VERSATILE AND USER-FRIENDLY COMPUTER SYSTEM FOR THE CAMECA IMS-300 SECONDARY ION MASS SPECTROMETERVAN CRAEN M; VAN ESPEN P; ADAMS F et al.1982; REVIEW OF SCIENTIFIC INSTRUMENTS; ISSN 0034-6748; USA; DA. 1982; VOL. 53; NO 7; PP. 1007-1011; BIBL. 2 REF.Article

APPLICATIONS OF THE ION MICROPROBE TO GEOCHEMISTRY AND COSMOCHEMISTRYSHIMIZU N; HART SR.1982; ANNU. REV. EARTH PLANET. SCI.; ISSN 0084-6597; USA; DA. 1982; VOL. 10; PP. 483-526; BIBL. 3 P.Article

HIGH-PERFORMANCE SECONDARY ION MASS SPECTROMETERCOLTON RJ; CAMPANA JE; BARLAK TM et al.1980; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1980; VOL. 51; NO 12; PP. 1685-1689; BIBL. 14 REF.Article

ION BEAM-TARGET INTERACTIONS IN ION MICROPROBE ANALYSISUNILSON GC.1982; INT. J. MASS SPECTROM. ION PHYS.; ISSN 0020-7381; NLD; DA. 1982; VOL. 42; NO 1-2; PP. 51-61; BIBL. 45 REF.Article

ANALYZA POVRCHU ODLITKU Z TAVENEHO CEDICE METODOU SIMS = ANALYSE DE SURFACE DE PRODUITS EN BASALTE FONDU, PAR LA METHODE SIMSHEDBAVNY P; RYCHLY R.1982; SILIKATY; ISSN 0037-5241; CSK; DA. 1982; VOL. 26; NO 1; PP. 63-68; ABS. RUS/ENG; BIBL. 10 REF.Article

THE RESIN BEAD AS A THERMAL ION SOURCE: A SIMS STUDYSMITH DH; CHRISTIE WH; EBY RE et al.1980; INT. J. MASS SPECTROM. ION PHYS.; ISSN 0020-7381; NLD; DA. 1980; VOL. 36; NO 3; PP. 301-316; BIBL. 22 REF.Article

COMPARATIVE SNMS AND SIMS STUDIES OF OXIDIZED CE AND GD = ETUDE COMPARATIVE PAR SNMS ET SIMS DE CE ET GD OXYDESOECHSNER H; RUEHE W; STUMPE E et al.1979; SURF. SCI.; NLD; DA. 1979; VOL. 85; NO 2; PP. 289-301; BIBL. 14 REF.Article

PRIMARY-ION CHARGE COMPENSATION IN SIMS ANALYSIS OF INSULATORSWITTMAACK K.1979; J. APPL. PHYS.; USA; DA. 1979; VOL. 50; NO 1; PP. 493-497; BIBL. 16 REF.Article

MOLECULAR SECONDARY ION MASS SPECTROMETRY WITH A LIQUID METAL ION PRIMARY SOURCEBAROFSKY DF; GIESSMANN U; BELL AE et al.1983; ANALYTICAL CHEMISTRY (WASHINGTON); ISSN 0003-2700; USA; DA. 1983; VOL. 55; NO 8; PP. 1318-1323; BIBL. 49 REF.Article

A TEST APPARATUS FOR SECONDARY ION MASS SPECTROMETRYKLAUS N; BROWN JD.1983; CANADIAN JOURNAL OF PHYSICS; ISSN 0008-4204; CAN; DA. 1983; VOL. 61; NO 4; PP. 535-542; ABS. FRE; BIBL. 7 REF.Article

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VERTICAL MOTION MOUNT FOR A QUADRUPOLE PREFILTERSCHMIDT RD; CRAIG JH JR.1982; J. VAC. SCI. TECHNOL.; ISSN 0022-5355; USA; DA. 1982; VOL. 21; NO 1; PP. 103-104; BIBL. 1 REF.Article

ANALYSEUR IONIQUEVASTEL J.1980; TECHNIQUES DE L'INGENIEUR, ELECTRONIQUE; FRA; PARIS: TECH.-ING.; DA. 1980; VOL. 87; E4330; 18 P.Book Chapter

DETECTOR DISCRIMINATION IN SIMS: ION-TO-ELECTRON CONVERTER YIELD FACTORS FOR POSITIVE IONSRUDAT MA; MORRISON GH.1978; INTERNATION. J. MASS SPECTROM. ION PHYS.; NLD; DA. 1978; VOL. 27; NO 3; PP. 249-261; BIBL. 19 REF.Article

INVESTIGATION OF THE OXIDATION OF POLYCRYSTALLINE LEAD BY XPS AND SIMSHEWITT RW; WINOGRAD N.1978; SURF. SCI.; NLD; DA. 1978; VOL. 78; NO 1; PP. 1-14; BIBL. 40 REF.Article

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ON THE INFLUENCE OF CRATER EDGES AND NEUTRAL BEAM COMPONENT ON IMPURITY PROFILES FROM RASTER SCANNING SIMSVANDERVORST W; MAES HE; DE KEERSMAECKER R et al.1982; SURF. INTERFACE ANAL.; ISSN 0142-2421; GBR; DA. 1982; VOL. 4; NO 6; PP. 245-252; BIBL. 38 REF.Article

ANALYSE QUANTITATIVE DES PARTICULES CALCINEES A L'AIDE D'UN MICROANALYSEUR IONIQUEKAWAKUBO S; YAMAGUCHI Y; MIZUIKE A et al.1981; BUNSEKI KAGAKU; ISSN 0525-1931; JPN; DA. 1981; VOL. 30; NO 1; PP. 21-26; ABS. ENG; BIBL. 10 REF.Article

COMPUTER PEAK IDENTIFICATION IN SIMSCHEREPIN VT; KOSYACHKOV AA; GUDZENKO GI et al.1980; INTERNATION. J. MASS SPECTRON. ION PHYS.; NLD; DA. 1980; VOL. 35; NO 3-4; PP. 225-230; BIBL. 6 REF.Article

ANALYSE VON GLAESERN, OXIDEN UND KONZENTRATIONSPROFILEN IN OBERFLAECHEN MIT DEN VON HOCHENERGETISCHEN PROJEKTILIONEN AUSGELOESTEN SEKUNDAERIONEN (SIMS), PHOTONEN (IBSCA, SCANIIR) SOWIE MIT REFLEKTIERTEN PROJEKTILIONEN (LEISS, HEISS) = ANALYSE DES VERRES, D'OXYDES ET DE PROFILS DE CONCENTRATION A LA SURFACE ET DANS LES REVETEMENTS DE SURFACE A L'AIDE D'IONS DE HAUTE ENERGIE PRODUITS PAR DES IONS SECONDAIRES (SIMS) PHOTONS (IBSCA, SCANIIR) ET DES IONS INCIDENTS REFLECHIS (LEISS, HEISS)BACH H.1980; GLASTECH. BER.; DEU; DA. 1980; VOL. 53; NO 3; PP. 58-62; ABS. ENG/FRE; BIBL. 1 REF.Article

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ON THE PHENOMENOLOGICAL MODEL OF PREFERRED SPUTTERING FOR SIMS AND AUGER PROFILING: A CRITICAL ANALYSISCHOU NJ; SHAFER MW.1980; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1980; VOL. 92; NO 2-3; PP. 601-616; BIBL. 22 REF.Article

DESIGN AND PERFORMANCE OF AN ENERGY- AND ANGLE-RESOLVED SECONDARY ION MASS SPECTROMETERGIBBS RA; WINOGRAD N.1981; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1981; VOL. 52; NO 8; PP. 1148-1155; BIBL. 26 REF.Article

QUANTITATIVE ION PROBE ANALYSIS OF GLASSES BY EMPIRICAL CALIBRATION METHODSGANJEI JD; MORRISON GH.1978; ANAL. CHEM.; USA; DA. 1978; VOL. 50; NO 14; PP. 2034-2039; BIBL. 20 REF.Article

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