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FIELD EMISSION MICROSCOPY OF AIBV COATED TUNGSTEN MONOCRYSTALKANEV VG; BOBEV KS; MIREVA ZD et al.1972; C.R. ACAD. BULG. SCI.; BULG.; DA. 1972; VOL. 25; NO 8; PP. 1029-1032; BIBL. 7 REF.Serial Issue

FIELD ION MICROSCOPE STUDIES OF ATOMIC DISPLACEMENT PROCESSES ON METAL SURFACES.BASSETT DW; CHUNG CK; TICE D et al.1975; VIDE; FR.; DA. 1975; VOL. 30; NO 176; PP. 39-43; ABS. FR.; BIBL. 23 REF.Article

ETUDE AU MICROSCOPE IONIQUE A EMISSIONS DE CHAMP DE LA PLASTICITE DUE AUX INTERSTITIELS DE MICROCRISTAUX DE TUNGSTENEMIKHAJLOVSKIJ IM; DRANOVA ZH I.1972; ZH. EKSPER. TEOR. FIZ.; S.S.S.R.; DA. 1972; VOL. 63; NO 2; PP. 567-572; H.T. 1; ABS. ANGL.; BIBL. 16 REF.Serial Issue

MODIFICATIONS TO THE CAMECA ION ANALYSERJACKSON CK.1978; J. MICR. SPECTROSC. ELECTRON.; FRA; DA. 1978; VOL. 3; NO 5; PP. 491-493; BIBL. 1 REF.Article

SCANNING TRANSMISSION PROTON MICROSCOPY OF HUMAN METAPHASE CHROMOSOMES AT LOW RESOLUTION: NO CATASTROPHIC DAMAGE.ESCOVITZ WH; FOX TR; LEVI SETTI R et al.1975; ULTRAMICROSCOPY; NETHERL.; DA. 1975; VOL. 1; NO 1; PP. 79-82; BIBL. 6 REF.Article

OBSERVATION OF FIELD ADSORPTION OF MOLECULAR HYDROGENSAKURAI T; TSONG TT.1974; J. PHYS. SOC. JAP.; JAP.; DA. 1974; VOL. 37; NO 5; PP. 1478; BIBL. 7 REF.Article

STUDY OF INTERFACES BY FIELD-ION MICROSCOPYSMITH DA.1973; PHILOS. MAG.; G.B.; DA. 1973; VOL. 27; NO 5; PP. 1169-1173; BIBL. 24 REF.Serial Issue

SURFACE SELF-DIFFUSION AT CRYOGENIC TEMPERATURES: RH ON RHAYRAULT G; EHRLICH G.1972; J. CHEM. PHYS.; U.S.A.; DA. 1972; VOL. 57; NO 4; PP. 1788-1789; BIBL. 3 REF.Serial Issue

ON THE QUANTITATIVE ANALYSIS OF FIELD-ION MICROGRAPHSWILKES TJ; GDW; SMITH DA et al.1974; METALLOGRAPHY; U.S.A.; DA. 1974; VOL. 7; NO 5; PP. 403-430; BIBL. 14 REF.Article

A MODEL SYSTEM FOR THE STUDY OF THE SURFACE PROPERTIES OF METAL POWDERSSMITH GDW; CRANSTOUN GKL.1972; POWDER METALLURGY; G.B.; DA. 1972; VOL. 15; NO 30; PP. 101-114; BIBL. 16 REF.Serial Issue

IMAGE OVERLAP IN FIELD-ION MICROSCOPY.INAL OT; MURR LE.1974; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1974; VOL. 23; NO 1; PP. K1-K2; H.T. 2; BIBL. 4 REF.Article

DIGITAL IMAGE PROCESSING FOR IMAGE QUANTIFICATION IN ION MICROSCOPE ANALYSIS = TRAITEMENT NUMERIQUE DES IMAGES POUR LA QUANTIFICATION DE L'IMAGE EN ANALYSE PAR MICROSCOPIE IONIQUEDRUMMER DM; MORRISON GH.1980; ANAL. CHEM. (WASH.); ISSN 0003-2700; USA; DA. 1980; VOL. 52; NO 13; PP. 2147-2152; BIBL. 33 REF.Article

A TIME OF FLIGHT ATOM-PROBE FIELD-ION MICROSCOPE FOR THE STUDY OF DEFECTS IN METALSHALL TM; WAGNER A; BERGER AS et al.1976; SCRIPTA METALLURG.; E.U.; DA. 1976; VOL. 10; NO 5; PP. 485-488; BIBL. 9 REF.Article

THE FRACTURE OF FIELD-ION MICROSCOPE SPECIMENSWILKES TJ; TITCHMARSH JM; SMITH GDW et al.1972; J. PHYS. D; G.B.; DA. 1972; VOL. 5; NO 12; PP. 2226-2230; H.T. 4; BIBL. 13 REF.Serial Issue

ADSORPTION OF CARBON MONOXIDE ON RUTHENIUM = ADSORPTION DE CO SUR RUCHARKABORTTY S; GRENGA HE.1973; J. APPL. PHYS.; U.S.A.; DA. 1973; VOL. 44; NO 1; PP. 500-501; BIBL. 10 REF.Serial Issue

INTERPRETATION DES IMAGES AU MICROSCOPE IONIQUE PAR EMISSION DE CHAMP. DISLOCATIONSSUVOROV AL; RAZINKOVA TL.1975; KRISTALLOGRAFIJA; S.S.S.R.; DA. 1975; VOL. 20; NO 3; PP. 599-606; BIBL. 18 REF.Article

COMPUTER SIMULATION OF ION IMAGES AS AN AID TO INDEXING SMALL CRYSTALLITES.CETRONIO A; JONES JP; MARTIN AD et al.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 44; NO 1; PP. 293-296; BIBL. 3 REF.Article

FIELD-ION MICROSCOPY OF TEMPERED MARTENSITERANGANATHAN BN; GRENGA HE.1974; PHILOS. MAG.; G.B.; DA. 1974; VOL. 30; NO 1; PP. 161-169; BIBL. 17 REF.Article

INCREASED IMAGE BRIGHTNESS CAUSED BY FIELD ADSORPTION IN FIELD-ION MICROSCOPY. II. EFFECTS OF FIELD DISTORTIONS IN ATOMIC ORBITALS.NOLAN DA; HERMAN RM.1974; PHYS. REV., B; U.S.A.; DA. 1974; VOL. 10; NO 1; PP. 50-54; BIBL. 10 REF.Article

FELDIONENMIKROSKOPIE BEI HOEHEREN TEMPERATUREN = MICROSCOPIE IONIQUE A EFFET DE CHAMP A HAUTE TEMPERATUREPOLANSCHUTZ W; KRAUTZ E.1974; Z. METALLKDE; DTSCH.; DA. 1974; VOL. 65; NO 10; PP. 623-626; ABS. ANGL.; BIBL. 6 REF.Article

FIELD-ION MICROSCOPE IMAGES OF FE-CU ALLOYNAKAMURA S; KURODA T.1973; JAP. J. APPL. PHYS.; JAP.; DA. 1973; VOL. 12; NO 1; PP. 159-160; BIBL. 4 REF.Serial Issue

A MOIRE INTERPRETATION OF FIELD-ION MICROSCOPYWALLS JM; LEIFER I; SOUTHWORTH HN et al.1973; PHILOS. MAG.; G.B.; DA. 1973; VOL. 27; NO 4; PP. 915-927; BIBL. 13 REF.Serial Issue

DISSOCIATED DISLOCATIONS IN FIELD-ION MICROSCOPE IMAGES OF IRIDIUM AND IRIDIUM-BASED ALLOYSPAGE TF; RALPH B.1972; PHILOS. MAG.; G.B.; DA. 1972; VOL. 26; NO 3; PP. 601-616; BIBL. 19 REF.Serial Issue

SURFACE MICROSCOPY AND ANALYSIS WITH THE ATOMPROBE FIELD-ION MICROSCOPETURNER PJ; REGAN BJ; SOUTHON MJ et al.1972; VACUUM; G.B.; DA. 1972; VOL. 22; NO 10; PP. 443-446; BIBL. 11 REF.Serial Issue

ETUDE AU MICROSCOPE IONIQUE DE LA DYNAMIQUE DES SURFACESBUTSLOV MM; BOBKOV AF; GRISHIN ND et al.1972; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1972; NO 6; PP. 204-206; BIBL. 10 REF.Serial Issue

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