FAST SIMULTANEOUS THICKNESS MEASUREMENTS OF GOLD AND NICKEL LAYERS ON COPPER SUBSTRATES = MESURES SIMULTANEES RAPIDES DE L'EPAISSEUR DE COUCHES DE NICKEL ET D'OR SUR DES SUBSTRATS DE CUIVREMALDONADO JR; MAYDAN D.1979; BELL SYST. TECH. J.; USA; DA. 1979; VOL. 58; NO 8; PP. 1851-1868; BIBL. 3 REF.Article

DEVICE PROCESSING USING THE TRILEVEL TECHNIQUEMORAN JM; MAYDAN D.1980; POLYM. ENG. SCI.; ISSN 0032-3888; USA; DA. 1980; VOL. 20; NO 16; PP. 1097-1101; BIBL. 9 REF.Article

HIGH RESOLUTION, STEEP PROFILE, RESIST PATTERNSMORAN JM; MAYDAN D.1979; BELL SYST. TECH. J.; USA; DA. 1979; VOL. 58; NO 5; PP. 1027-1036; BIBL. 7 REF.Article

REACTIVE SPUTTER ETCHING AND ITS APPLICATIONSWANG DNK; MAYDAN D; LEVINSTEIN HJ et al.1980; SOLID STATE TECHNOL.; ISSN 0038-111X; USA; DA. 1980; VOL. 23; NO 8; PP. 122-126; BIBL. 9 REF.Article

Recovering three-dimensional shape from a single image of curved objectsMALIK, J; MAYDAN, D.IEEE transactions on pattern analysis and machine intelligence. 1989, Vol 11, Num 6, pp 555-566, issn 0162-8828Article

Calculating geometric properties from Fourier representationKIRYATI, N; MAYDAN, D.Pattern recognition. 1989, Vol 22, Num 5, pp 469-475, issn 0031-3203Article

REACTIVE ION ETCHING OF SILICON OXIDES WITH AMMONIA AND TRIFLUOROMETHANE. THE ROLE OF NITROGEN IN THE DISCHARGESMOLINSKY G; TRUESDALE EA; WANG DNK et al.1982; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1982; VOL. 129; NO 5; PP. 1036-1040; BIBL. 12 REF.Article

SPURIOUS EFFECTS CAUSED BY THE CONTINUOUS RADIATION AND EJECTED ELECTRONS IN X-RAY LITHOGRAPHY.MALDONADO JR; COQUIN GA; MAYDAN D et al.1975; J. VACUUM SCI. TECHNOL.; U.S.A.; DA. 1975; VOL. 12; NO 6; PP. 1329-1331; BIBL. 2 REF.; (SYMP. ELECTRON ION PHOTON BEAM TECHNOL. 13. PROC.; COLORADO SPRINGS; 1975)Conference Paper

Effectiveness of data dependence analysisMAYDAN, D. E; HENNESSY, J. L; LAM, M. S et al.International journal of parallel programming. 1995, Vol 23, Num 1, pp 63-81, issn 0885-7458Conference Paper

Combining loop transformations considering caches and schedulingWOLF, M. E; MAYDAN, D. E; CHEN, D.-K et al.International journal of parallel programming. 1998, Vol 26, Num 4, pp 479-503, issn 0885-7458Conference Paper