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ELECTRON MICROSCOPE IMAGES OF STACKING FAULTS OBTAINED UNDER STRONG MULTI-BEAM DIFFRACTION CONDITIONS.BOTROS KZ; SHEININ SS.1975; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1975; VOL. 31; NO 2; PP. 625-632; ABS. ALLEM.; BIBL. 12 REF.Article

AN APPLICATION OF THE HILBERT TRANSFORM IN ELECTRON MICROSCOPY. II. NON-ITERATIVE SOLUTION IN BRIGHT-FIELD MICROSCOPY AND THE DARK-FIELD PROBLEM.MISELL DL; GREENAWAY AH.1974; J. PHYS. D; G.B.; DA. 1974; VOL. 7; NO 12; PP. 1660-1669; BIBL. 29 REF.Article

DIFFUSE SCATTERING IN WEAK-BEAM IMAGES.GAI PL; HOWIE A.1975; PHILOS. MAG.; G.B.; DA. 1975; VOL. 31; NO 3; PP. 519-528; BIBL. 14 REF.Article

ANALYSIS OF THE INTERACTION OF THICKNESS EXTINCTION CONTOURS AND DISLOCATIONS IN WEAK-BEAM ELECTRON MICROSCOPY.SCHAPINK FW.1975; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1975; VOL. 29; NO 2; PP. 623-634; ABS. ALLEM.; BIBL. 7 REF.Article

DISSOCIATION OF NEAR-SCREW DISLOCATIONS IN GERMANIUM AND SILICON.GOMEZ A; COCKAYNE DJH; HIRSCH PB et al.1975; PHILOS. MAG.; G.B.; DA. 1975; VOL. 31; NO 1; PP. 105-113; BIBL. 5 REF.Article

EFFECTS OF A NON-SYSTEMACTIC REFLECTION ON THICKNESS EXTINCTION CONTOURS IN DARK-FIELD IMAGES. I. EXPERIMENTAL RESULTS AND COMPARISON WITH MULTI-BEAM THEORY.CANN CD; SHEININ SS.1974; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1974; VOL. 26; NO 1; PP. 193-199; ABS. ALLEM.; BIBL. 16 REF.Article

DARK FIELD ACOUSTIC MICROSCOPYSINCLAIR DA; SMITH IR.1980; ELECTRON. LETTERS; GBR; DA. 1980; VOL. 16; NO 16; PP. 627-629; BIBL. 7 REF.Article

BEND-CONTOUR PATTERNS FROM BUCKLED SPECIMENSSHANNON MD; EADES JA.1979; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1979; VOL. 40; NO 1; PP. 125-129; BIBL. 3 REF.Article

DISLOCATION CONTRAST FROM PHONON-SCATTERED ELECTRONS IN WEAK-BEAM IMAGES.MELANDER A; SANDSTROM R.1975; ACTA CRYSTALLOGR., A; DANEM.; DA. 1975; VOL. 31; NO 1; PP. 116-125; BIBL. 21 REF.Article

ENANTIOMORPHOUS ORDERED DOMAINS IN STOECHIOMETRIC LITHIUM ALUMINATE LIAL5O8.PORTIER R; LEFEBVRE S; FAYARD M et al.1975; MATER. RES. BULL.; U.S.A.; DA. 1975; VOL. 10; NO 9; PP. 883-888; BIBL. 8 REF.Article

INFLUENCE OF NON-SYSTEMATIC REFLEXIONS ON WEAK-BEAM AND HIGH-RESOLUTION BRIGHT-FIELD IMAGES IN HIGH-VOLTAGE ELECTRON MICROSCOPY.SANDSTROM R; MELANDER A; ERIKSSON L et al.1974; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1974; VOL. 26; NO 1; PP. 273-284; ABS. ALLEM.; BIBL. 10 REF.Article

WEAK BEAM MICROSCOPY OF GRAIN BOUNDARIES.JONES AR; HOWELL PR; RALPH B et al.1976; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1976; VOL. 33; NO 1; PP. 107-117; ABS. ALLEM.; BIBL. 13 REF.Article

EFFECTS OF A NON-SYSTEMATIC REFLECTION ON THICKNESS EXTINCTION CONTOURS IN DARK-FIELD IMAGES. II. CONTRAST MECHANISMS AND THEORETICAL ANALYSIS.CANN CD; SHEININ SS.1974; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1974; VOL. 26; NO 2; PP. 681-689; ABS. ALLEM.; BIBL. 6 REF.Article

ELECTRODECORATION OF TILT GRAIN BOUNDARIES IN POTASSIUM BROMIDE BICRYSTALS. I. BOUNDARY STRUCTURE.HARRIS LB; QUANG PG.1975; PHILOS. MAG.; G.B.; DA. 1975; VOL. 32; NO 6; PP. 1213-1225; BIBL. 15 REF.Article

SINGLE ATOM IMAGE CONTRAST. CONVENTIONAL DARK-FIELD AND BRIGHT-FIELD ELECTRON MICROSCOPY.WAH CHIU; GLAESER RM.1975; J. MICR.; G.B.; DA. 1975; VOL. 103; NO 1; PP. 33-54; BIBL. 25 REF.Article

DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON MICROSCOPY.CHERNS D.1974; PHILOS. MAG.; G.B.; DA. 1974; VOL. 30; NO 3; PP. 549-556; BIBL. 17 REF.Article

MISFIT DISLOCATIONS IN HETEROEPITAXIAL SI ON SAPPHIRE.ABRAHAMS MS; BUIOCCHI CJ; CORBOY JF JR et al.1976; APPL. PHYS. LETTERS; U.S.A.; DA. 1976; VOL. 28; NO 5; PP. 275-277; BIBL. 15 REF.Article

STRONG- AND WEAK-BEAM CONTRAST FROM CUBOIDAL INCLUSIONS.MELANDER A.1976; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1976; VOL. 33; NO 1; PP. 255-264; ABS. ALLEM.; BIBL. 15 REF.Article

NON-PARALLEL DISSOCIATION OF DISLOCATIONS IN THIN FOILS.HAZZIEDINE PM; KARNTHALER HP; WINTNER E et al.1975; PHILOS. MAG.; G.B.; DA. 1975; VOL. 32; NO 1; PP. 81-97; BIBL. 17 REF.Article

WEAK-BEAM TECHNIQUE FOR ELECTRON MICROSCOPIC OBSERVATION OF ATOMIC STEPS ON THIN SINGLE-CRYSTAL SURFACES.KAMBE K; LEHMPFUHL G.1975; OPTIK; DTSCH.; DA. 1975; VOL. 42; NO 2; PP. 187-194; ABS. ALLEM.; BIBL. 5 REF.Article

CONTRASTE AU MICROSCOPE ELECTRONIQUE DES IMAGES DES DISLOCATIONS COIN ET MIXTE DANS LES CRISTAUX COVALENTSMYSHLYAEV MM; KHODOS II; DAVYDOVA LB et al.1975; FIZ. TVERD. TELA; S.S.S.R.; DA. 1975; VOL. 17; NO 12; PP. 3519-3528; BIBL. 14 REF.Article

MOTIF DETECTION IN QUANTUM NOISE-LIMITED ELECTRONS MICROGRAPHS BY CROSS-CORRELATION.SAXTON WO; FRANK J.1977; ULTRAMICROSCOPY; NETHERL.; DA. 1977; VOL. 2; NO 2-3; PP. 219-227; BIBL. 13 REF.Article

Z-DISCRIMINATION BY REAL-SPACE MEASUREMENTS IN DARK, FIELD S.T.E.M.BURGE RE; DEROME M.1976; OPTIK; DTSCH.; DA. 1976; VOL. 46; NO 2; PP. 161-182; ABS. ALLEM.; BIBL. 20 REF.Article

THE WEAK-BEAM TECHNIQUE AS APPLIED TO DISSOCIATION MEASUREMENTS.COCKAYNE DJH.1974; J. PHYS., COLLOQ.; FR.; DA. 1974; VOL. 35; NO 7; PP. 141-148; ABS. FR.; BIBL. 25 REF.; (COLLOQ. DISSOCIATION DISLOCATIONS. EXPO. COMMUN.; BEAUNE, FR.; 1974)Conference Paper

STRUKTURANALYSE DURCH DIREKTE BEOBACHTUNG VON ATOMEN MIT DUNKELFEFD-TRANSMISSIONSELEKTRONENMIKROSKOPIE. = ANALYSE DE LA STRUCTURE PAR OBSERVATION DIRECTE D'ATOMES AVEC LA MICROSCOPIE ELECTRONIQUE PAR TRANSMISSION EN CHAMP SOMBREWHITING RF; OTTENSMEYER FP; NACHOD FC et al.1974; ANGEW. CHEM.; DTSCH.; DA. 1974; VOL. 86; NO 16; PP. 587-588; BIBL. 4 REF.Article

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