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IMAGES DES ATOMES DANS UN MICROSCOPE ELECTRONIQUE A TRANSMISSION PARFAITVOROB'EV YU V; ZHUKOV VA.1974; IZVEST. AKAD. NAUK S.S.S.R., SER. FIZ.; S.S.S.R.; DA. 1974; VOL. 38; NO 7; PP. 1362-1364; BIBL. 4 REF.Article

AN APPLICATION OF THE HILBERT TRANSFORM IN ELECTRON MICROSCOPY. II. NON-ITERATIVE SOLUTION IN BRIGHT-FIELD MICROSCOPY AND THE DARK-FIELD PROBLEM.MISELL DL; GREENAWAY AH.1974; J. PHYS. D; G.B.; DA. 1974; VOL. 7; NO 12; PP. 1660-1669; BIBL. 29 REF.Article

SINGLE ATOM IMAGE CONTRAST. CONVENTIONAL DARK-FIELD AND BRIGHT-FIELD ELECTRON MICROSCOPY.WAH CHIU; GLAESER RM.1975; J. MICR.; G.B.; DA. 1975; VOL. 103; NO 1; PP. 33-54; BIBL. 25 REF.Article

INFLUENCE OF NON-SYSTEMATIC REFLEXIONS ON WEAK-BEAM AND HIGH-RESOLUTION BRIGHT-FIELD IMAGES IN HIGH-VOLTAGE ELECTRON MICROSCOPY.SANDSTROM R; MELANDER A; ERIKSSON L et al.1974; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1974; VOL. 26; NO 1; PP. 273-284; ABS. ALLEM.; BIBL. 10 REF.Article

PROBLEMS IN THE SIMULATION OF DARK-FIELD IMAGES IN X-RAY TOPOGRAPHY AND ELECTRON MICROSCOPY.EPELBOIN Y.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 4; PP. 355-356; BIBL. 7 REF.Article

EQUILIBRIUM STRUCTURE OF SMALL GOLD CRYSTALSSOLLIARD C; BUFFAT P; FAES F et al.1976; J. CRYST. GROWTH; NETHERL.; DA. 1976; VOL. 32; NO 1; PP. 123-125; BIBL. 10 REF.Article

STRONG- AND WEAK-BEAM CONTRAST FROM CUBOIDAL INCLUSIONS.MELANDER A.1976; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1976; VOL. 33; NO 1; PP. 255-264; ABS. ALLEM.; BIBL. 15 REF.Article

CONTRASTE AU MICROSCOPE ELECTRONIQUE DES IMAGES DES DISLOCATIONS COIN ET MIXTE DANS LES CRISTAUX COVALENTSMYSHLYAEV MM; KHODOS II; DAVYDOVA LB et al.1975; FIZ. TVERD. TELA; S.S.S.R.; DA. 1975; VOL. 17; NO 12; PP. 3519-3528; BIBL. 14 REF.Article

VARIATION OF ELECTRON MICROSCOPIC THICKNESS FRINGES OF ALUMINIUM SINGLE CRYSTALS WITH ENERGY LOSS.KUWABARA S; UEFUJI T.1975; J. PHYS. SOC. JAP.; JAP.; DA. 1975; VOL. 38; NO 4; PP. 1090-1097; BIBL. 43 REF.Article

ADDITIONAL IMAGE PEAKS IN THE HIGH RESOLUTION IMAGING OF DISLOCATIONS.HUMPHREYS CJ; DRUMMOND RA; HART DAVIS A et al.1977; PHILOS. MAG.; G.B.; DA. 1977; VOL. 34; NO 6; PP. 1543-1555; BIBL. 22 REF.Article

WEAK-BEAM AND HIGH-RESOLUTION BRIGHT-FIELD CONTRAST FROM MISFITTING SPHERICAL INCLUSIONS.MELANDER A; SANDSTROEM R.1975; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1975; VOL. 30; NO 2; PP. 647-658; ABS. ALLEM.; BIBL. 23 REF.Article

MOTIF DETECTION IN QUANTUM NOISE-LIMITED ELECTRONS MICROGRAPHS BY CROSS-CORRELATION.SAXTON WO; FRANK J.1977; ULTRAMICROSCOPY; NETHERL.; DA. 1977; VOL. 2; NO 2-3; PP. 219-227; BIBL. 13 REF.Article

OBSERVATION OF DATTICE-CONSERVATING TWINS BY ELECTRON MICROSCOPY. STUDY OF THE IMAGE CONTRASTS.NIHOUL BOUTANG G; BOULESTEIX C.1976; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1976; VOL. 34; NO 1; PP. 331-338; ABS. FR.; BIBL. 4 REF.Article

LATTICE FRINGES FROM AMORPHOUS GE: FACT OR ARTEFACT.MCFARLANE SC; COCHRAN W.1975; J. PHYS. C; G.B.; DA. 1975; VOL. 8; NO 9; PP. 1311-1321; BIBL. 12 REF.Article

DISSOCIATION OF DISLOCATIONS IN SPINELS (AL2O3)1.8MGO.DOUKHAN N; ESCAIG B.1974; J. PHYS.; FR.; DA. 1974; VOL. 35; NO 10; PP. L.181-L.184; ABS. FR.; BIBL. 11 REF.Article

ON THE SHAPE OF THE PARTIALLY COHERENT ATTENUATION ENVELOPE IN BRIGHT FIELD TRANSMISSION ELECTRON MICROSCOPYBONNET N; BONHOMME P.1980; OPTIK (STUTTG.); ISSN 0030-4026; DEU; DA. 1980; VOL. 56; NO 4; PP. 353-362; ABS. GER; BIBL. 14 REF.Article

DETERMINATION DU TYPE DES BOUCLES ET DIPOLES DE DISLOCATION INCLINES A L'AIDE DES AUREOLES ENTOURANT LES IMAGES EN CHAMP CLAIRROZHANSKIJ VN; RAGIMOV IA; SHEERSHMIDT K et al.1981; FIZ. TVERD. TELA; ISSN 0367-3294; SUN; DA. 1981; VOL. 23; NO 1; PP. 256-261; BIBL. 7 REF.Article

ANALYTICAL DESCRIPTION OF THE ELECTRON MICROSCOPE DIFFRACTION CONTRAST OF LATTICE DEFECTS IN THE TWO-BEAM CASEKATERBAU KH.1981; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1981; VOL. 43; NO 2; PP. 409-426; BIBL. 32 REF.Article

COMPARISON OF HOLLOW CONE AND AXIAL BRIGHT FIELD ELECTRON MICROSCOPE IMAGING TECHNIQUESFREEMAN LA; HOWIE A; MISTRY AB et al.1980; J. MICR.; GBR; DA. 1980; VOL. 119; NO 1; PP. 3-18; BIBL. 31 REF.Article

A CALCULATION OF BRIGHT FIELD SINGLE-ATOM IMAGES IN STEM WITH HALF PLANE DETECTORSDEKKERS NH; DE LANG H.1978; OPTIK; DEU; DA. 1978; VOL. 51; NO 1; PP. 83-92; ABS. GER; BIBL. 5 REF.Article

THE FORMATION AND INTERPRETATION OF DEFECT IMAGES FROM CRYSTALLINE MATERIALS IN A SCANNING TRANSMISSION ELECTRON MICROSCOPE.MAHER DM; JOY DC.1976; ULTRAMICROSCOPY; NETHERL.; DA. 1976; VOL. 1; NO 3; PP. 239-253; BIBL. 28 REF.Article

EFFECT OF THROUGH-FOCUSING ON THE BRIGHT AND DARK FIELD MOLECULAR IMAGES IN HIGH RESOLUTION ELECTRON MICROSCOPY.ISHIZUKA K; UYEDA N.1975; BULL. INST. CHEM. RES., KYOTO UNIV.; JAP.; DA. 1975; VOL. 53; NO 2; PP. 200-215; BIBL. 22 REF.Article

DIGITAL RECONSTRUCTION OF BRIGHT FIELD PHASE CONTRAST IMAGES FROM HIGH RESOLUTION ELECTRON MICROGRAPHSKIRKLAND EJ; SIEGEL BM; UYEDA N et al.1980; ULTRAMICROSCOPY; ISSN 0304-3991; NLD; DA. 1980; VOL. 5; NO 4; PP. 479-503; BIBL. 54 REF.Article

ELECTRON MICROSCOPE STUDY OF MICROTWINS IN EPITAXIAL SILICON FILMS ON SAPPHIRELIHL R; OPPOLZER H; PONGRATZ P et al.1980; J. MICR.; GBR; DA. 1980; VOL. 118; NO 1; PP. 89-95; BIBL. 7 REF.Article

ON IMAGE CONTRAST FROM SINGLE-ELECTRON EXCITATIONZANCHI G; SEVELY J.1980; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1980; VOL. 41; NO 3; PP. 417-430; BIBL. 21 REF.Article

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