Linear frequency modulation photoacoustic radar: Optimal bandwidth and signal-to-noise ratio for frequency-domain imaging of turbid mediaLASHKARI, Bahman; MANDELIS, Andreas.The Journal of the Acoustical Society of America. 2011, Vol 130, Num 3, pp 1313-1324, issn 0001-4966, 12 p.Article

Photoacoustic radar imaging signal-to-noise ratio, contrast, and resolution enhancement using nonlinear chirp modulationLASHKARI, Bahman; MANDELIS, Andreas.Optics letters. 2010, Vol 35, Num 10, pp 1623-1625, issn 0146-9592, 3 p.Article

Ion implantation dose high-resolution monitoring in Si wafers using laser infrared photothermal radiometry with lock-in common-mode-rejection demodulationMANDELIS, Andreas; RABAGO, Felipe.Solid-state electronics. 2005, Vol 49, Num 5, pp 769-773, issn 0038-1101, 5 p.Article

Semiconductors and electronic materialsMandelis, Andreas; Hess, Peter.Progress in photothermal and photoacoustic science and technology. 2000, isbn 0-8194-3506-6, XVII, 353 p, isbn 0-8194-3506-6Book

Life and earth sciencesMandelis, Andreas; Hess, Peter.Progress in photothermal and photoacoustic science and technology. 1997, isbn 0-8194-2450-1, XX, 454, isbn 0-8194-2450-1Conference Proceedings

Curvature-insensitive methodology for thermal-wave depth-profilometry in multi-layered curvilinear solidsLIWANG LIU; CHINHUA WANG; XIAO YUAN et al.Journal of physics. D, Applied physics (Print). 2010, Vol 43, Num 28, issn 0022-3727, 285403.1-285403.9Article

Carrier-density-wave transport and local internal electric field measurements in biased metal-oxide-semiconductor n-si devices using contactless laser photo-carrier radiometryMANDELIS, Andreas; PAWLAK, Micha; SHAUGHNESSY, Derrick et al.Semiconductor science and technology. 2004, Vol 19, Num 11, pp 1240-1249, issn 0268-1242, 10 p.Article

Two-beam cross-modulation photocarrier radiometry : principles and contrast amplification in semiconductor subsurface imagingSHAUGHNESSY, Derrick; MANDELIS, Andreas; BATISTA, Jerias et al.Semiconductor science and technology. 2006, Vol 21, Num 3, pp 320-334, issn 0268-1242, 15 p.Article

Slow and fast ultrasonic wave detection improvement in human trabecular bones using Golay code modulationLASHKARI, Bahman; MANBACHI, Amir; MANDELIS, Andreas et al.The Journal of the Acoustical Society of America. 2012, Vol 132, Num 3, issn 0001-4966, EL222-EL228, 1Article

Polypyrrole nanoparticles as a thermal transducer of NIR radiation in hot-melt adhesivesFUGANG LI; WINNIK, Mitchell A; MATVIENKO, Anna et al.Journal of material chemistry. 2007, Vol 17, Num 40, pp 4309-4315, issn 0959-9428, 7 p.Article

Exciton Lifetime Broadening and Distribution Profiles of PbS Colloidal Quantum Dot Thin Films Using Frequency- and Temperature-Scanned Photocarrier RadiometryJING WANG; MANDELIS, Andreas; MELNIKOV, Alexander et al.Journal of physical chemistry. C. 2013, Vol 117, Num 44, pp 23333-23348, issn 1932-7447, 16 p.Article

An adaptive, multiscale inverse scattering approach to photothermal depth profilometryMILLER, Eric L; YAVUZ, Ibrahim; NICOLAIDES, Lena et al.Circuits, systems, and signal processing. 2000, Vol 19, Num 4, pp 339-363, issn 0278-081XArticle

Experimental Investigation of Demineralization and Remineralization of Human Teeth Using Infrared Photothermal Radiometry and Modulated LuminescenceJEON, Raymond J; HELLEN, Adam; MATVIENKO, Anna et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 68560B.1-68560B.10, issn 0277-786X, isbn 978-0-8194-7031-7, 1VolConference Paper

On imaging multiple physical parameters in an inverse problems contextMILLER, Eric L; MANDELIS, Andreas.SPIE proceedings series. 2004, pp 51-62, isbn 0-8194-5202-5, 12 p.Conference Paper

Photothermal Detection of Incipient Dental Caries : Experiment and ModelingMATVIENKO, Anna; JEON, Raymond J; MANDELIS, Andreas et al.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 67590J.1-67590J.10, issn 0277-786X, isbn 978-0-8194-6919-9Conference Paper

Photo-carrier radiometry of semiconductors : A novel powerful optoelectronic diffusion-wave technique for silicon process non-destructive evaluationMANDELIS, Andreas.NDT & E international. 2006, Vol 39, Num 3, pp 244-252, issn 0963-8695, 9 p.Conference Paper