FIELD-ION MICROSCOPE IMAGES OF FE-CU ALLOYNAKAMURA S; KURODA T.1973; JAP. J. APPL. PHYS.; JAP.; DA. 1973; VOL. 12; NO 1; PP. 159-160; BIBL. 4 REF.Serial Issue

A MOIRE INTERPRETATION OF FIELD-ION MICROSCOPYWALLS JM; LEIFER I; SOUTHWORTH HN et al.1973; PHILOS. MAG.; G.B.; DA. 1973; VOL. 27; NO 4; PP. 915-927; BIBL. 13 REF.Serial Issue

ETUDE AU MICROSCOPE IONIQUE DE LA DYNAMIQUE DES SURFACESBUTSLOV MM; BOBKOV AF; GRISHIN ND et al.1972; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1972; NO 6; PP. 204-206; BIBL. 10 REF.Serial Issue

ENERGY SPECTRUM OF FIELD IONIZATION AT A SINGLE ATOMIC SITEMULLER EW; KRISHNASWAMY SV.1973; SURF. SCI.; NETHERL.; DA. 1973; VOL. 36; NO 1; PP. 29-47; BIBL. 32 REF.Serial Issue

THE OCCURRENCE OF FIELD-INDUCED SURFACE VACANCIES ON IRIDIUM FIELD-ION MICROSCOPE SPECIMENTSPAGE TF; RALPH B.1973; SURF. SCI.; NETHERL.; DA. 1973; VOL. 36; NO 1; PP. 9-28; BIBL. 29 REF.Serial Issue

EFFECTS OF LOCAL FIELD VARIATIONS ON THE CONTRAST OF A FIELD-ION MICROSCOPEHOMEIER HHH; KINGHAM DR.1983; JOURNAL OF PHYSICS D: APPLIED PHYSICS; ISSN 0022-3727; GBR; DA. 1983; VOL. 16; NO 6; PP. L115-L120; BIBL. 8 REF.Article

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TECHNIQUES FOR FIELD-ION MICROSCOPY OF COPPER, GOLD AND ALUMINIUMBOYES ED; JOUTHON MJ.1972; VACUUM; G.B.; DA. 1972; VOL. 22; NO 10; PP. 447-451; BIBL. 8 REF.Serial Issue

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THE TOPOGRAPHY OF GRAIN BOUNDARIESHOWELL PR; PAGE TF; RALPH B et al.sdIN: GRAIN BOUNDARY STRUCT. CONF. LONDON, 1971; LONDON; INST. METALL.; DA. S.D.; PP. 28-37; BIBL. 9 REF.Conference Paper

COMPUTERS IN FIELD ION MICROSCOPY (REVIEW)SUVOROV AL; RAZINKOVA TL; SOKOLOV AG et al.1980; PHYS. STATUS SOLIDI, SECT. A, APPL. RES.; DDR; DA. 1980-09-16; VOL. 61; NO 1; PP. 11-52; BIBL. 146 REF.Article

FIELD-ION ATOM PROBE ANALYSISTURNER PJ; REGAN BJ; SOUTHON MJ et al.1973; SURF. SCI.; NETHERL.; DA. 1973; VOL. 35; PP. 336-344; BIBL. 8 REF.; (SOLID-VAC. INTERFACE. PROC. 2ND. SYMP. SURF. PHYS.; ENSCHEDE, NETH.; 1972)Conference Paper

FIELD-ION MICROSCOPY OF OSMIUMMELMED AJ; CARROLL JJ.1973; J. LESS-COMMON METALS; NETHERL.; DA. 1973; VOL. 30; NO 2; PP. 199-204; BIBL. 11 REF.Serial Issue

A CONTROLLED SPECIMEN PREPARATION TECHNIQUE FOR INTERFACE STUDIES WITH ATOM-PROBE FIELD-ION MICROSCOPYHENJERED A; NORDEN H.1983; JOURNAL OF PHYSICS E: SCIENTIFIC INSTRUMENTS; ISSN 0022-3735; GBR; DA. 1983; VOL. 16; NO 7; PP. 617-619; BIBL. 5 REF.Article

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FIELD ION MICROSCOPY OF TANTALUM AND NIOBIUM AT LOW RESIDUAL GAS PRESSURESKRAUTZ E; HAIML G.1981; Z. METALLKD.; DEU; DA. 1981-02; VOL. 72; NO 2; PP. 116-119; BIBL. 16 REF.Article

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