ELECTRON MICROSCOPE IMAGES OF STACKING FAULTS OBTAINED UNDER STRONG MULTI-BEAM DIFFRACTION CONDITIONS.BOTROS KZ; SHEININ SS.1975; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1975; VOL. 31; NO 2; PP. 625-632; ABS. ALLEM.; BIBL. 12 REF.Article

DIFFUSE SCATTERING IN WEAK-BEAM IMAGES.GAI PL; HOWIE A.1975; PHILOS. MAG.; G.B.; DA. 1975; VOL. 31; NO 3; PP. 519-528; BIBL. 14 REF.Article

ANALYSIS OF THE INTERACTION OF THICKNESS EXTINCTION CONTOURS AND DISLOCATIONS IN WEAK-BEAM ELECTRON MICROSCOPY.SCHAPINK FW.1975; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1975; VOL. 29; NO 2; PP. 623-634; ABS. ALLEM.; BIBL. 7 REF.Article

DISSOCIATION OF NEAR-SCREW DISLOCATIONS IN GERMANIUM AND SILICON.GOMEZ A; COCKAYNE DJH; HIRSCH PB et al.1975; PHILOS. MAG.; G.B.; DA. 1975; VOL. 31; NO 1; PP. 105-113; BIBL. 5 REF.Article

EFFECTS OF A NON-SYSTEMACTIC REFLECTION ON THICKNESS EXTINCTION CONTOURS IN DARK-FIELD IMAGES. I. EXPERIMENTAL RESULTS AND COMPARISON WITH MULTI-BEAM THEORY.CANN CD; SHEININ SS.1974; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1974; VOL. 26; NO 1; PP. 193-199; ABS. ALLEM.; BIBL. 16 REF.Article

DARK FIELD ACOUSTIC MICROSCOPYSINCLAIR DA; SMITH IR.1980; ELECTRON. LETTERS; GBR; DA. 1980; VOL. 16; NO 16; PP. 627-629; BIBL. 7 REF.Article

BEND-CONTOUR PATTERNS FROM BUCKLED SPECIMENSSHANNON MD; EADES JA.1979; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1979; VOL. 40; NO 1; PP. 125-129; BIBL. 3 REF.Article

ENANTIOMORPHOUS ORDERED DOMAINS IN STOECHIOMETRIC LITHIUM ALUMINATE LIAL₅O₈.PORTIER R; LEFEBVRE S; FAYARD M et al.1975; MATER. RES. BULL.; U.S.A.; DA. 1975; VOL. 10; NO 9; PP. 883-888; BIBL. 8 REF.Article

INFLUENCE OF NON-SYSTEMATIC REFLEXIONS ON WEAK-BEAM AND HIGH-RESOLUTION BRIGHT-FIELD IMAGES IN HIGH-VOLTAGE ELECTRON MICROSCOPY.SANDSTROM R; MELANDER A; ERIKSSON L et al.1974; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1974; VOL. 26; NO 1; PP. 273-284; ABS. ALLEM.; BIBL. 10 REF.Article

ELECTRODECORATION OF TILT GRAIN BOUNDARIES IN POTASSIUM BROMIDE BICRYSTALS. I. BOUNDARY STRUCTURE.HARRIS LB; QUANG PG.1975; PHILOS. MAG.; G.B.; DA. 1975; VOL. 32; NO 6; PP. 1213-1225; BIBL. 15 REF.Article

SINGLE ATOM IMAGE CONTRAST. CONVENTIONAL DARK-FIELD AND BRIGHT-FIELD ELECTRON MICROSCOPY.WAH CHIU; GLAESER RM.1975; J. MICR.; G.B.; DA. 1975; VOL. 103; NO 1; PP. 33-54; BIBL. 25 REF.Article

DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON MICROSCOPY.CHERNS D.1974; PHILOS. MAG.; G.B.; DA. 1974; VOL. 30; NO 3; PP. 549-556; BIBL. 17 REF.Article

MOTIF DETECTION IN QUANTUM NOISE-LIMITED ELECTRONS MICROGRAPHS BY CROSS-CORRELATION.SAXTON WO; FRANK J.1977; ULTRAMICROSCOPY; NETHERL.; DA. 1977; VOL. 2; NO 2-3; PP. 219-227; BIBL. 13 REF.Article

Z-DISCRIMINATION BY REAL-SPACE MEASUREMENTS IN DARK, FIELD S.T.E.M.BURGE RE; DEROME M.1976; OPTIK; DTSCH.; DA. 1976; VOL. 46; NO 2; PP. 161-182; ABS. ALLEM.; BIBL. 20 REF.Article

THE WEAK-BEAM TECHNIQUE AS APPLIED TO DISSOCIATION MEASUREMENTS.COCKAYNE DJH.1974; J. PHYS., COLLOQ.; FR.; DA. 1974; VOL. 35; NO 7; PP. 141-148; ABS. FR.; BIBL. 25 REF.; (COLLOQ. DISSOCIATION DISLOCATIONS. EXPO. COMMUN.; BEAUNE, FR.; 1974)Conference Paper

STRUKTURANALYSE DURCH DIREKTE BEOBACHTUNG VON ATOMEN MIT DUNKELFEFD-TRANSMISSIONSELEKTRONENMIKROSKOPIE. = ANALYSE DE LA STRUCTURE PAR OBSERVATION DIRECTE D'ATOMES AVEC LA MICROSCOPIE ELECTRONIQUE PAR TRANSMISSION EN CHAMP SOMBREWHITING RF; OTTENSMEYER FP; NACHOD FC et al.1974; ANGEW. CHEM.; DTSCH.; DA. 1974; VOL. 86; NO 16; PP. 587-588; BIBL. 4 REF.Article

RESOLUTION OF M₂₃C₆/AUSTENITE PHASE BOUNDARY DEFECT STRUCTURES BY WEAK BEAM MICROSCOPYNILSSON JO; DUNLOP GL.1979; J. MICR.; GBR; DA. 1979; VOL. 115; NO 3; PP. 235-242; BIBL. 15 REF.Article

THE STUDY OF FAULTED DIPOLES IN COPPER USING WEAK-BEAM ELECTRON MICROSCOPYCARTER CB; HOLMES SM.1975; PHILOS. MAG.; G.B.; DA. 1975; VOL. 32; NO 3; PP. 599-614; BIBL. 22 REF.Article

ON THE QUESTION OF MICROCRYSTALLITES IN SOME AMORPHOUS MATERIALS. AN ELECTRON MICROSCOPE INVESTIGATION.HERD SR; CHAUDHARI P.1974; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1974; VOL. 26; NO 2; PP. 627-642; ABS. ALLEM.; BIBL. 16 REF.Article

RECIPROCITY BETWEEN THE REFLECTION ELECTRON MICROSCOPE AND THE LOW-LOSS SCANNING ELECTRON MICROSCOPEWELLS OC.1980; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 37; NO 6; PP. 507-510; BIBL. 22 REF.Article

WEAK-BEAM ELECTRON MICROSCOPY OF FAULTED DIPOLES IN DEFORMED SILICON.WINTER AT; MAHAJAN S; BRASEN D et al.1978; PHILOS. MAG., A; G.B.; DA. 1978; VOL. 37; NO 3; PP. 315-326; BIBL. 15 REF.Article

ADDITIONAL IMAGE PEAKS IN THE HIGH RESOLUTION IMAGING OF DISLOCATIONS.HUMPHREYS CJ; DRUMMOND RA; HART DAVIS A et al.1977; PHILOS. MAG.; G.B.; DA. 1977; VOL. 34; NO 6; PP. 1543-1555; BIBL. 22 REF.Article

STRUCTURE OF THE <0110> DISLOCATION IN SAPPHIRE.BILDES NONORENSEN JB; THOLEN AR; GOOCH DJ et al.1976; PHILOS. MAG.; G.B.; DA. 1976; VOL. 33; NO 6; PP. 877-889; BIBL. 12 REF.Article

OBSERVATION OF TWIN FAULTS IN SPUTTER-DEPOSITED HIGH-PURITY NICKELWANG R; DAHLGREN SD.1975; J. MATER. SCI.; G.B.; DA. 1975; VOL. 10; NO 8; PP. 1456-1458; BIBL. 4 REF.Article

WEAK-BEAM AND HIGH-RESOLUTION BRIGHT-FIELD CONTRAST FROM MISFITTING SPHERICAL INCLUSIONS.MELANDER A; SANDSTROEM R.1975; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1975; VOL. 30; NO 2; PP. 647-658; ABS. ALLEM.; BIBL. 23 REF.Article