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Results 1 to 25 of 505

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Analytical model for solar PV and CSP electricity costs: Present LCOE values and their future evolutionHERNANDEZ-MORO, J; MARTINEZ-DUART, J. M.Renewable & sustainable energy review. 2013, Vol 20, pp 119-132, issn 1364-0321, 14 p.Article

CSP electricity cost evolution and grid parities based on the IEA roadmapsHERNANDEZ-MORO, J; MARTINEZ-DUART, J. M.Energy policy. 2012, Vol 41, pp 184-192, issn 0301-4215, 9 p.Article

EELS and low-energy electron emission of clean and oxygen-exposed tantalumPALACIO, C; MARTINEZ-DUART, J. M.Surface and interface analysis. 1990, Vol 15, Num 11, pp 675-680, issn 0142-2421, 6 p.Article

Correction of the escape depth effect in sputter depth profilesPALACIO, C; MARTINEZ-DUART, J. M.Thin solid films. 1985, Vol 129, Num 1-2, pp L49-L51, issn 0040-6090Article

Gas evolution in aluminum electrolytic capacitorsGOMEZ-ALEXANDRE, C; ALBELLA, J. M; MARTINEZ-DUART, J. M et al.Journal of the Electrochemical Society. 1984, Vol 131, Num 3, pp 612-614, issn 0013-4651Article

Electron injection and avalanche during the anodic oxidation of tantalum = Injection d'électron et avalanche au cours de l'anodisation du tantaleALBELLA, J. M; MONTERO, I; MARTINEZ-DUART, J. M et al.Journal of the Electrochemical Society. 1984, Vol 131, Num 5, pp 1101-1104, issn 0013-4651Article

Tem study of metallic contacts to nanostructured siliconMARTIN-PALMA, R. J; HERRERO, P; MARTINEZ-DUART, J. M et al.Nanostructured materials. 1999, Vol 11, Num 5, pp 631-635, issn 0965-9773Article

Quantitative AES and RBS depth profiles of titanium silicide films on GaAs after annealingCLEMENT, M; SANZ, J. M; MARTINEZ-DUART, J. M et al.Surface and interface analysis. 1989, Vol 14, Num 6-7, pp 413-418, issn 0142-2421Conference Paper

High field ionic conduction in anodic Ta2O5 formed in oxalic and phosphoric electrolytesMONTERO, I; ALBELLA, J. M; MARTINEZ-DUART, J. M et al.Journal of the Electrochemical Society. 1985, Vol 132, Num 4, pp 976-978, issn 0013-4651Article

Electroless thin film Ni-P resistors with low temperature coefficientsFERNÁNDEZ, M; MARTÍNEZ-DUART, J. M; ALBELLA, J. M et al.Thin solid films. 1984, Vol 112, Num 1, pp L9-L12, issn 0040-6090Article

Reformation processes of the MnO2-Ta2O5-Ta system under galvanostatic conditionsMONTERO, I; ALBELLA, J. M; MARTINEZ DUART, J. M et al.Electrochimica acta. 1990, Vol 35, Num 5, pp 855-859, issn 0013-4686Article

An AES study of the room-temperature oxidation of TaSix after bombardment with Ar+ions of different energiesCLEMENT, M; SANZ, J. M; MARTINEZ-DUART, J. M et al.Surface and interface analysis. 1990, Vol 15, Num 7, pp 440-446, issn 0142-2421Article

A theory of avalanche breakdown during anodic oxidationALBELLA, J. M; MONTERO, I; MARTINEZ-DUART, J. M et al.Electrochimica acta. 1987, Vol 32, Num 2, pp 255-258, issn 0013-4686Article

Analysis of electrical and optical properties of silicon nanoclusters using flicker-noise spectroscopyPARKHUTIK, V; MARTINEZ DUART, J. M.Applied organometallic chemistry. 2001, Vol 15, Num 5, pp 359-364, issn 0268-2605Conference Paper

Changes induced in the room temperature oxidation of TiSix by Ar+ bombardmentSANZ, J. M; CLEMENT, M; MARTINEZ-DUART, J. M et al.Thin solid films. 1992, Vol 221, Num 1-2, pp 21-26, issn 0040-6090Article

Pressure build-up in aluminium electrolytic capacitors under stressed voltage conditionsGOMEZ-ALEIXANDRE, C; ALBELLA, J. M; MARTINEZ-DUART, J. M et al.Journal of applied electrochemistry. 1986, Vol 16, Num 1, pp 109-115, issn 0021-891XArticle

Dielectric characteristics of miniature aluminium electrolytic capacitors under stressed voltage conditionsALBELLA, J. M; GOMEZ-ALEIXANDRE, C; MARTINEZ-DUART, J. M et al.Journal of applied electrochemistry. 1984, Vol 14, Num 1, pp 9-14, issn 0021-891XArticle

Calcium phosphate coatings prepared by aerosol-gelMANSE-SILVAN, M; LANGLET, M; JIMENEZ, C et al.Journal of the European Ceramic Society. 2003, Vol 23, Num 2, pp 243-246, issn 0955-2219, 4 p.Article

Apatite films produced by electrodeposition: characterization by TEM and AFMMANSO, Miguel; JIMENEZ, Carmen; MORANT, Carmen et al.Surface and interface analysis. 2001, Vol 31, Num 12, pp 1104-1109, issn 0142-2421Article

Silver-based low-emissivity coatings for architectural windows : Optical and structural propertiesMARTIN-PALMA, R. J; VAZQUEZ, L; MARTINEZ-DUART, J. M et al.Solar energy materials and solar cells. 1998, Vol 53, Num 1-2, pp 55-66, issn 0927-0248Article

Optical and structural characterization of r.f. sputtered CeO2 thin filmsBUENO, R. M; MARTINEZ-DUART, J. M; HERNANDEZ-VELEZ, M et al.Journal of materials science. 1997, Vol 32, Num 7, pp 1861-1865, issn 0022-2461Article

Characterization of the interfaces formed during the silicidation process of Ti films on Si at low and high temperaturesPEREZ-RIGUEIRO, J; HERRERO, P; JIMENEZ, C et al.Surface and interface analysis. 1997, Vol 25, Num 11, pp 896-903, issn 0142-2421Article

Structural properties of BN thin films obtained by plasma-enhanced chemical vapour depositionMONTERO, I; GALAN, L; OSORIO, S. P et al.Surface and interface analysis. 1994, Vol 21, Num 11, pp 809-813, issn 0142-2421Article

Co-sputtered Si-Cr resistive films = Couches résistives Si-Cr copulvériséesFERNANDEZ, M; GONZALEZ, J. P; ALBELLA, J. M et al.Journal of materials science. 1987, Vol 22, Num 10, pp 3703-3706, issn 0022-2461Article

Optical characterization of porous silicon films and multilayer filtersTORRES-COSTA, V; MARTIN-PALMA, R. J; MARTINEZ-DUART, J. M et al.Applied physics. A, Materials science & processing (Print). 2004, Vol 79, Num 8, pp 1919-1923, issn 0947-8396, 5 p.Article

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