au.\*:("MATADA, H")
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Residual strain and surface roughness of Si1-xGex alloy layers grown by molecular beam epitaxy on Si(001) substrateTATSUYAMA, C; ASANO, T; NAKAO, T et al.Thin solid films. 2000, Vol 369, Num 1-2, pp 161-166, issn 0040-6090Conference Paper
MBE grown short-period (Sim/Gen)N superlattices (SSLs) and its effect on the growth of uniform Si0.75Ge0.25/(SSLs)/Si(001) systemsRAHMAN, M. M; KURUMATANI, K; MATADA, H et al.Materials science & engineering. B, Solid-state materials for advanced technology. 2002, Vol 89, Num 1-3, pp 252-256, issn 0921-5107Conference Paper