COLLECTEUR D'ELECTRONS SECONDAIRES POUR MESURE DE CHAMPS ELECTRIQUES LOCAUX DANS LE MICROSCOPE ELECTRONIQUE A BALAYAGE REM 200FETISOVA TD; POCHTAREV BI.1976; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1976; NO 5; PP. 267-268; BIBL. 8 REF.Article

ENREGISTREMENT QUANTITATIF DES MICROCHAMPS ELECTRIQUES ET MAGNETIQUES DANS UN MICROSCOPE ELECTRONIQUE A BALAYAGERAU EH I; SPIVAK GV; KARELIN NM et al.1978; PRIBORY TEKH. EKSPER.; SUN; DA. 1978; NO 5; PP. 224-226; BIBL. 6 REF.Article

Influence des forts micro-champs sur la composition du gaz ionisé de métaux alcalinsKOVALEV, B. M; ROZANOV, E. K.Teplofizika vysokih temperatur. 1985, Vol 23, Num 2, pp 224-227, issn 0040-3644Article

Thermodynamique d'un plasma imparfait d'hydrogèneKRAVCHENKO, V. A.Teplofizika vysokih temperatur. 1985, Vol 23, Num 2, pp 209-216, issn 0040-3644Article

Low-frequency electric microfield distributions in plasmasIGLESIAS, C. A; DEWITT, H. E; LEBOWITZ, J. L et al.Physical review. A, General physics. 1985, Vol 31, Num 3, pp 1698-1702, issn 0556-2791Article

Electric microfield distributions in multicomponent plasmasIGLESIAS, C. A; LEBOWITZ, J. L.Physical review. A, General physics. 1984, Vol 30, Num 4, pp 2001-2004, issn 0556-2791Article

Effects of individual line shapes on composite profiles and line seriesIGLESIAS, C. A; LEE, R. W; HOOPER, C. F et al.Journal of quantitative spectroscopy & radiative transfer. 1984, Vol 32, Num 3, pp 241-247, issn 0022-4073Article

ELECTRON INTERFEROMETRY WITH A SIEMENS ELMISKOP 102 FOR MEASURING ELECTROMAGNETICAL MICROFIELDS (1)VANZI M.1981; OPTIK (STUTTG.); ISSN 0030-4026; DEU; DA. 1981; VOL. 58; NO 2; PP. 103-124; ABS. GER; BIBL. 15 REF.Article

MESURE DES MICROCHAMPS ELECTRIQUES DANS UN MICROSCOPE ELECTRONIQUE A TRAMEIVANNIKOV VP; LUK'YANOV AE; NOVOZHILOV VP et al.1977; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1977; NO 5; PP. 191-193; BIBL. 7 REF.Article

Temperature effects on low-frequency electric microfields in multicomponent plasmasHELD, B.Physical review. A, General physics. 1985, Vol 31, Num 3, pp 1939-1940, issn 0556-2791Article

Spectroscopic diagnostic of Langmuir turbulence in magnetic fusion plasmasOKS, Eugene.Journal of physics. B. Atomic, molecular and optical physics (Print). 2011, Vol 44, Num 10, issn 0953-4075, 101004.1-101004.4Article

Mean-force-field and mean-spherical approximations for the electric microfield distribution at a charged point in the charged-hard-particles fluidROSENFELD, Y.The Journal of chemical physics. 1989, Vol 90, Num 1, pp 481-482, issn 0021-9606Article

Electric microfield distributions in plasmas of arbitrary degeneracy and densityDHARMA-WARDANA, M. W. C; PERROT, F.Physical review. A, General physics. 1986, Vol 33, Num 5, pp 3303-3313, issn 0556-2791Article

CLUSTER EXPANSION FOR THE ELECTRIC MICROFIELD DISTRIBUTION IN A PLASMAIGLESIAS CA; HOOPER CF JR.1982; PHYS. REV. A; ISSN 0556-2791; USA; DA. 1982; VOL. 25; NO 2; PP. 1049-1059; BIBL. DISSEM.Article

Quantitative Potentialmessungen an Mikrostrukturen mit dem Rasterelektronenmikroskop = Mesures quantitatives de potentiels sur des microstructures à l'aide d'un microscope électronique à balayage = Quantitative measurement of potentials at microstructures with a scanning electron microscopeBRÜMMER, O; RÖDER, A; PHILIPPCZYK, F et al.Experimentelle Technik der Physik. 1984, Vol 32, Num 2, pp 183-189, issn 0014-4924Article

Electric microfield distributions in strongly coupled plasmasIGLESIAS, C. A; LEBOWITZ, J. L; MACGOWAN, D et al.Physical review. A, General physics. 1983, Vol 28, Num 3, pp 1667-1672, issn 0556-2791Article

Octupole inhomogeneity tensor of ion microfield in Debye plasma at ionized emitterHALENKA, J.The European physical journal. D, Atomic, molecular and optical physics (Print). 2009, Vol 53, Num 3, pp 337-342, issn 1434-6060, 6 p.Article

Effective interionic potentials for the calculation of low-frequency electric-microfield distributions in dense plasmasBERNU, B; HANSEN, J. P; MAZIGHI, R et al.Europhysics letters (Print). 1986, Vol 1, Num 6, pp 267-273, issn 0295-5075Article

Diffraction and symmetry corrections to the high-frequency thermal microfield in a dense electron plasmaHELD, B; GOMBERT, M.-M; DEUTSCH, C et al.Physical review. A, General physics. 1985, Vol 31, Num 2, pp 921-931, issn 0556-2791Article

PERFECT SCREENING FOR CHARGED SYSTEMSBLUM L; GRUBER C; LEBOWITZ JL et al.1982; PHYS. REV. LETT.; ISSN 0031-9007; USA; DA. 1982; VOL. 48; NO 26; PP. 1769-1772; BIBL. 8 REF.Article

HYDROGEN STARK BROADENING BY MODEL ELECTRONIC MICROFIELDS.SEIDEL J.1977; Z. NATURFORSCH., A; DTSCH.; DA. 1977; VOL. 32; NO 11; PP. 1195-1206; BIBL. 31 REF.Article

THEORIE DES PERTURBATIONS POUR LES DISTRIBUTIONS DU MICRO-CHAMP DANS UN PLASMA NON IDEALKURILENKOV YU K; FILINOV VS.1980; TEPLOFIZ. VYS. TEMP.; ISSN 0040-3644; SUN; DA. 1980; VOL. 18; NO 3; PP. 433-442; BIBL. 14 REF.Article

ENHANCEMENT OF DIELECTRONIC RECOMBINATION BY PLASMA ELECTRIC MICROFIELDS.JACOBS VL; DAVIS J; KEPPLE PC et al.1976; PHYS. REV. LETTERS; U.S.A.; DA. 1976; VOL. 37; NO 21; PP. 1390-1393; BIBL. 16 REF.Article

METHODES ACTIVES ET PASSIVES DE DIAGNOSTIC DE PLASMAS HORS D'EQUILIBRE AU MOYEN D'UNE SONDE QUADRIPOLAIRE. APPLICATION AUX PLASMAS SPATIAUX.POTTELETTE R.sdCNET-CNRS-CRPE-NT-42; FR.; DA. S.D.; PP. (255P.); BIBL. 3 P.Report

ACTION DES MICRO-CHAMPS ELECTRIQUES SUR LE PROCESSUS DE LA RECOMBINAISON DIELECTRONIQUE DANS LE PLASMAGRIGORIADI AK; FISUN OI.1982; FIZ. PLAZMY; ISSN 0367-2921; SUN; DA. 1982; VOL. 8; NO 4; PP. 776-784; BIBL. 14 REF.Article