au.\*:("MARKEWITZ G")
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HIGH-RESOLUTION DIRECT-DISPLAY X-RAY TOPOGRAPHY.HARTMANN W; MARKEWITZ G; RETTENMAIER U et al.1975; APPL. PHYS. LETTERS; U.S.A.; DA. 1975; VOL. 27; NO 5; PP. 308-309; BIBL. 20 REF.Article
Pressure dependences of silicide/silicon Schottky barrier heightsWERNER, J. H; VON KÄNEL, H; MARKEWITZ, G et al.Applied surface science. 1989, Vol 41-42, Num 1-4, pp 159-163, issn 0169-4332Conference Paper
