METHODE DU FAISCEAU CONVERGENT: APPLICATION A LA SELECTION ET A L'ETUDE DE CRISTAUX POLYTYPIQUES.LEGENDRE JJ; MORET R; TRONC E et al.1975; J. APPL. CRYSTALLOGR.; DENM.; DA. 1975; VOL. 8; NO 3; PP. 352-355; ABS. ANGL.; BIBL. 3 REF.Article

CONVERGENT-BEAM ELECTRON DIFFRACTION SYMMETRY FROM A DISORDERED STRUCTURE (CE,TA)TA₆O₁₉JOHNSON AWS; GATEHOUSE BM.1980; ACTA CRYSTALLOGR., B; ISSN 0567-7408; DNK; DA. 1980; VOL. 36; NO 3; PP. 523-526; BIBL. 5 REF.Article

MICROSCOPIE ELECTRONIQUE A FAISCEAU HOMOCENTRIQUE: OBSERVATION D'UNE DISLOCATIONBEAUVILLAIN J.1980; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1980; VOL. 60; NO 1; PP. 209-214; ABS. ENG; BIBL. 9 REF.Article

DETERMINATION OF STRUCTURE FACTORS OF GERMANIUM BY THE CRITICAL-VOLTAGE AND CONVERGENT-BEAM DIFFRACTION METHODS.SHISHIDO T; TANAKA M.1976; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1976; VOL. 38; NO 2; PP. 453-461; ABS. ALLEM.; BIBL. 29 REF.Article

A METHOD OF ALIGNMENT FOR CONVERGENT BEAM DIFFRACTION IN TEM MODE FOR A JEM-100 C ELECTRON MICROSCOPEWITCOMB MJ.1982; ULTRAMICROSCOPY; ISSN 0304-3991; NLD; DA. 1982; VOL. 7; NO 4; PP. 343-350; BIBL. 10 REF.Article

COHERENT INTERFERENCE IN CONVERGENT-BEAM ELECTRON DIFFRACTION AND SHADOW IMAGINGCOWLEY JM.1979; ULTRAMICROSCOPY; NLD; DA. 1979; VOL. 4; NO 10; PP. 435-449; BIBL. 8 REF.Article

EXPERIENCES WITH THE KULPE-SCHULZ CONVERGENCE CAMERABACKHAUS KO.1983; CRYSTAL RESEARCH AND TECHNOLOGY (1979); ISSN 0232-1300; DDR; DA. 1983; VOL. 18; NO 1; PP. K1-K2; BIBL. 3 REF.Article

DETERMINATIONS OF SPACE GROUP AND OXYGEN COORDINATES IN THE ANTIFERROELECTRIC PHASE OF LEAD ZIRCONATE BY CONVENTIONAL AND CONVERGENT-BEAM ELECTRON DIFFRACTIONTANAKA M; SAITO R; TSUZUKI K et al.1982; JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN; ISSN 0031-9015; JPN; DA. 1982; VOL. 51; NO 8; PP. 2635-2640; BIBL. 25 REF.Article

CRYSTALLOGRAPHIC ANALYSIS IN THE TRANSMISSION ELECTRON MICROSCOPESTOTER LP.1981; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1981; VOL. 16; NO 5; PP. 1356-1366; BIBL. 7 REF.Article

ELECTRON MICRODIFFRACTIONCOWLEY JM.1978; ADV. ELECTRON. ELECTRON PHYS.; USA; DA. 1978; VOL. 46; PP. 1-53; BIBL. 3 P.Article

A COMPARISON OF TECHNIQUES FOR OBTAINING CONVERGENT BEAM ELECTRON DIFFRACTION PATTERNS WITH A JEOL 200 CXLEE KC.1982; ULTRAMICROSCOPY; ISSN 0304-3991; NLD; DA. 1982; VOL. 10; NO 3; PP. 217-222; BIBL. 7 REF.Article

THE DETERMINATION OF EXTINCTION DISTANCES AND ANOMALOUS ABSORPTION COEFFICIENTS BY SCANNING TRANSMISSION ELECTRON MICROSCOPY.BLAKE RG; JOSTONS A; KELLY PM et al.1978; PHILOS. MAG., A; G.B.; DA. 1978; VOL. 37; NO 1; PP. 1-16; BIBL. 28 REF.Article

DESORIENTATION DES BLOCS DANS DES CRISTAUX DE CORINDONBAGDASAROV KH S; BELYKH IG; FEDOROV EA et al.1982; KRISTALLOGRAFIJA; ISSN 0023-4761; SUN; DA. 1982; VOL. 27; NO 1; PP. 207-208; BIBL. 3 REF.Article

CRYSTAL STRUCTURE ANALYSIS OF CA₄YFE₅O₁₃ BY COMBINING 1 MEV HIGH-RESOLUTION ELECTRON MICROSCOPY WITH CONVERGENT-BEAM ELECTRON DIFFRACTIONBANDO Y; SEKIKAWA Y; YAMAMURA H et al.1981; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1981; VOL. 37; NO 5; PP. 723-728; BIBL. 18 REF.Article

HIGHER ORDER LAUE ZONE EFFECTS IN ELECTRON DIFFRACTION AND THEIR USE IN LATTICE PARAMETER DETERMINATION.JONES PM; RACKHAM GM; STEEDS JW et al.1977; PROC. R. SOC. LONDON, A; G.B.; DA. 1977; VOL. 354; NO 1677; PP. 197-222; H.T. 4; BIBL. 33 REF.Article

FOIL THICKNESS MEASUREMENTS FROM CONVERGENT-BEAM DIFFRACTION PATTERNS = MESURES DE L'EPAISSEUR DE LA FEUILLE A PARTIR DES FIGURES DE DIFFRACTION A FAISCEAU CONVERGENTALLEN SM.1981; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1981; VOL. 43; NO 2; PP. 325-335; BIBL. 8 REF.Article

APPLICATION OF ELECTRONICALLY CONTROLLED ILLUMINATION IN THE CONVENTIONAL TRANSMISSION ELECTRON MICROSCOPEKRAKOW W.1978; ULTRAMICROSCOPY; NLD; DA. 1978; VOL. 3; NO 3; PP. 291-301; BIBL. 9 REF.Article

CONVERGENT BEAM ELECTRON MICRODIFFRACTION FROM SMALL CRYSTALS = MICRODIFFRACTION D'UN FAISCEAU D'ELECTRON CONVERGENT A PARTIR DE PETITS CRISTAUXCOWLEY JM; SPENCE JCH.1981; ULTRAMICROSCOPY; ISSN 0304-3991; NLD; DA. 1981; VOL. 6; NO 4; PP. 359-366; BIBL. 8 REF.Article

THREE-DIMENSIONAL STRAIN-FIELD INFORMATION IN CONVERGENT-BEAM ELECTRON DIFFRACTION PATTERNS = INFORMATION SUR LE CHAMP DE DEFORMATION A TROIS DIMENSIONS DANS LES DIAGRAMMES DE DIFFRACTION A FAISCEAU D'ELECTRON CONVERGENTCARPENTER RW; SPENCE JCH.1982; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR. THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1982; VOL. 38; NO 1; PP. 55-61; H.T. 8; BIBL. 15 REF.Article

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