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Multiband simulation of quantum transport in nanoscale double-gate MOSFETsIWATA, Hideyuki; MATSUDA, Toshihiro; OHZONE, Takashi et al.Solid-state electronics. 2009, Vol 53, Num 10, pp 1130-1134, issn 0038-1101, 5 p.Article

Computationally efficient method for scattering device simulation in nanoscale MOSFETsIWATA, Hideyuki; MATSUDA, Toshihiro; OHZONE, Takashi et al.Solid-state electronics. 2007, Vol 51, Num 5, pp 708-713, issn 0038-1101, 6 p.Article

A test structure for two-dimensional analysis of MOSFETs by hot-carrier-induced photoemissionMATSUDA, Toshihiro; MURAMATSU, Akira; IWATA, Hideyuki et al.2004 international conference on microelectronic test structures. 2004, pp 173-177, isbn 0-7803-8262-5, 1Vol, 5 p.Conference Paper

A test structure for spectrum analysis of hot-carrier-induced photoemission from MOSFETsMATSUDA, Toshihiro; OHZONE, Takashi; ODANAKA, Shinji et al.IEEE transactions on semiconductor manufacturing. 2003, Vol 16, Num 2, pp 233-238, issn 0894-6507, 6 p.Conference Paper

Chemical recycling of mixture of waste plastics using a new reactor system with stirred heat medium particles in steam atmosphereMASUDA, Takao; KUSHINO, Tatsuhiko; MATSUDA, Toshihiro et al.Chemical engineering journal (1996). 2001, Vol 82, Num 1-3, pp 173-181, issn 1385-8947Article

A temperature and supply voltage independent CMOS voltage reference circuitMATSUDA, Toshihiro; MINAMI, Ryuichi; KANAMORI, Akira et al.IEICE transactions on electronics. 2005, Vol 88, Num 5, pp 1087-1093, issn 0916-8524, 7 p.Article

A CMOS temperature sensor circuitOHZONE, Takashi; SADAMOTO, Tatsuaki; MORISHITA, Takayuki et al.IEICE transactions on electronics. 2007, Vol 90, Num 4, pp 895-902, issn 0916-8524, 8 p.Article

A test structure to analyze highly-doped-drain and lightly-doped-drain in CMOSFETOHZONE, Takashi; OKADA, Kazuhiko; MORISHITA, Takayuki et al.IEICE transactions on electronics. 2006, Vol 89, Num 9, pp 1351-1357, issn 0916-8524, 7 p.Article

A test structure for two-dimensional analysis of MOSFETs by hot-carrier-induced photoemissionMATSUDA, Toshihiro; TAKEUCHI, Hiroaki; MURAMATSU, Akira et al.IEICE transactions on electronics. 2005, Vol 88, Num 5, pp 811-816, issn 0916-8524, 6 p.Conference Paper