Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:("MICROSCOPE TRANSMISSION")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Origin

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 798

  • Page / 32
Export

Selection :

  • and

IL MICRASCOPIO ELETTRONICO A TRASMISSIONE = LE MICROSCOPE ELECTRONIQUE A TRANSMISSIONVILLA M.1972; ELETTROTECNICA; ITAL.; DA. 1972; VOL. 59; NO 10; PP. 1016-1024; ABS. ANGL.; BIBL. 9 REF.Serial Issue

ACOUSTIC MICROSCOPYNONGAILLARD B.1980; LECTURE NOTES PHYS.; DEU; DA. 1980; NO 112; PP. 423-431; BIBL. 8 REF.Conference Paper

NEW FUNCTIONS OF MODEL H-500. HIGH-PERFORMANCE ELECTRON MICROSCOPE.KUBOZOE M; KIMURA C; KAMIMURA S et al.1976; HITACHI REV.; JAP.; DA. 1976; VOL. 25; NO 3; PP. 117-122; BIBL. 4 REF.Article

SINGLE LENS TRANSMISSION SCANNING ACOUSTIC MICROSCOPEMOROZOV AI; KULAKOV MA.1980; ELECTRON LETTERS; GBR; DA. 1980; VOL. 16; NO 15; PP. 596-597; BIBL. 8 REF.Article

OPTIMIZATION OF A TRANSMISSION ACOUSTIC MICROSCOPE.BRIDOUX E; NONGAILLARD B; ROUVAEN JM et al.1978; J. APPL. PHYS.; U.S.A.; DA. 1978; VOL. 49; NO 2; PP. 574-579; BIBL. 4 REF.Article

DAS RASTER-ELEKTRONENMIKROSKOP: PRINZIP, AUSFUEHRUNGSBEISPIEL, ANWENDUNGEN = MICROSCOPE ELECTRONIQUE A ECRAN: PRINCIPE, EXEMPLE DE REALISATION, APPLICATIONSKUSCHECK D.1972; ELEKTRONIK; DTSCH.; DA. 1972; VOL. 21; NO 12; PP. 415-428 (7 P.); BIBL. 9 REF.Serial Issue

TRANSMISSION ELECTRON MICROSCOPY OBSERVATIONS OF P-N JUNCTIONS.MERLI PG; MISSIROLI GF; POZZI G et al.1975; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1975; VOL. 30; NO 2; PP. 699-711; ABS. ALLEM.; BIBL. 17 REF.Article

DELINEATION OF SHALLOW JUNCTIONS IN SILICON BY TRANSMISSION ELECTRON MICROSCOPYSHENG TT; MARCUS RB.1981; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1981; VOL. 128; NO 4; PP. 881-884; BIBL. 10 REF.Article

NEUE MIKROSKOP-PHOTOMETER. = NOUVEAU PHOTOMETRE POUR MICROSCOPE1976; G.I.T., FACHZ. LAB.; DTSCH.; DA. 1976; VOL. 20; NO 1; PP. 48.Article

CONDENSER UNDERFOCUS VS OVERFOCUS IN THE TRANSMISSION ELECTRON MICROSCOPE (TEM).WITTELS ND.1975; MASSACHUSETTS INST. TECHNOL., R.L.E. PROGR. REP.; U.S.A.; DA. 1975; NO 115; PP. 28-32; BIBL. 4 REF.Article

BOND INTEGRITY EVALUATION USING TRANSMISSION SCANNING ACOUSTIC MICROSCOPYSINCLAIR DA; ASH EA.1980; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1980; VOL. 16; NO 23; PP. 880-882; BIBL. 5 REF.Article

COURBE UNIVERSELLE DE GROSSISSEMENT POUR LE MICROSCOPE ELECTRONIQUE A TRANSMISSIONPILYANKEVICH AN; KLIMOVITSKIJ AM; BELODED RM et al.1977; ZAVODSK. LAB.; S.S.S.R.; DA. 1977; VOL. 43; NO 11; PP. 1365-1366; BIBL. 2 REF.Article

SPECIMEN HOLDER FOR ENERGY DISPERSIVE X-RAY ANALYSIS IN THE TRANSMISSION ELECTRON MICROSCOPE.SPRYS JW.1975; REV. SCI. INSTRUM.; U.S.A.; DA. 1975; VOL. 46; NO 6; PP. 773-774Article

SUPERPOSITION OF CHROMATIC ERROR AND BEAM BROADENING IN TRANSMISSION ELECTRON MICROSCOPY OF THICK CARBON AND ORGANIC SPECIMENS.REIMER L; GENTSCH P.1975; ULTRAMICROSCOPY; NETHERL.; DA. 1975; VOL. 1; NO 1; PP. 1-5; BIBL. 20 REF.Article

ADJUSTABLE SLOT OBJECTIVE APERTURE DEVICE FOR CONTRAST EXPERIMENTS IN THE ELECTRON MICROSCOPE.STOBBS WM; VALDRE U.1975; J. PHYS. E.; G.B.; DA. 1975; VOL. 8; NO 10; PP. 881-884; BIBL. 8 REF.Article

DETERMINATION OF THE NON-LOCALIZATION OF THE INELASTIC SCATTERING OF ELECTRONS BY ELECTRON MICROSCOPY.ISAACSON M; LANGMORE JP; ROSE H et al.1974; OPTIK; DTSCH.; DA. 1974; VOL. 41; NO 1; PP. 92-96; ABS. ALLEM.; BIBL. 5 REF.Article

INTERSTITIAL SUPERSATURATION AND CLIMB OF MISFIT DISLOCATIONS IN PHOSPHORUS-DIFFUSED SILICONSTRUNK H; GOESELE U; KOLBESEN BO et al.1980; J. MICR.; GBR; DA. 1980; VOL. 118; NO 1; PP. 35-39; BIBL. 20 REF.Article

NEUES KONZEPT BEIM BAU VON MIKROSKOPEN = NOUVEAU CONCEPT DANS LA CONSTRUCTION D'UN MICROSCOPE1980; G.I.T., FACHZ. LAB.; DEU; DA. 1980; VOL. 24; NO 1; PP. 64-65Article

MICROSCOPE ELECTRONIQUE STROBOSCOPIQUE POUR LA REGION DE LA SUBNANOSECONDE, PAR TRANSMISSIONGOLUBKOV VV; KOLOTOV OS; PETROV VI et al.1976; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1976; NO 1; PP. 185-187; BIBL. 7 REF.Article

2 1/2 D ELECTRON MICROSCOPY: THROUGH-FOCUS DARK-FIELD IMAGE SHIFTS.BELL WL.1976; J. APPL. PHYS.; U.S.A.; DA. 1976; VOL. 47; NO 4; PP. 1676-1682; BIBL. 19 REF.Article

CHROMATIC ABERRATION IN THE TRANSMISSION ELECTRON MICROSCOPE.KAMITA Y; UCHIKAWA Y.1975; J. ELECTRON MICR.; JAP.; DA. 1975; VOL. 24; NO 4; PP. 219-226; BIBL. 11 REF.Article

CRYSTO-HOLOGRAPHY.BATES RHT; LEWITT RM.1975; OPTIK; DTSCH.; DA. 1975; VOL. 44; NO 1; PP. 1-16; ABS. ALLEM.; BIBL. 9 REF.Article

STRAHLENGANG ZUR STRUKTURANALYSE VON EINKRISTALLEN DURCH ELEKTRONEN-TRANSMISSIONS-DOPPELWINKELRASTERUNG. = MARCHE DES FAISCEAUX POUR L'ANALYSE DE LA STRUCTURE DE MONOCRISTAUX PAR DOUBLE BALAYAGE ANGULAIRE ELECTRONIQUE PAR TRANSMISSIONMOLLENSTEDT G; MEYER HR.1975; OPTIK; DTSCH.; DA. 1975; VOL. 42; NO 5; PP. 487-490; ABS. ANGL.; BIBL. 4 REF.Article

IMAGE FORMATION IN OPTICAL AND ELECTRON TRANSMISSION MICROSCOPY.BARNETT ME.1974; J. MICR.; G.B.; DA. 1974; VOL. 102; NO 1; PP. 1-28; BIBL. 20 REF.Article

INTERSTITIAL SUPERSATURATION NEAR PHOSPHORUS-DIFFUSED EMITTER ZONES IN SILICONSTRUNK H; GOSELE U; KOLBESEN BO et al.1979; APPL. PHYS. LETTERS; USA; DA. 1979; VOL. 34; NO 8; PP. 530-532; BIBL. 17 REF.Article

  • Page / 32