PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON X-RAY AND VUV SYNCHROTRON RADIATION INSTRUMENTATION, DESY, HAMBURG, FRG, AUGUST 9-13, 1982KOCH EE ED.1983; NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH; ISSN 0167-5087; NLD; DA. 1983; VOL. 208; NO 1-3; XVI-865 P.; BIBL. DISSEM.Conference Paper

EVALUATION OF THE GAS-PUFF Z PINCH AS AN X-RAY LITHOGRAPHY AND MICROSCOPY SOURCEBAILEY J; ETTINGER Y; FISHER A et al.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 40; NO 1; PP. 33-35; BIBL. 11 REF.Article

NOUVELLE UTILISATION DES PLAQUES A MICROCANAUXBELYAEV BF; GUSHCHIN VA; EFANOV VP et al.1980; OPT.-MEH. PROM.; ISSN 0030-4042; SUN; DA. 1980; NO 7; PP. 34-36; BIBL. 8 REF.Article

A HOLOGRAPHIC COMPUTING STEP FOR IMAGE DISPLAY IN X-RAY CRYSTALLOGRAPHYSTROKE GW; HALIOUA M; VENOGOPAL SRINIVASAN et al.1978; OPTIK; DEU; DA. 1978; VOL. 51; NO 4; PP. 353-359; ABS. GER; BIBL. 13 REF.Article

DIE MIKROCHEMISCHE UNTERSUCHUNG DER INHOMOGENITAET UND DER GEFUEGEVERAENDERUNGEN BEI VERFORMUNGSVORGAENGEN IN VERBUNDWERKSTOFFEN MIT DEN METHODEN DER ROENTGENSCHATTENMIKROSKOPIE, DER HOCHTEMPERATURMETALLOGRAPHIE UND DER RASTER-ELEKTRONEN STRAHLMIKROANALYSE. = ETUDE MICROCHIMIQUE DE L'INHOMOGENEITE ET DES ALTERATIONS STRUCTURALES AU COURS DES PROCESSUS DE DEFORMATION, PAR LES METHODES DE MICROSCOPIE DE RAYONS X A EFFET D'OMBRE, METALLOGRAPHIE A HAUTE TEMPERATURE ET MICROANALYSE ELECTRONIQUE A BALAYAGELUTSAU VG; TANANOV AI; STEIN LM et al.1977; MIKROCHIM. ACTA; AUTR.; DA. 1977; VOL. 1; NO 3-4; PP. 271-283; ABS. ANGL.; BIBL. 4 REF.Article

DETERMINATION OF ALUMINIUM COATINGS POROSITY BY MEANS ON CHEMICAL ELEMENTS LOCAL ANALYSISBODNARCHUK VI; RYZHONKOV DI; POLYAKOV VN et al.1982; IZVESTIJA VYSSIH UCEBNYH ZAVEDENIJ. CERNAJA METALLURGIJA; ISSN 0368-0797; SUN; DA. 1982; NO 11; PP. 91-92; BIBL. 4 REF.Article

PROSPECTS FOR LONG-WAVELENGTH X-RAY MICROSCOPY AND DIFFRACTIONSAYRE D.1980; LECTURE NOTES PHYS.; DEU; DA. 1980; NO 112; PP. 229-235; BIBL. 12 REF.Conference Paper

ULTRASOFT X-RAY MICROSCOPY: ITS APPLICATION TO BIOLOGICAL AND PHYSICAL SCIENCESPARSONS DF ED.1980; ANN. NEW YORK ACAD. SCI.; USA; DA. 1980; VOL. 342; 402 P.; BIBL. DISSEM.Serial Issue

PROPERTIES OF AN X-RAY CATOPTRICAL SYSTEMMCGEE JF.1979; LOS ALAMOS CONFERENCE ON OPTICS '79/1979/LOS ALAMOS NM; USA; WASHINGTON: SPIE; DA. 1979; PP. 471-475; BIBL. 9 REF.Conference Paper

TUBE A RAYONS X A GRILLE AVEC CIBLE DU TYPE "A FUITE"GUSHCHIN VA; EFANOV VP; IVANOV SA et al.1978; PRIBORY TEKH. EKSPER.; SUN; DA. 1978; NO 6; PP. 152-153; BIBL. 3 REF.Article

X-RAY LITHOGRAPHY AND X-RAY MICROSCOPY.SPILLER E; FEDER R; TOPALIAN J et al.1976; PHYS. BL.; DTSCH.; DA. 1976; VOL. 32; NO 12; PP. 564-571; BIBL. 16 REF.Article

PROCEEDINGS/HIGH RESOLUTION SOFT X-RAY OPTICS, (MEETING), BROOKHAVEN NY, NOVEMBER 18-20, 19811982; HIGH RESOLUTION SOFT X-RAY OPTICS. MEETING/1981-11-18/BROOKHAVEN NY; USA; BELLINGHAM WA: SPIE; DA. 1982; 224 P.; 28 CM; ISBN 0-89252-350-6; PROCEEDINGS OF SPIE-THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING; 316Conference Proceedings

MICROANALYSE SELECTIVE EN RAYONS X AU VOISINAGE D'UN SEUIL D'ABSORPTION: COMMENT OBTENIR DES RESULTATS QUANTITATIFS GRAND CHAMP PAR MICROSCOPIE DE CONTACT X = X-RAY MICROANALYSIS NEAR AN ABSORPTION EDGE: HOW TO OBTAIN LARGE FIELD QUANTITATIVE RESULTS BY X-RAY CONTACT MICROSCOPYBIGLER EMMANUEL.1982; ; FRA; DA. 1982; 208 P.; 30 CM; BIBL. 6 P.; TH. 3E CYCLE: OPT. TRAIT. SIGNAL/PARIS 11/1982/3154Thesis

ALUMINIUM HYDROXIDE GRANULOMAS: LIGHT AND ELECTRON MICROSCOPIC STUDIES AND X-RAY MICROANALYSISSLATER DN; UNDERWOOD JCE; DURRANT TE et al.1982; BR. J. DERMATOL.; ISSN 0007-0963; GBR; DA. 1982; VOL. 107; NO 1; PP. 103-108; BIBL. 6 REF.Article

X-RAY MICROANALYSIS WITH SI (LI) DETECTORSSTATHAM PJ.1981; J. MICROSC. (OXF.); ISSN 0022-2720; GBR; DA. 1981; VOL. 123; NO 1; PP. 1-23; BIBL. 4 P.Article

HOLOGRAPHY OF MICROOBJECTS IN SOFT X-RAYSARISTOV VV; BASHKINA GA; ERKO AI et al.1980; OPT. COMMUN.; ISSN 0030-4018; NLD; DA. 1980; VOL. 34; NO 3; PP. 332-336; BIBL. 15 REF.Article

ZONE-PLATE X-RAY MICROSCOPYSCHMAHL G; RUDOLPH D; NIEMANN B et al.1980; Q. REV. BIOPHYS.; ISSN 0033-5835; GBR; DA. 1980; VOL. 13; NO 3; PP. 297-315; BIBL. 11 REF.Article

CHEMICAL MICROANALYSIS BY X-RAY MICROSCOPY NEAR ABSORPTION EDGE WITH SYNCHROTRON RADIATION.POLACK F; LOWENTHAL S; PETROFF Y et al.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 31; NO 11; PP. 785-787; BIBL. 7 REF.; 4 ILL.Article

HIGH ACCURACY PROFILE MEASUREMENT OF QUASI-CONICAL MIRROR SURFACES BY LASER AUTOCOLLIMATIONENNOS AE; VIRDEE MS.1982; PRECIS. ENG.; ISSN 0141-6359; GBR; DA. 1982; VOL. 4; NO 1; PP. 5-8; BIBL. 4 REF.Article

COLLOQUE ANNUEL DE LA SOCIETE FRANCAISE DE MICROSCOPIE ELECTRONIQUE, REIMS, MAI 1982. SYMPOSIUM "LES SENSIBILITES ET LES LIMITES DE DETECTION DANS LES TECHNIQUES DE MICROSCOPIE ELECTRONIQUE ET DE MICROANALYSE"1982; JOURNAL DE MISCROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES; ISSN 0395-9279; FRA; DA. 1982; VOL. 7; NO 5; PP. 487-553; H.T. 4; ABS. ENG; BIBL. DISSEM.Conference Paper

PHOTOELECTRON MICROSCOPE FOR X-RAY MICROSCOPY AND MICROANALYSISPOLACK F; LOWENTHAL S.1981; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1981; VOL. 52; NO 2; PP. 207-212; BIBL. 17 REF.Article

IMAGING CHARACTERISTICS OF AN AXISYMMETRIC, GRAZING INCIDENCE X-RAY MICROSCOPE DESIGNED FOR LASER FUSION RESEARCH.BOYLE MJ; AHLSTROM HG.1978; REV. SCI. INSTRUM.; USA; DA. 1978; VOL. 49; NO 6; PP. 746-751; BIBL. 24 REF.Article

INTERNATIONAL CONFERENCE ON VACUUM ULTRAVIOLET RADIATION PHYSICS1978; J. PHYS., COLLOQ.; FRA; DA. 1978; VOL. 39; NO 4; PP. 234 P.Conference Paper

SHORT WAVELENGTH MICROSCOPY.1978; ANN. NEW YORK ACAD. SCI.; U.S.A.; DA. 1978; VOL. 306; PP. 1-339; BIBL. DISSEM.; ISBN 0890720622Serial Issue

SOFT X-RAYS FOR BIOLOGICAL AND INDUSTRIAL PATTERN REPLICATIONSSPILLER E; FEDER R; TOPALIAN J et al.1978; J. PHYS., COLLOQ.; FRA; DA. 1978; VOL. 39; NO 4; PP. 205-211; ABS. FRE; BIBL. 49 REF.Conference Paper