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kw.\*:("MICROSCOPE HAUTE TENSION")

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NEUE ELEKTRONENMIKROSKOPE = NOUVEAUX MICROSCOPES ELECTRONIQUES1973; SCHWEIZ. BAUZTG; SCHWEIZ; DA. 1973; VOL. 91; NO 8; PP. 179-181Serial Issue

EXPERIENCES IN SITU DANS LE MICROSCOPE 1MV. I: METHODES PHYSIQUES = IN SITU EXPERIMENTS IN 1MV MICROSCOP. I PHYSICAL METHODSVALLE R; GENTY B; MARRAUD A et al.1980; RECH. AEROSP.; ISSN 0034-1223; FRA; DA. 1980; NO 1; PP. 39-61; ABS. ENG; BIBL. 56 REF.Article

APPLICATION DE LA MICROSCOPIE ELECTRONIQUE HAUTE TENSION A LA PHYSIQUE DU SOLIDEBOUNDARENKO GG; BYSTROV LN; IVANOV LI et al.1975; USP. FIZ. NAUK; S.S.S.R.; DA. 1975; VOL. 116; NO 2; PP. 303-314; BIBL. 44 REF.Article

EMISKOP 102, EIN NEUES HOCHLEISTUNGS-ELEKTRONENMIKROSKOP = ELMISKOP 102, UN NOUVEAU MICROSCOPE ELECTRONIQUE DE GRANDE CAPACITEMULLER KH; SCHLIEPE R.1973; SIEMENS Z.; DTSCH.; DA. 1973; VOL. 47; NO 6; PP. 471-475; BIBL. 6 REF.Serial Issue

NEUE ELEKTRONENMIKROSKOPE = NOUVEAUX MICROSCOPES ELECTRONIQUES1973; SCHWEIZ. BAUZTG; SCHWEIZ; DA. 1973; VOL. 91; NO 8; PP. 179-181Serial Issue

CANON ELECTRONIQUE A TENSION ACCELERATRICE DE 200 KVSHULYAK EH A; STOYANOV PA.1972; IZVEST. AKAD. NAUK S.S.S.R., SER. FIZ.; S.S.S.R.; DA. 1972; VOL. 36; NO 6; PP. 1281-1283; BIBL. 5 REF.Serial Issue

ETUDE ET CALCUL DES CARACTERISTIQUES OPTIQUES DE L'OBJECTIF-CONDENSEUR D'UN MICROSCOPE ELECTRONIQUE A TENSION ACCELERATRICE DE 300 KVMOSEEV VV; STOYANOV PA; MAKAROVA IS et al.1972; IZVEST. AKAD. NAUK S.S.S.R., SER. FIZ.; S.S.S.R.; DA. 1972; VOL. 36; NO 6; PP. 1275-1280; BIBL. 10 REF.Serial Issue

CONDENSEUR D'UN MICROSCOPE ELECTRONIQUE A HAUTE TENSIONRENSKIJ IS; STOYANOV PA.1972; IZVEST. AKAD. NAUK S.S.S.R., SER. FIZ.; S.S.S.R.; DA. 1972; VOL. 36; NO 6; PP. 1284-1288; BIBL. 2 REF.Serial Issue

HIGH-VOLTAGE ELECTRON MICROSCOPY IN THE UK.HIRSCH PB.1974; RES. POLICY; NETHERL.; DA. 1974; VOL. 3; NO 1; PP. 78-87; BIBL. 3 REF.Article

HIGH VOLTAGE ELECTRON MICROSCOPY OF ENVIRONMENTAL REACTIONSFLOWER HM.1973; J. MICR.; G.B.; DA. 1973; VOL. 97; NO 1-2; PP. 171-190; BIBL. 3 P. 1/2Serial Issue

ELEKTRONENMIKROSKOPE = LE MICROSCOPE ELECTRONIQUERIECKE WD.1973; V.D.I.-Z.; DTSCH.; DA. 1973; VOL. 115; NO 3; PP. 223-229; BIBL. 1 P. 1/2Serial Issue

ELEKTRONENMIKROSKOPE = LE MICROSCOPE ELECTRONIQUERIECKE WD.1973; V.D.I.-Z.; DTSCH.; DA. 1973; VOL. 115; NO 3; PP. 223-229; BIBL. 1 P. 1/2Serial Issue

LE MICROSCOPE ELECTRONIQUE INDUSTRIEL EM-150 A TENSION ACCELERATRICE DE 150 KVBARZILOVICH PP; STOYANOV PA; SHULYAK EH A et al.1972; IZVEST. AKAD. NAUK S.S.S.R., SER. FIZ.; S.S.S.R.; DA. 1972; VOL. 36; NO 6; PP. 1272-1274; BIBL. 9 REF.Serial Issue

CALCUL DU CONTRASTE DE DIFFRACTION DES IMAGES DE MONOCRISTAUX EN FONCTION DE LA TENSION ACCELERATRICE DES ELECTRONS.DUVAL H; DUVAL P; HENRY L et al.1974; C.R. ACAD. SCI., B; FR.; DA. 1974; VOL. 279; NO 15; PP. 383-386; BIBL. 5 REF.Article

BRIGHTNESS MEASUREMENT OF 500 KV ELECTRON MICROSCOPE GUNSHIMOYAMA H; OHSHITA A; MARUSE S et al.1972; J. ELECTRON MICR.; JAP.; DA. 1972; VOL. 21; NO 2; PP. 119-125; BIBL. 19 REF.Serial Issue

SPATIAL DEPENDENCE OF VOID GROWTH RATES IN THE IRRADIATION OF THIN FOILS. THEORY AND CALCULATIONS.GUTHRIE GL; STRAALSUND JL.1975; SCRIPTA METALLURG.; E.U.; DA. 1975; VOL. 9; NO 11; PP. 1149-1152; BIBL. 7 REF.Article

ESTIMATION OF THE VALUE OF HIGH VOLTAGE MICROSCOPY.MCLEAN D.1974; METALS AND MATER.; G.B.; DA. 1974; VOL. 8; NO 6; PP. 304-306 (2P.); BIBL. 1 REF.Article

SCHERZER'S FORMULA AND THE CORRECTION OF SPIRAL DISTORTION IN THE ELECTRON MICROSCOPE.MARAI FZ; MULVEY T.1977; ULTRAMICROSCOPY; NETHERL.; DA. 1977; VOL. 2; NO 2-3; PP. 187-192; BIBL. 7 REF.Article

DISCUSSION ON A MAGNETIC ENERGY ANALYSER USED FOR VERY HIGH VOLTAGE ELECTRON MICROSCOPY (1 MV AND 3 MV). = DISCUSSION SUR UN ANALYSEUR D'ENERGIE MAGNETIQUE UTILISE POUR LA MICROSCOPIE ELECTRONIQUE A TRES HAUTE TENSION (1 MV ET 3 MV)PEREZ JP; SEVELY GZJ; JOUFFREY B et al.1975; OPTIK; DTSCH.; DA. 1975; VOL. 43; NO 5; PP. 487-494; ABS. FR. ALLEM.; BIBL. 6 REF.Article

3 MILLION VOLT ELECTRON MICROSCOPEOZASA S; KATO Y; TODOKORO H et al.1972; J. ELECTRON MICR.; JAP.; DA. 1972; VOL. 21; NO 2; PP. 109-118; BIBL. 9 REF.Serial Issue

CARACTERISTIQUES OPTIQUES ELECTRONIQUES D'UN CANON ELECTRONIQUE A 2 ETAGES A TENSION D'ACCELERATION DE 200 KVSTOYANOV PA; RENSKIJ IS; SHULYAK EH A et al.1975; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1975; NO 3; PP. 193-195; BIBL. 5 REF.Article

ADAPTATION OF A MAGNETIC FILTERING DEVICE ON A ONE MEGAVOLT ELECTRON MICROSCOPE. = ADAPTATION D'UN FILTRE MAGNETIQUE SUR UN MICROSCOPE ELECTRONIQUE D'UN MEGAVOLTZANCHI G; PEREZ JP; SEVELY J et al.1975; OPTIK; DTSCH.; DA. 1975; VOL. 43; NO 5; PP. 495-501; ABS. FR. ALLEM.; BIBL. 9 REF.Article

ABERRATION CORRECTION FOR HIGH-VOLTAGE ELECTRON MICROSCOPY.MOSES RW JR.1974; PROC. R. SOC. LONDON, A; G.B.; DA. 1974; VOL. 339; NO 1619; PP. 483-512; BIBL. 1 P.Article

APPLICATIONS OF MANY BEAM SYSTEMATIC DIFFRACTION CONTRAST IN HIGH VOLTAGE TRANSMISSION ELECTRON MICROSCOPY.CHEN LJ; THOMAS G.1974; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1974; VOL. 25; NO 1; PP. 193-204; ABS. ALLEM.; BIBL. 26 REF.Article

APPLICATIONS A LA METALLURGIE DE QUELQUES METHODES EXPERIMENTALES NOUVELLES. REUNION; VOREPPE; 1974.sd; S.L.; SOC. FR. METALL.; DA. S.D.; PP. (23P.); BIBL. DISSEM.Conference Paper

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