; BIBL. 2 REF.Article

Saddlejoint approximations for curved exponential familiesHOUGAARD, P.Statistics & probability letters. 1985, Vol 3, Num 3, pp 161-166, issn 0167-7152Article

Simultaneous estimation after selection and ranking and other procedures: the negative exponential caseMUKHOPADHYAY, N; HAMDY, H. I; DARMANTO, S et al.Metrika (Heidelberg). 1988, Vol 35, Num 5, pp 275-286, issn 0026-1335Article

Estimation of the mean of a selected negative exponential populationSACKROWITZ, H; SAMUEL-CAHN, E.Journal of the Royal Statistical Society. Series B. Methodological. 1984, Vol 46, Num 2, pp 242-249, issn 0035-9246Article

A generalized exponential distributionKHAN, M. S. H.Biometrical journal. 1987, Vol 29, Num 1, pp 121-127, issn 0323-3847Article

Some remarks on exponential familiesBUHLER, W. J; SEHR, J.The American statistician. 1987, Vol 41, Num 4, pp 279-280, issn 0003-1305Article

POINT ESTIMATION OF THE PARAMETER OF A TRUNCATED EXPONENTIAL DISTRIBUTIONSUICH R; RUTEMILLER HC.1982; IEEE TRANSACTIONS ON RELIABILITY; ISSN 0018-9529; USA; DA. 1982; VOL. 31; NO 4; PP. 393-397; BIBL. 8 REF.Article

MAXIMUM LIKELIHOOD PARAMETER ESTIMATION FOR THE QUARTIC EXPONENTIAL DISTRIBUTIONMATZ AW.1978; TECHNOMETRICS; USA; DA. 1978; VOL. 20; NO 4 PART. 1; PP. 475-484; BIBL. 20 REF.Article

THE MIXED EXPONENTIAL SOLUTION TO THE FIRST-ORDER AUTOREGRESSIVE MODELLAWRANCE AJ.1980; J. APPL. PROBABIL.; GBR; DA. 1980; VOL. 17; NO 2; PP. 546-552; BIBL. 3 REF.Article

INTERPRETING THE NEGATIVE EXPONENTIAL DENSITY GRADIENTEDMONSTON B; DAVIES O.1978; J. R. STATIST. SOC., A; GBR; DA. 1978; VOL. 141; NO 2; PP. 235-241; BIBL. 9 REF.Article

LIKELIHOOD RATIO TEST FOR DISCRIMINATION BETWEEN TWO MODELS WITH UNKNOWN LOCATION AND SCALE PARAMETERSDUMONCEAUX R; ANTLE CE; HAAS G et al.1973; TECHNOMETRICS; U.S.A.; DA. 1973; VOL. 15; NO 1; PP. 19-27; BIBL. 16 REF.Serial Issue

Note on a characterization of exponential distributionsKOTZ, S; STEUTEL, F. W.Statistics & probability letters. 1988, Vol 6, Num 3, pp 201-203, issn 0167-7152Article

La réciprocité des familles exponentielles naturelles sur R = Reciprocity between naturel exponential families on RLETAC, G; MALLIAVIN, P.Comptes rendus de l'Académie des sciences. Série 1, Mathématique. 1986, Vol 303, Num 2, pp 61-64, issn 0764-4442Article

Use of the score statistic for testing goodness-of-fit of some generalised distributionsRAYNER, J. C. W; MCINTYRE, R. I.Biometrical journal. 1985, Vol 27, Num 2, pp 159-166, issn 0323-3847Article

On the choice of a model to fit data from an exponential familyHAUGHTON, D. M. A.Annals of statistics. 1988, Vol 16, Num 1, pp 342-355, issn 0090-5364Article

Characterizations of natural exponential families with power variance functions by zero regression propertiesBAR-LEV, S. K; STRAMER, O.Probability theory and related fields. 1987, Vol 76, Num 4, pp 509-522, issn 0178-8051Article

The application of the principle of minimum cross-entropy to the characterization of the exponential type probability distributionsDUMITRESCU, M. E. B.Annals of the Institute of Statistical Mathematics. 1986, Vol 38, Num 3, pp 451-457, issn 0020-3157Article

Reproducibility in the one-parameter exponential familyBAR-LEV, S. K; ENIS, P.Metrika (Heidelberg). 1985, Vol 32, Num 6, pp 391-394, issn 0026-1335Article

An elimination type two-stage selection procedure for exponential distributionsSEUNG-HO LEE; WOO-CHUL KIM.Communications in statistics. Theory and methods. 1985, Vol 14, Num 10, pp 2563-2571, issn 0361-0926Article

Cost based reliability growth apportionmentGOUIL, K. K.Microelectronics and reliability. 1983, Vol 23, Num 5, pp 789-792, issn 0026-2714Article

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