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ROTATION BETWEEN MICROGRAPHS FROM THE SCANNING ELECTRON MICROSCOPE AND ELECTRON CHANNELLING PATTERNS.VAN ESSEN CG; VERHOEVEN JD.1974; J. PHYS. E; G.B.; DA. 1974; VOL. 7; NO 9; PP. 768-770; BIBL. 4 REF.Article

LE MICROSCOPE ELECTRONIQUE A BALYAGE MER-3POSTNIKOV EB; FETISOV DV KUSHNIR YU M; POCHTAREV BI et al.1972; IZVEST. AKAD. NAUK S.S.S.R., SER. FIZ.; S.S.S.R.; DA. 1972; VOL. 36; NO 9; PP. 1865-1868; BIBL. 3 REF.Serial Issue

RASTERELEKTRONENMIKROSKOPISCHE BEOBACHTUNGEN AN PINEALEN SIMESZELLEN DER FORELLE, SALMO GAIRDNERI (TELEOSTEI) = OBSERVATIONS AU MICROSCOPE ELECTRONIQUE A BALAYAGE DES CELLULES PHOTORECEPTRICES EPIPHYSAIRES DE LA TRUITE, SALMO GAIRDNERI (TELEOSTEEN)HARTWIG HG; PFAUTSCH M.1973; Z. ZELLFORSCH. MIKR. ANAT.; DTSCH.; DA. 1973; VOL. 138; NO 4; PP. 585-589; ABS. ANGL.; BIBL. 15REF.Article

ENHANCING MICROGRAPHS OBTAINED WITH A SCANNING ACOUSTIC MICROSCOPE USING FALSE-COLOR ENCODINGHAMMER R; HOLLIS RL.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 40; NO 8; PP. 678-680; BIBL. 9 REF.Article

BROAD BANDWIDTH CONCAVE TRANSDUCER FOR SCANNING ACOUSTIC MICROSCOPEKUSHIBIKI J; SANNOMIYA T; CHUBACHI N et al.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 1; PP. 42-44; BIBL. 5 REF.Article

A HIGH RESOLUTION ULTRASONIC MICROSCOPE.PENTTINEN A; LUUKKALA M.1977; ULTRASONICS; G.B.; DA. 1977; VOL. 15; NO 5; PP. 205-210; BIBL. 12 REF.Article

THE USE OF BACKSCATTERED ELECTRONS FOR IMAGING PURPOSES IN A SCANNING ELECTRON MICROSCOPE.CREWE AV; LIN PSD.1976; ULTRAMICROSCOPY; NETHERL.; DA. 1976; VOL. 1; NO 3; PP. 231-238; BIBL. 10 REF.Article

THE OBSERVATION OF CRYSTALLINE MATERIALS IN THE SCANNING ELECTRON MICROSCOPE (SEM).JOY DC.1975; J. MICR.; G.B.; DA. 1975; VOL. 103; NO 1; PP. 1-23; BIBL. 2 P.Article

DYNAMISCHE EXPERIMENTE IM RASTERELEKTRONENMIKROSKOP UNTER VERWENDUNG SPEZIELLER PROBENBUEHNEN. = ETUDES EXPERIMENTALES DYNAMIQUES AVEC UN MICROSCOPE ELECTRONIQUE A BALAYAGE UTILISANT DES PORTE ECHANTILLONS SPECIAUXHOLM R; REINFANDT B.1975; F.U.M.; DTSCH.; DA. 1975; VOL. 83; NO 3; PP. 128-130; BIBL. 38 REF.Article

TOWARDS QUANTITATIVE SCANNING ELECTRON MICROSCOPY.HEYWOOD JA.1975; MICROSCOPE; G.B.; DA. 1975; VOL. 23; NO 1; PP. 47-53Article

A WET STAGE MODIFICATION TO A SCANNING ELECTRON MICROSCOPE.ROBINSON VNE.1975; J. MICR.; G.B.; DA. 1975; VOL. 103; NO 1; PP. 71-77; BIBL. 12 REF.Article

LE MICROSCOPE ELECTRONIQUE A BALAYAGE MER-3 ET SES PERFECTIONNEMENTS ULTERIEURSPOSTNIKOV EB; GOLUBEV VP; POCHTAREV BI et al.1974; IZVEST. AKAD. NAUK S.S.S.R., SER. FIZ.; S.S.S.R.; DA. 1974; VOL. 38; NO 7; PP. 1500-1501; H.T. 1; BIBL. 2 REF.Article

RASTERELEKTRONENMIKROSKOPIE AN HISTOLOGISCHEM MATERIAL = MICROSCOPIE ELECTRONIQUE A BALAYAGE DU MATERIEL HISTOLOGIQUEHUNDEIKER M.1973; ARCH. DERMATOL. FORSCH.; DTSCH.; DA. 1973; VOL. 246; NO 2; PP. 151-154; ABS. ANGL.; BIBL. 14 REF.Serial Issue

PERFECTIONNEMENT DES MICROSCOPES ELECTRONIQUES A BALAYAGEFETISOV DV; KUSHNIR YU M; POSTNIKOV EB et al.1972; IZVEST. AKAD. NAUK S.S.S.R., SER. FIZ.; S.S.S.R.; DA. 1972; VOL. 36; NO 9; PP. 1860-1864; BIBL. 3 REF.Serial Issue

UBER DIE UNTERSUCHUNG VON HAAREN MIT DEM RASTERELEKTRONENMIKROSKOP = DE L'ETUDE DES POILS A L'AIDE DU MICROSCOPE ELECTRONIQUE A BALAYAGESCHNEIDER V.1972; Z. RECHTSMED.; DTSCH.; DA. 1972; VOL. 71; NO 2; PP. 94-103; ABS. ANGL.; BIBL. 1 P. 1/2Serial Issue

THREE-DIMENSIONAL MEASUREMENTS FROM SCANNING ELECTRON MICROGRAPHS BY ELECTRON SCRIBING.SIMON W; EDEN M.1976; REV. SCI. INSTRUM.; U.S.A.; DA. 1976; VOL. 47; NO 4; PP. 443-444; BIBL. 3 REF.Article

PERFECTIONNEMENT DU BLOC DE BALAYAGE DU MICROSCOPE ELECTRONIQUE A BALAYAGE REMP-2SLEDEVSKIJ CH B; TSYBUL'SKIJ VV; BUJKO LD et al.1976; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1976; NO 5; PP. 285-287; BIBL. 2 REF.Article

PHOTOGRAMMETRY AND THE SCANNING ELECTRON MICROSCOPE.BOYDE A; ROSS HF.1975; PHOTOGRAMM. REC.; G.B.; DA. 1975; VOL. 8; NO 46; PP. 408-457; ABS. FR. ALLEM.; BIBL. 3 P.Article

PRATICAL SCANNING ELECTRON MICROSCOPY. ELECTRON AND ION MICROPROBE ANALYSIS.GOLDSTEIN JI; YAKOWITZ H; NEWBURY DE et al.1975; NEW YORK; PLENUM PRESS; DA. 1975; PP. (600P.); BIBL. DISSEM.Book

ANALYTICAL MODELS FROM PARALLEL BEAMS OF RAYS.KRATKY V.1975; IN: SYMP. CLOSE-RANGE PHOTOGR. SYST.; CHAMPAIGN, ILL.; 1975; FALLS CHURCH, VA.; AM. SOC. PHOTOGR.; DA. 1975; PP. 477-499; BIBL. 1 REF.Conference Paper

CHARGING EFFECT OF SPECIMEN IN SCANNING ELECTRON MICROSCOPY.ICHINOKAWA T; IIYAMA M; ONOGUCHI A et al.1974; JAP. J. APPL. PHYS.; JAP.; DA. 1974; VOL. 13; NO 8; PP. 1272-1277; BIBL. 4 REF.Article

CONTRAST REVERSALS OF PSEUDO-KIKUCHI BAND AND LINES DUE TO DETECTOR POSITION IN SCANNING ELECTRON MICROSCOPY.ICHINOKAWA T; MISHIMURA M; WADA H et al.1974; J. PHYS. SOC. JAP.; JAP.; DA. 1974; VOL. 36; NO 1; PP. 221-226; BIBL. 23 REF.Article

OBSERVED SINGLE ATOM ELASTIC CROSS SACTIONS IN A SCANNING ELECTRON MICROSCOPE.RETSKY M.1974; OPTIK; DTSCH.; DA. 1974; VOL. 41; NO 2; PP. 127-142; ABS. ALLEM.; BIBL. 30 REF.Article

SCANNING TRANSMISSION ELECTRON MICROSCOPY AT HIGH RESOLUTION.WALL J; LANGMORE J; ISAACSON M et al.1974; PROC. NATION. ACAD. SCI. U.S.A.; U.S.A.; DA. 1974; VOL. 71; NO 1; PP. 1-5; BIBL. 16 REF.Article

TECHNIQUE TO EXAMINE SURFACE FEATURES IN PROFILE USING THE SEM.WOODS RT.1974; REV. SCI. INSTRUM.; U.S.A.; DA. 1974; VOL. 45; NO 10; PP. 1292-1293; BIBL. 3 REF.Article

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