SOLUTION OF LAUE BACK REFLECTION PATTERNS OF SAPPHIRE CRYSTALS USING A COMPUTER TECHNIQUE.ANAZIA C; CHANG OU LEE; JERNER RC et al.1975; METALLURG. TRANS. A; U.S.A.; DA. 1975; VOL. 6; NO 9; PP. 1751-1753; BIBL. 7 REF.Article

X-RAY DIFFRACTION TECHNIQUES FOR THE ANALYSIS OF EPITAXIC THIN FILMS.WALLACE CA; WARD RCC.1975; J. APPL. CRYSTALLOGR.; DENM.; DA. 1975; VOL. 8; NO 5; PP. 545-556; BIBL. 8 REF.Article

THE APPLICATION OF THE PRECESSION METHOD TO THE STUDY OF DEFORMED SINGLE CRYSTALSGARDNER RN; HANSCOM RH.1976; MATER. SCI. ENGNG; NETHERL.; DA. 1976; VOL. 22; NO 2; PP. 167-170; BIBL. 6 REF.Article

COMPUTER-AIDED SPOT INDEXING FOR X-RAY LAUE METHODOHBA R; UEHIRA I; HONTOM T et al.1981; JPN. J. APPL. PHYS.; ISSN 0021-4922; JPN; DA. 1981; VOL. 20; NO 5; PP. 811-816; BIBL. 2 REF.Article

A SIMPLE COMPUTER METHOD FOR THE ORIENTATION OF SINGLE CRYSTALS OF ANY STRUCTURE USING LAUE BACK-REFLECTION X-RAY PHOTOGRAPHSCORNELIUS CA.1981; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1981; VOL. 37; NO 3; PP. 430-436; BIBL. 8 REF.Article

SIMULATION OF X-RAY LAUE PATTERNSPLOC RA.1983; JOURNAL OF MATERIALS SCIENCE; ISSN 0022-2461; GBR; DA. 1983; VOL. 18; NO 4; PP. 1083-1088; BIBL. 6 REF.Article

PROJECTIVE PROPERTIES OF LAUE TOPOGRAPHSMILTAT J; DUPLEY M.1980; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1980; VOL. 13; NO 6; PP. 555-562; BIBL. 4 REF.Article

ALGORITHM FOR SOLVING BACK-REFLECTION LAUE PATTERNS OF CUBIC CRYSTALSRAVINDHRAN KS; SIEGEL HM; JOHNSON RM et al.1979; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1979; VOL. 50; NO 7; PP. 5030-5033; BIBL. 2 REF.Article

CONSTRUCTION DE PROJECTIONS STEREOGRAPHIQUES ET INDEXATION DES DIAGRAMMES DE LAUE DE CRISTAUX NON CUBIQUES DANS N'IMPORTE QUELLE DIRECTIONKRAVETS VA.1978; DOP. AKAD. NAUK UKRAJIN. R.S.R., A; UKR; DA. 1978; NO 10; PP. 948-950; ABS. ENG; BIBL. 5 REF.Article

A SIMPLE METHOD FOR INTERPRETATION OF THE LAUE PATTERNS OF CUBIC CRYSTALS.PANDEY RK.1976; BOL. INST. TONANTZINTLA; MEX.; DA. 1976; VOL. 2; NO 2; PP. 157-159; ABS. ESP.; BIBL. 4 REF.Article

CONSTANT INTENSITY CURVES IN CRITICAL SCATTERING AND VON LAUE DIAGRAMSKOCINSKI J.1979; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1979; VOL. 35; NO 5; PP. 859; BIBL. 14 REF.Article

RELATIONS DE PHASE DANS LES FAISCEAUX INTERFERANT DANS UN INTERFEROMETRE LAUE-LAUE-LAUE A RAYONS XALADZHADZHYAN GM; KOCHARYAN AK; TRUNI KG et al.1979; KRISTALLOGRAFIJA; ISSN 0023-4761; SUN; DA. 1979; VOL. 24; NO 6; PP. 1135-1141; BIBL. 16 REF.Article

BANDES PENDULAIRES DANS LE CAS DE DIFFRACTION DE LAUE-LAUE A 3 ONDESKOZ'MIK VD; KSHEVETSKAYA ML; KSHEVETSKIJ SA et al.1976; KRISTALLOGRAFIJA; S.S.S.R.; DA. 1976; VOL. 21; NO 1; PP. 38-43; BIBL. 7 REF.Article

STANDARD STEREOGRAPHIC PROJECTIONS OF HEMATITE AND RELATED CORUNDUM-TYPE SESQUIOXIDES.DEKKER EHLJ; VROLIJK JWGA.1975; KRISTALL U. TECH.; DTSCH.; DA. 1975; VOL. 10; NO 3; PP. 313-326; ABS. ALLEM.; BIBL. 10 REF.Article

VARIABLE-PATH LAUE MEASUREMENTS AND EXTINCTION.LAWRENCE JL; MATHIESON AM.1977; ACTA CRYSTALLOGR., A; DANEM.; DA. 1977; VOL. 33; NO 2; PP. 288-293; BIBL. 15 REF.Article

Harmonic contributions to WSR-Laue-transmission thin crystal diamond monochromatorsSTEPHENSON, J. D.Physica status solidi. A. Applied research. 1997, Vol 161, Num 2, pp R11-12, issn 0031-8965Article

Ultrasound adjustable Laue-Laue double-crystal x-ray monochromatorPOLIKARPOV, I; PANOV, V. V.Journal of physics. D, Applied physics (Print). 1999, Vol 32, Num 16, pp 2083-2086, issn 0022-3727Article

A GAMMA-RAY LENS FOR NUCLEAR ASTROPHYSICS = UN TÉLESCOPE À LENTILLE DE LAUE POUR L'ASTROPHYSIQUE NUCLÉAIREKohnle, Antje; Von Ballmoos, Peter.1998, 135 p.Thesis

Dynamical theory of X-ray diffraction for the study of crystal surfacesTAKAHASHI, T; NAKATANI, S.Surface science. 1995, Vol 326, Num 3, pp 347-360, issn 0039-6028Article

Formative time determination in nitrogen-filled tube using statistical methodsPEJOVIC, M; ZIVKOVIC, J; MILOSAVLJEVIC, C et al.Japanese journal of applied physics. 1995, Vol 34, Num 3, pp 1652-1656, issn 0021-4922, 1Article

Nanometer spatial resolution achieved in hard X-ray imaging and Laue diffraction experimentsBILDERBACK, D. H; HOFFMAN, S. A; THIEL, D. J et al.Science (Washington, D.C.). 1994, Vol 263, Num 5144, pp 201-203, issn 0036-8075Article

Bent crystals in Laue geometry: dynamical focusing of a polychromatic incident beamMOCELLA, V; GUIGAY, J. P; HRDY, J et al.Journal of applied crystallography. 2004, Vol 37, pp 941-946, issn 0021-8898, 6 p., 6Article

The Lorentz factor for the Laue techniqueLANGE, J.Acta crystallographica. Section A, Foundations of crystallography. 1995, Vol 51, pp 559-565, issn 0108-7673, 4Article

Gamma-ray focusing concentrators for astrophysical observations by crystal diffraction in Laue geometryMELONE, S; FRANCESCANGELI, O; CACIUFFO, R et al.Review of scientific instruments. 1993, Vol 64, Num 12, pp 3467-3473, issn 0034-6748Article

Laue crystallographySUGUNA, K.Current science (Bangalore). 1993, Vol 65, Num 8, pp 616-619, issn 0011-3891Article