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Estimating time and time-lag in time-of-flight velocimetryLADING, L.Applied optics. 1983, Vol 22, Num 22, pp 3637-3643, issn 0003-6935Article

The Gated Electrostatic Mass Spectrometer (GEMS) : Definition and Preliminary ResultsHERRERO, Federico A; JONES, Hollis H; LEE, Jeffrey G et al.Journal of the American Society for Mass Spectrometry. 2008, Vol 19, Num 10, pp 1384-1394, issn 1044-0305, 11 p.Conference Paper

The resolution function for a time-of-flight diffractometer with curved slits chopperLONITA, I.Journal of applied crystallography. 2001, Vol 34, pp 252-257, issn 0021-8898, 3Article

Oscillating the probe : Code requirements and time of flight diffractionARMITT, Tim; MOLEST, Michael.Materials evaluation. 2007, Vol 65, Num 11, issn 0025-5327, 1091-1096, 1098 [7 p.]Article

Ink identification by time-of-flight secondary ion mass spectroscopyHE, A; KARPUZOV, D; XU, S et al.Surface and interface analysis. 2006, Vol 38, Num 4, pp 854-858, issn 0142-2421, 5 p.Conference Paper

Combining time of flight and diffraction tomography for high resolution breast imaging: Initial in vivo results (L)HUTHWAITE, P; SIMONETTI, F; DURIC, N et al.The Journal of the Acoustical Society of America. 2012, Vol 132, Num 3, issn 0001-4966, EL257-EL260, 1Article

A simple software technique for resolution improvement in time spectroscopy measurementsABDEL-AAL, R. E.Measurement science & technology (Print). 1992, Vol 3, Num 12, pp 1133-1140, issn 0957-0233Article

Detection of cracks on a plate by piezoelectric interdigital transducersROH, Yongrae; KIM, Junho.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7981, issn 0277-786X, isbn 978-0-8194-8543-4, 798110.1-798110.8, 2Conference Paper

Development of a ToF version of the desktop MiniSIMS : instrument design and applicationsCLIFF, B; ECCLES, A. J; JONES, C et al.Surface and interface analysis. 2006, Vol 38, Num 4, pp 699-702, issn 0142-2421, 4 p.Conference Paper

The second level TOF trigger for the Obelix experimentLAI, A; MUSA, L; SERCI, S et al.IEEE transactions on nuclear science. 1994, Vol 41, Num 4, pp 1710-1713, issn 0018-9499, 2Article

High-order kinetic energy focusing in an end cap reflectron time-of-flight mass spectrometerCORNISH, T. J; COTTER, R. J.Analytical chemistry (Washington, DC). 1997, Vol 69, Num 22, pp 4615-4618, issn 0003-2700Article

Flow NMR imaging using stimulated echoesMERBOLDT, K.-D; HÄNICKE, W; FRAHM, J et al.Journal of magnetic resonance. 1986, Vol 67, Num 2, pp 336-341, issn 0022-2364Article

Ion formation and acceleration with pulsed surface ionization: two modes for time-of-flight mass spectromettryMÖLLER, K; HOLMLID, L.International journal of mass spectrometry and ion processes. 1984, Vol 61, Num 3, pp 323-335Article

Aberrations of the cylindrical mirror time-of-flight mass spectrometers with oblique incidenceIOANOVICIU, D; IOANOVICIU, Alexandra; CUNA, Stela et al.Journal of mass spectrometry. 2005, Vol 40, Num 12, pp 1626-1627, issn 1076-5174, 2 p.Conference Paper

Ion extraction from insulating fibers in ToF-SIMSAVCI, R; HAGENSTON, A. M; EQUALL, N. L et al.Surface and interface analysis. 1999, Vol 27, Num 8, pp 789-796, issn 0142-2421Article

Single atom detectability of a ToF atom-probe = Détectabilité d'un seul atome dans une sonde atomique à temps de volSAKURAI, T; HASHIZUME, T; JIMBO, A et al.Journal de physique. Colloques. 1984, Vol 45, Num 9, pp 343-347, issn 0449-1947Article

Development of a ToF version of the desktop MiniSIMS utilising a continuous primary ion beamECCLES, A. J; VOHRALIK, P; CLIFF, B et al.Applied surface science. 2006, Vol 252, Num 19, pp 7308-7311, issn 0169-4332, 4 p.Conference Paper

C60, buckminsteruilerene : its impact on biological ToF-SIMS analysisFLETCHER, John S; LOCKYER, Nicholas P; VICKERMAN, John C et al.Surface and interface analysis. 2006, Vol 38, Num 11, pp 1393-1400, issn 0142-2421, 8 p.Article

Theory and operation of a three-gate time-of-flight velocity analyzerMARTUS, K. E; ORIENT, O. J; HODGES, R. R et al.Review of scientific instruments. 1993, Vol 64, Num 2, pp 470-476, issn 0034-6748Article

Mobility analysis of electrons in CF4 by FTI methodTAKEDA, A; IKUTA, N.Journal of the Physical Society of Japan. 1993, Vol 62, Num 7, pp 2368-2381, issn 0031-9015Article

On the development of a 3D tomographie atom-probeDECONIHOUT, B; BOSTEL, A; MENAND, A et al.Applied surface science. 1993, Vol 67, Num 1-4, pp 444-450, issn 0169-4332Conference Paper

Improving TOF Mass Resolution by Reducing Ion Detector Time JitterRITZAU, Steve; HOLMES, Paula; MITCHELL, Paul et al.LC GC North America. 2010, Num JUIN, issn 1527-5949, p. 68, SUPArticle

Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF-SIMS)BATCHELLER, J; HACKE, A. M; MITCHELL, R et al.Applied surface science. 2006, Vol 252, Num 19, pp 7113-7116, issn 0169-4332, 4 p.Conference Paper

Optical Stark decelerator for moleculesFULTON, R; BISHOP, A. I; BARKER, P. F et al.Physical review letters. 2004, Vol 93, Num 24, pp 243004.1-243004.4, issn 0031-9007Article

TOF-SIMS analysis of chemical state changes in cresol-novolak photoresist surface caused by O2 plasma downstreamSAITO, R; ICHINOHE, Y; KUDO, M et al.Applied surface science. 1999, Vol 142, Num 1-4, pp 460-464, issn 0169-4332Conference Paper

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