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kw.\*:("METHODE EXAFS")

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CRITERIA FOR AUTOMATIC X-RAY ABSORPTION FINE STRUCTURE BACKGROUND REMOVALCOOK JW JR; SAYERS DE.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 8; PP. 5024-5031; BIBL. 15 REF.Article

STRUCTURAL MODELS FOR THE INTERACTION OF OXYGEN WITH AL(111) AND AL IMPLIED BY PHOTOEMISSION AND SURFACE EXAFSNORMAN D; BRENNAN S; JAEGER R et al.1981; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1981; VOL. 105; NO 2-3; PP. L297-L306; BIBL. 22 REF.Article

APPLICATION OF THE EXAFS METHOD TO JAHN-TELLER IONS: STATIC AND DYNAMIC BEHAVIOR OF CU(H2O)62+ AND CR(H2O)62+SHAM TK; HASTINGS JB; PERLMAN ML et al.1981; CHEM. PHYS. LETT.; ISSN 0009-2614; NLD; DA. 1981; VOL. 83; NO 2; PP. 391-396; BIBL. 22 REF.Article

EXAFS AND SURFACE EXAFS FROM MEASUREMENTS OF X-RAY REFLECTIVITYFOX R; GURMAN SJ.1980; J. PHYS. C: SOLID STATE PHYS.; ISSN 0022-3719; GBR; DA. 1980; VOL. 13; NO 11; PP. L249-L253; BIBL. 16 REF.Article

SHORT RANGE ORDER IN NONCRYSTALLINE IRON(III) SULFIDEDIEMANN E.1980; Z. ANORG. ALLG. CHEM.; ISSN 0044-2313; DDR; DA. 1980; VOL. 461; NO 2; PP. 201-204; ABS. GER; BIBL. 15 REF.Article

ON EXPERIMENTAL ATTENUATION FACTORS OF THE AMPLITUDE OF THE EXAFS OSCILLATIONS IN ABSORPTION, REFLECTIVITY AND LUMINESCENCE MEASUREMENTSGOULON J; GOULON GINET C; CORTES R et al.1982; J. PHYS.; ISSN 0302-0738; FRA; DA. 1982; VOL. 43; NO 3; PP. 539-548; ABS. FRE; BIBL. 28 REF.Article

EXAFS STUDIES ON SUPERFICIAL REGIONS BY MEANS OF TOTAL REFLECTIONMARTENS G; RABE P.1980; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1980; VOL. 58; NO 2; PP. 415-424; ABS. GER; BIBL. 13 REF.Article

NOISE LEVEL AND RESOLUTION EFFECTS IN EXAFS SPECTRAMORRISON TI; SHENOY GK; NIARCHOS D et al.1982; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1982; VOL. 15; NO 4; PP. 388-390; BIBL. 9 REF.Article

STRUCTURE OF VAPOR-DEPOSITED GE FILMS AS A FUNCTION OF SUBSTRATE TEMPERATUREEVANGELISTI F; GAROZZO M; CONTE G et al.1982; JOURNAL OF APPLIED PHYSICS; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 11; PART. 1; PP. 7390-7396; BIBL. 19 REF.Article

CHEMICAL APPLICATIONS OF EXTENDED X-RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPYBOON KENG TEO.1981; ACC. CHEM. RES.; ISSN 0001-4842; USA; DA. 1981; VOL. 13; NO 11; PP. 412-419; BIBL. 36 REF.Article

EFFECT OF SCREENING CHARGE TRANSFER ON THE EXTENDED-X-RAY-ABSORPTION-FINE-STRUCTURE PHASE SHIFT: MODEL CALCULATIONS FOR EXCITATION OF THE 1S LEVEL IN THE BROMINE MOLECULELARAMORE GE.1981; PHYS. REV. A; ISSN 0556-2791; USA; DA. 1981; VOL. 24; NO 4; PP. 1904-1913; BIBL. DISSEM.Article

NOVEL METHOD FOR ANGLE DETERMINATIONS BY EXAFS VIA A NEW MULTIPLE-SCATTERING FORMALISMTEO BK.1981; J. AM. CHEM. SOC.; ISSN 0002-7863; USA; DA. 1981; VOL. 103; NO 14; PP. 3990-4001; BIBL. 25 REF.Article

A PHASE-DIFFERENTIAL APPROACH TO EXAFS ANALYSIS OF GERMANIUM POLYMORPHSKAWAMURA T; SHIMOMURA O; FUKAMACHI T et al.1981; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1981; VOL. 37; NO 5; PP. 653-658; BIBL. 14 REF.Article

CARBON K-EDGE FINE STRUCTURE IN GRAPHITE FOILS AND IN THIN-FILM CONTAMINANTS ON METAL SURFACESDENLEY D; PERFETTI P; WILLIAMS RS et al.1980; PHYS. REV. B; ISSN 0163-1829; USA; DA. 1980; VOL. 21; NO 6; PP. 2267-2273; BIBL. 32 REF.Article

LEED VERSUS SEXAFS IN THE PROBLEM OF OXYGEN ON ALUMINIUMJONA F; MARCUS PM.1980; J. PHYS. C: SOLID STATE PHYS.; ISSN 0022-3719; GBR; DA. 1980; VOL. 13; NO 20; PP. L477-L480; BIBL. 9 REF.Article

PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON X-RAY AND XUV SPECTROSCOPY = COMPTE RENDU DE LA CONFERENCE INTERNATIONALE SUR LA SPECTROSCOPIE DE RAYONS X ET ULTRAVIOLETSSAGAWA T ED.1978; JPN. J. APPL. PHYS.; ISSN 0021-4922; JPN; DA. 1978; VOL. 17; SUPPL. 2; XIV-516 P.; BIBL. DISSEM.Conference Paper

EXTENDED X-RAY ABSORPTION FINE STRUCTURE - ITS STRENGTHS AND LIMITATIONS AS A STRUCTURAL TOOLLEE PA; CITRIN PH; EISENBERGER P et al.1981; REV. MOD. PHYS.; ISSN 0034-6861; USA; DA. 1981; VOL. 53; NO 4; PART 1; PP. 769-806; BIBL. 3 P.Article

SINGLE-CRYSTAL POLARIZED X-RAY ABSORPTION SPECTROSCOPY. OBSERVATION AND THEORY FOR (MOO2S2)2-KUTZLER FW; SCOTT RA; BERG JM et al.1981; J. AM. CHEM. SOC.; ISSN 0002-7863; USA; DA. 1981; VOL. 103; NO 20; PP. 6083-6088; BIBL. 25 REF.Article

STRUCTURE OF BIMETALLIC CLUSTERS. EXTENDED X-RAY ABSORPTION FINE STRUCTURE (EXAFS) STUDIES OF OS-CU CLUSTERS = STRUCTURE D'AMAS BIMETALLIQUES. ETUDES DE STRUCTURE FINE PAR ABSORPTION ETENDUE DE RAYONS X (EXAFS) D'AMAS OS-CUSINFELT JH; VIA GH; LYTLE FW et al.1981; J. CHEM. PHYS.; ISSN 0021-9606; USA; DA. 1981; VOL. 75; NO 11; PP. 5527-5537; BIBL. 35 REF.Article

THE SHAPE AND EXTENDED FINE STRUCTURE OF THE MANGANESE K X-RAY ABSORPTION DISCONTINUITY IN SOME DIVALENT COMPOUNDSAPTE MY; MANDE C.1981; J. PHYS. CHEM. SOLIDS; ISSN 0022-3697; USA; DA. 1981; VOL. 42; NO 7; PP. 605-610; BIBL. 25 REF.Article

EXAFS STUDIES OF STRONG ELECTROLYTIC SOLUTIONSLAGARDE P; FONTAINE A; RAOUX D et al.1980; J. CHEM. PHYS.; ISSN 0021-9606; USA; DA. 1980; VOL. 72; NO 5; PP. 3061-3069; BIBL. 20 REF.Article

EXAFS STUDY OF DEHYDRATED COBALT EXCHANGED A ZEOLITEMORRISON TI; ITON LE; SHENOY GK et al.1980; J. CHEM. PHYS.; ISSN 0021-9606; USA; DA. 1980; VOL. 73; NO 9; PP. 4705-4706; BIBL. 2 REF.Article

SECOND CONFERENCE ON INTERCALATION COMPOUNDS OF GRAPHITE. PROCEEDINGSVOGEL FL ED.1980; SYNTH. MET.; CHE; DA. 1980; VOL. 2; NO 1-2; 149 P.; BIBL. DISSEM.Conference Paper

PAPERS: TRENDS IN PHYSICS, 1978/4TH GENERAL CONFERENCE OF THE EUROPEAN PHYSICAL SOCIETY, YORK, SEPTEMBER 25-29, 1978WOOLFSON MM ED.1979; TRENDS IN PHYSICS, 1978. EUROPEAN PHYSICAL SOCIETY. GENERAL CONFERENCE. 4/1978/YORK; GBR; BRISTOL: ADAM HILGER; DA. 1979; XII-591 P.: ILL.; 25 CM; BIBL. DISSEM.; ISBN 0-85274-501-XConference Proceedings

EXAFS STRUCTURAL PARAMETERS FOR SOME TITANIUM HALIDESVLAIC G; BART JCJ; CAVIGLOLO W et al.1982; CHEM. PHYS.; ISSN 0301-0104; NLD; DA. 1982; VOL. 64; NO 1; PP. 115-122; BIBL. 40 REF.Article

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