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Results 1 to 25 of 195

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FIELD EMISSION AND TRANSMISSION ELECTRON MICROSCOPY OF CARBURIZATION OF TUNGSTEN SINGLE CRYSTALS.OKUYAMA F.1975; PHILOS. MAG.; G.B.; DA. 1975; VOL. 31; NO 5; PP. 1201-1208; BIBL. 10 REF.Article

CARACTERISATION DE SURFACE POUR MICROSCOPIE IONIQUE ET MICROSCOPIE ELECTRONIQUE A EMISSION CHAMPNAKAMURA S.1975; OYO BUTURI; JAP.; DA. 1975; VOL. 44; NO 12; PP. 1312-1319; BIBL. 1 P. 1/2Article

IONIZATION PROBABILITY CALCULATIONS IN FIELD ION MICROSCOPE.IWASAKI H; NAKAMURA S.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 43; NO 1; PP. 301-305; BIBL. 4 REF.Article

MICROSCOPE A EMISSION AVEC TELEVISIONGURKOV YU V; DRUZHININ AV; ISAEV AA et al.1974; IZVEST. AKAD. NAUK S.S.S.R. SER. FIZ.; S.S.S.R.; DA. 1974; VOL. 38; NO 11; PP. 2264-2269; BIBL. 10 REF.; (IX VSES. KONF. EHLEKTRON. MIKROSK. II. VSES. SIMP. RASTROVOJ EHLEKTRON. MIKROSK. MATER.; TBILISSI; 1973)Conference Paper

ETUDE DE LA DEGRADATION DES DIODES LASERS EN ARSENIURE DE GALLIUM DANS UN MICROSCOPE ELECTRONIQUE A PHOTO-EMISSIONKURBATOV LN; KRAPUKHIN VV; KAGAN NB et al.1974; IZVEST. AKAD. NAUK S.S.S.R., SER. FIZ.; S.S.S.R.; DA. 1974; VOL. 38; NO 11; PP. 2275-2278; H.T. 4; BIBL. 7 REF.; (IX VSES. KONF. EHLEKTRON. MIKROSK. II VSES. SIMP. RASTROVOJ EHLEKTRON. MIKROSK. MATER.; TBILISSI; 1973)Conference Paper

ANALYSE AU MOYEN D'UN MICROSCOPE ELECTRONIQUE A EMISSION DE CHAMP DE LA DESORPTION DE L'OXYDE DE SILICIUM SUR LE TUNGSTENEBOBEV K; MIREVA Z; BOYADZHIJSKA M et al.1972; IZVEST. INST. ELEKTRON., SOFIJA; BALG.; DA. 1972; VOL. 6; PP. 19-27; ABS. RUSSE ANGL.; BIBL. 11 REF.Serial Issue

IS THE FIELD ION MICROSCOPE A DESORPTION MICROSCOPE.RENDULIC KD; KRAUTZ E.1975; ACTA PHYS. AUSTR.; AUTR.; DA. 1975; VOL. 42; NO 3-4; PP. 357-366; ABS. ALLEM.; BIBL. 22 REF.Article

SYSTEMES DE POMPAGES D'ULTRAVIDE POUR MICROSCOPES ELECTRONIQUES EMISSIFSISAEV AA.1972; IZVEST. AKAD. NAUK S.S.S.R., SER. FIZ.; S.S.S.R.; DA. 1972; VOL. 36; NO 9; PP. 1957-1960; BIBL. 17 REF.Serial Issue

INCREASED IMAGE BRIGHTNESS CAUSED BY FIELD ADSORPTION IN FIELD-ION MICROSCOPY. II. EFFECTS OF FIELD DISTORTIONS IN ATOMIC ORBITALS.NOLAN DA; HERMAN RM.1974; PHYS. REV., B; U.S.A.; DA. 1974; VOL. 10; NO 1; PP. 50-54; BIBL. 10 REF.Article

BEMERKUNGEN ZUR TIEFENSCHAERFE IM EMISSIONS-ELEKTRONENMIKROSKOP. = REMARQUES SUR LA PROFONDEUR DU CHAMP DANS LE MICROSCOPE ELECTRONIQUE A EMISSIONSOA EA.1974; EXPER. TECH. PHYS.; DTSCH.; DA. 1974; VOL. 22; NO 5; PP. 463-466; ABS. ANGL.; BIBL. 4 REF.Article

DEVELOPMENT AND APPLICATION OF A 50 KEV FIELD-ION MICROSCOPEBRANDON DG; MELMED AJ.1972; NATION. BUR. STAND., TECH. NOTE; U.S.A.; DA. 1972; NO 721; PP. 66Serial Issue

LE MICROSCOPE ELECTRONIQUE A PHOTOEMISSIONDANNOHL HD.1972; VIDE; FR.; DA. 1972; NO 158, SUPPL; PP. 302-303Serial Issue

MICROSCOPE ELECTRONIQUE EMISSIF A CATHODE A LA TERRENAZAROV MV; DYUKOV VG; SEDOV NN et al.1972; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1972; NO 5; PP. 219-221; BIBL. 4 REF.Serial Issue

FIELD CALIBRATION USING THE ENERGY DISTRIBUTION OF FIELD IONIZATIONSAKURAI T; MULLER EW.1973; PHYS. REV. LETTERS; U.S.A.; DA. 1973; VOL. 30; NO 12; PP. 532-535; BIBL. 17 REF.Serial Issue

THE EFFECT OF NEON ON HELIUM ION IMAGING IN THE FIELD ION MICROSCOPEJANSSEN AP; JONES JP.1972; SURF. SCI.; NETHERL.; DA. 1972; VOL. 33; NO 3; PP. 553-564; BIBL. 17 REF.Serial Issue

USE OF CHANNEL-PLATE INTENSIFIERS IN THE FIELD-ION MICROSCOPETURNER PJ; CARTWRIGHT P; BOYES ED et al.1972; ADV. ELECTRON. ELECTRON. PHYS.; U.S.A.; DA. 1972; VOL. 33B; PP. 1077-1087; BIBL. 5 REF.Serial Issue

REALISATION D'UN MICROSCOPE IONIQUE A CHAMPMENAND A; MARTIN C; GALLOT J et al.1972; REV. PHYS. APPL.; FR.; DA. 1972; VOL. 7; NO 3; PP. 177-180; ABS. ANGL.; BIBL. 11 REF.Serial Issue

PHOTOEMISSIONS. ELEKTRONENMIKROSKOPIE. GRUNDLAGEN UND SPEZIELLE ANWENDUNGEN. = MICROSCOPIE ELECTRONIQUE A EMISSION PHOTOELECTRONIQUE. PRINCIPES ET APPLICATIONS SPECIALESWEGMANN L.1977; MIKROSKOPIE; OESTERR.; DA. 1977; VOL. 32; NO 11-12; PP. 376-381; ABS. ANGL.; BIBL. 3 REF.Article

COMPUTER SIMULATION OF FIELD ELECTRON IMAGESSUVOROV AL; RAZINKOVA TL; KUZNETSOV VA et al.1975; SURF. SCI.; NETHERL.; DA. 1975; VOL. 52; NO 3; PP. 697-702; BIBL. 6 REF.Article

MICROSCOPE A AUTODESORPTIONNIKONENKOV NV; KHLYNTSEV VP; POTAPOV LP et al.1980; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1980; NO 3; PP. 221-223; BIBL. 6 REF.Article

DER EINFLUSS VON LOCH- UND RINGBLENDEN AUF DIE ENERGIEVERTEILUNG DER ELEKTRONEN IM EMISSIONS-ELEKTRONENMIKROSKOP. = L'INFLUENCE DE DIAPHRAGMES EN FORME DE TROU ET D'ANNEAU SUR LA DISTRIBUTION DE L'ENERGIE DES ELECTRONS DANS LE MICROSCOPE ELECTRONIQUE PAR EMISSIONSCHWARZER R.1975; OPTIK; DTSCH.; DA. 1975; VOL. 44; NO 1; PP. 61-78; ABS. ANGL.; BIBL. 30 REF.Article

HIGH-RESOLUTION HIGH-CONTRAST ELECTRON MICROSCOPY.KING JG; COLEMAN JW.1974; MASSACHUSETTS INST. TECHNOL., RES. LAB. ELECTRON., QUART. PROGR. REP.; U.S.A.; DA. 1974; NO 114; PP. 11-12Article

PHOTOEMISSION ELECTRON MICROSCOPY: APPLICATION TO AN ORDER/DISORDER REACTION.IRANI RS; CAHN RW.1974; J. MATER. SCI.; G.B.; DA. 1974; VOL. 9; NO 7; PP. 1209-1211; BIBL. 5 REF.Article

EMISSION THERMOPHOTOELECTRONIQUE DU SYSTEME MO-BAOSHISHKIN BB; BURIBAEV I.1974; RADIOTEKH. I ELEKTRON.; S.S.S.R.; DA. 1974; VOL. 19; NO 10; PP. 2150-2156; BIBL. 15 REF.Article

FIELD IONIZATION PROCESSES IN FIELD ION MICROSCOPYIWASAKI H; NAKAMURA S.1972; SURF. SCI.; NETHERL.; DA. 1972; VOL. 33; NO 3; PP. 525-534; BIBL. 14 REF.Serial Issue

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